Gongyu Jiang

Person

Shanghai, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Quadrupole mass analyzer and method of mass analysis
- Patent number 10,825,676
- Issue date Nov 3, 2020
- Shimadzu Corporation
- Gongyu Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion optical device with orthogonal ion barriers
- Patent number 10,763,098
- Issue date Sep 1, 2020
- Shimadzu Corporation
- Gongyu Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method applied thereby for reducing ion loss...
- Patent number 10,192,728
- Issue date Jan 29, 2019
- Shimadzu Corporation
- Xiaoqiang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focusing ion guiding apparatus and mass spectrographic analysis app...
- Patent number 10,020,179
- Issue date Jul 10, 2018
- Shimadzu Corporation
- Gongyu Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap analyzer and ion trap mass spectrometry analysis method
- Patent number 9,502,228
- Issue date Nov 22, 2016
- Shimadzu Corporation
- Gongyu Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mobility analyzer, combination device thereof, and ion mobility...
- Patent number 9,429,543
- Issue date Aug 30, 2016
- Shimadzu Corporation
- Gongyu Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Linear ion beam bonding apparatus and array structure thereof
- Patent number 9,406,495
- Issue date Aug 2, 2016
- Shimadzu Research Laboratory (Shanghai) Co. Ltd.
- Gongyu Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing ion optical device
- Patent number 9,192,053
- Issue date Nov 17, 2015
- Shimadzu Research Laboratory (Shanghai) Co. Ltd.
- Hui Mu
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Tandem mass spectrum analysis device and mass spectrum analysis method
- Patent number 9,105,456
- Issue date Aug 11, 2015
- Shimadzu Research Laboratory (Shanghai) Co. Ltd.
- Gongyu Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Linear ion trap analyzer
- Patent number 8,759,759
- Issue date Jun 24, 2014
- Shimadzu Corporation
- Li Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wire electrode based ion guide device
- Patent number 8,507,848
- Issue date Aug 13, 2013
- Shimadzu Research Laboratory (Shanghai) Co. Ltd.
- Li Ding
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
QUADRUPOLE MASS ANALYZER AND METHOD OF MASS ANALYSIS
- Publication number 20200027714
- Publication date Jan 23, 2020
- Shimadzu Corporation
- Gongyu JIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION OPTICAL DEVICE
- Publication number 20190080895
- Publication date Mar 14, 2019
- Shimadzu Corporation
- Gongyu Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD APPLIED THEREBY FOR REDUCING ION LOSS...
- Publication number 20180174813
- Publication date Jun 21, 2018
- SHIMADZU CORPORATION
- Xiaoqiang ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSING ION GUIDING APPARATUS AND MASS SPECTROGRAPHIC ANALYSIS APP...
- Publication number 20170256387
- Publication date Sep 7, 2017
- SHIMADZU CORPORATION
- Gongyu JIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION TRAP ANALYZER AND ION TRAP MASS SPECTROMETRY ANALYSIS METHOD
- Publication number 20150303047
- Publication date Oct 22, 2015
- SHIMADZU CORPORATION
- Gongyu JIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MOBILITY ANALYZER, COMBINATION DEVICE THEREOF, AND ION MOBILITY...
- Publication number 20150276676
- Publication date Oct 1, 2015
- Shimadzu Corporation
- Gongyu Jiang
- G01 - MEASURING TESTING
Information Patent Application
LINER ION BEAM BONDING APPARATUS AND ARRAY STRUCTURE THEREOF
- Publication number 20150170898
- Publication date Jun 18, 2015
- SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
- Gongyu Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING ION OPTICAL DEVICE
- Publication number 20140087063
- Publication date Mar 27, 2014
- SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO. LTD.
- Hui Mu
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
A WIRE ELECTRODE BASED ION GUIDE DEVICE
- Publication number 20130187044
- Publication date Jul 25, 2013
- Shimadzu Corporation
- LI DING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TANDEM MASS SPECTRUM ANALYSIS DEVICE AND MASS SPECTRUM ANALYSIS METHOD
- Publication number 20120292498
- Publication date Nov 22, 2012
- SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO. LTD.
- Gongyu Jiang
- G01 - MEASURING TESTING
Information Patent Application
Linear Ion Trap Analyzer
- Publication number 20120248307
- Publication date Oct 4, 2012
- Shimadzu Corporation
- Li Ding
- H01 - BASIC ELECTRIC ELEMENTS

Gongyu Jiang

Person

Patents Grantslast 30 patents

Quadrupole mass analyzer and method of mass analysis

Ion optical device with orthogonal ion barriers

Mass spectrometer and method applied thereby for reducing ion loss...

Focusing ion guiding apparatus and mass spectrographic analysis app...

Ion trap analyzer and ion trap mass spectrometry analysis method

Ion mobility analyzer, combination device thereof, and ion mobility...

Linear ion beam bonding apparatus and array structure thereof

Method for manufacturing ion optical device

Tandem mass spectrum analysis device and mass spectrum analysis method

Linear ion trap analyzer

Wire electrode based ion guide device

Patents Applicationslast 30 patents

QUADRUPOLE MASS ANALYZER AND METHOD OF MASS ANALYSIS

ION OPTICAL DEVICE

MASS SPECTROMETER AND METHOD APPLIED THEREBY FOR REDUCING ION LOSS...

FOCUSING ION GUIDING APPARATUS AND MASS SPECTROGRAPHIC ANALYSIS APP...

ION TRAP ANALYZER AND ION TRAP MASS SPECTROMETRY ANALYSIS METHOD

ION MOBILITY ANALYZER, COMBINATION DEVICE THEREOF, AND ION MOBILITY...

LINER ION BEAM BONDING APPARATUS AND ARRAY STRUCTURE THEREOF

METHOD FOR MANUFACTURING ION OPTICAL DEVICE

A WIRE ELECTRODE BASED ION GUIDE DEVICE

TANDEM MASS SPECTRUM ANALYSIS DEVICE AND MASS SPECTRUM ANALYSIS METHOD

Linear Ion Trap Analyzer