Glenn R. Miller

Person

Essex Junction, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Discontinuous dielectric interface for bipolar transistors
- Patent number 7,008,852
- Issue date Mar 7, 2006
- International Business Machines Corporation
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Discontinuous dielectric interface for bipolar transistors
- Patent number 6,939,771
- Issue date Sep 6, 2005
- International Business Machines Corporation
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
DC or AC electric field assisted anneal
- Patent number 6,822,311
- Issue date Nov 23, 2004
- International Business Machines Corporation
- Arne W. Ballantine
- C21 - METALLURGY OF IRON
Information Patent Grant
Discontinuous dielectric interface for bipolar transistors
- Patent number 6,703,283
- Issue date Mar 9, 2004
- International Business Machines Corporation
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor temperature monitor
- Patent number 6,638,629
- Issue date Oct 28, 2003
- International Business Machines Corporation
- Donna K. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
DC or AC electric field assisted anneal
- Patent number 6,552,411
- Issue date Apr 22, 2003
- International Business Machines Corporation
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor temperature monitor
- Patent number 6,472,232
- Issue date Oct 29, 2002
- International Business Machines Corporation
- Donna K. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of annealing copper metallurgy
- Patent number 6,339,022
- Issue date Jan 15, 2002
- International Business Machines Corporation
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
DC electric field assisted anneal
- Patent number 6,274,465
- Issue date Aug 14, 2001
- International Business Machines Corporataion
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two step anneal for controlling resistor tolerance
- Patent number 6,255,185
- Issue date Jul 3, 2001
- International Business Machines Corporation
- Douglas Duane Coolbaugh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Discontinuous dielectric interface for bipolar transistors
- Publication number 20050093053
- Publication date May 5, 2005
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Discontinuous dielectric interface for bipolar transistors
- Publication number 20040056327
- Publication date Mar 25, 2004
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DC or AC electric field assisted anneal
- Publication number 20030201515
- Publication date Oct 30, 2003
- International Business Machines Corporation
- Arne W. Ballantine
- C21 - METALLURGY OF IRON
Information Patent Application
Semiconductor temperature monitor
- Publication number 20020176998
- Publication date Nov 28, 2002
- Donna K. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DC or AC electric field asssisted anneal
- Publication number 20010026999
- Publication date Oct 4, 2001
- International Business Machines Corporation
- Arne W. Ballantir
- H01 - BASIC ELECTRIC ELEMENTS

Glenn R. Miller

Person

Patents Grantslast 30 patents

Discontinuous dielectric interface for bipolar transistors

Discontinuous dielectric interface for bipolar transistors

DC or AC electric field assisted anneal

Discontinuous dielectric interface for bipolar transistors

Semiconductor temperature monitor

DC or AC electric field assisted anneal

Semiconductor temperature monitor

Method of annealing copper metallurgy

DC electric field assisted anneal

Two step anneal for controlling resistor tolerance

Patents Applicationslast 30 patents

Discontinuous dielectric interface for bipolar transistors

Discontinuous dielectric interface for bipolar transistors

DC or AC electric field assisted anneal

Semiconductor temperature monitor

DC or AC electric field asssisted anneal