Graham G. Hetherington

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Sharnbrook, GB

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Patents Grantslast 30 patents

Information Patent Grant
LBIST controller circuits, systems, and methods with automated maxi...
- Patent number 6,654,920
- Issue date Nov 25, 2003
- Texas Instruments Incorporated
- Graham G. Hetherington
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Power reduction in module-based scan testing
- Publication number 20060107144
- Publication date May 18, 2006
- Jayashree Saxena
- G01 - MEASURING TESTING
Information Patent Application
Power reduction in module-based scan testing
- Publication number 20020170010
- Publication date Nov 14, 2002
- Jayashree Saxena
- G01 - MEASURING TESTING