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Gorou YOSHIDA
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Automated analysis device and method for leveling same
Patent number
12,345,728
Issue date
Jul 1, 2025
HITACHI HIGH-TECH CORPORATION
Yusuke Minemura
G01 - MEASURING TESTING
Information
Patent Grant
Solenoid valve abnormality detection device, automatic medical anal...
Patent number
12,142,423
Issue date
Nov 12, 2024
HITACHI HIGH-TECH CORPORATION
Guangbin Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Nozzle cleaner and automatic analyzer using the same
Patent number
11,819,890
Issue date
Nov 21, 2023
HITACHI HIGH-TECH CORPORATION
Takushi Miyakawa
B08 - CLEANING
Information
Patent Grant
Automatic analyzer
Patent number
11,143,665
Issue date
Oct 12, 2021
HITACHI HIGH-TECH CORPORATION
Akihiro Yasui
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
9,964,558
Issue date
May 8, 2018
Hitachi High-Technologies Corporation
Gorou Yoshida
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20250237669
Publication date
Jul 24, 2025
HITACHI HIGH-TECH CORPORATION
Yoshikazu SUGIYAMA
B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information
Patent Application
CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
Publication number
20250067588
Publication date
Feb 27, 2025
Hitachi High-Tech Corporation
Yuusuke KOURAI
G01 - MEASURING TESTING
Information
Patent Application
Chemical Analysis Device
Publication number
20240344973
Publication date
Oct 17, 2024
Hitachi High-Tech Corporation
Yuusuke KOURAI
G01 - MEASURING TESTING
Information
Patent Application
SOLENOID VALVE ABNORMALITY DETECTION DEVICE, AUTOMATIC MEDICAL ANAL...
Publication number
20230230741
Publication date
Jul 20, 2023
HITACHI HIGH-TECH CORPORATION
Guangbin Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Automatic Chemical Analysis Apparatus and Electrical Impedance Spec...
Publication number
20230228783
Publication date
Jul 20, 2023
Hitachi High-Tech Corporation
Hajime KATO
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED ANALYSIS DEVICE AND METHOD FOR LEVELING SAME
Publication number
20220326269
Publication date
Oct 13, 2022
HITACHI HIGH-TECH CORPORATION
Yusuke MINEMURA
G01 - MEASURING TESTING
Information
Patent Application
NOZZLE CLEANER AND AUTOMATIC ANALYZER USING THE SAME
Publication number
20200009623
Publication date
Jan 9, 2020
Hitachi High-Technologies Corporation
Takushi MIYAKAWA
B08 - CLEANING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20190361042
Publication date
Nov 28, 2019
Hitachi High-Technologies Corporation
Akihiro YASUI
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20160327586
Publication date
Nov 10, 2016
Hitachi High-Technologies Corporation
Gorou YOSHIDA
G01 - MEASURING TESTING