TREA

GORDON A. VINTHER

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  • ONTARIO, CA, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Self-retained spring probe
    • Patent number 6,462,567
    • Issue date Oct 8, 2002
    • Delaware Capital Formation, Inc.
    • Gordon A. Vinther
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Self-closing spring probe
    • Patent number 6,396,293
    • Issue date May 28, 2002
    • Delaware Capital Formation, Inc.
    • Gordon A. Vinther
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Crown shaped contact barrel configuration for spring probe
    • Patent number 6,377,059
    • Issue date Apr 23, 2002
    • Delaware Capital Formation, Inc.
    • Gordon A. Vinther
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Biased BGA contactor probe tip
    • Patent number 6,271,672
    • Issue date Aug 7, 2001
    • Delaware Capital Formation, Inc.
    • Mark A. Swart
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test socket
    • Patent number 6,204,680
    • Issue date Mar 20, 2001
    • Delaware Capital Formation, Inc.
    • Mark A. Swart
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test socket
    • Patent number 6,084,421
    • Issue date Jul 4, 2000
    • Delaware Capital Formation, Inc.
    • Mark A. Swart
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test probe plunger tip
    • Patent number D400811
    • Issue date Nov 10, 1998
    • Delaware Capital Formation, Inc.
    • Mark A. Swart
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spring probe and method for biasing
    • Patent number 5,801,544
    • Issue date Sep 1, 1998
    • Delaware Capital Formation, Inc.
    • Mark A. Swart
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Hollow plunger test probe
    • Patent number 5,781,023
    • Issue date Jul 14, 1998
    • Delware Capital Formation, Inc.
    • Mark A. Swart
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Telescoping spring probe
    • Patent number 5,641,315
    • Issue date Jun 24, 1997
    • Everett Charles Technologies, Inc.
    • Mark A. Swart
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    CROWN SHAPED CONTACT BARREL CONFIGURATION FOR SPRING PROBE
    • Publication number 20010050564
    • Publication date Dec 13, 2001
    • GORDON A. VINTHER
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST PIN WITH REMOVABLE HEAD
    • Publication number 20010033180
    • Publication date Oct 25, 2001
    • MARK A. SWART
    • G01 - MEASURING TESTING
  • Information Patent Application

    Test socket
    • Publication number 20010000947
    • Publication date May 10, 2001
    • Delaware Capital Formation, Inc.
    • Mark A. Swart
    • G01 - MEASURING TESTING