Greg Douglas Van Wiggeren

Person

Los Gatos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Separating receive and transmit antennas of a radar test system
- Patent number 11,867,832
- Issue date Jan 9, 2024
- Keysight Technologies, Inc.
- Gregory Douglas Vanwiggeren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact system for characterizing a device under test (DUT) having...
- Patent number 11,750,303
- Issue date Sep 5, 2023
- Keysight Technologies, Inc.
- Gregory Douglas Vanwiggeren
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method of emulating echo signals from emulated targets w...
- Patent number 11,656,331
- Issue date May 23, 2023
- Keysight Technologies, Inc.
- Christian Bourde
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Systems and methods for thermal imaging of RF signals
- Patent number 10,458,851
- Issue date Oct 29, 2019
- Keysight Technologies, Inc.
- Gregory Steven Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Systems and methods for detecting defects in an antenna array and/o...
- Patent number 10,459,021
- Issue date Oct 29, 2019
- Keysight Technologies, Inc.
- Gregory Steven Lee
- G01 - MEASURING TESTING
Information Patent Grant
Determining far field error vector magnitude (EVM) of a device unde...
- Patent number 9,893,819
- Issue date Feb 13, 2018
- Keysight Technologies, Inc.
- Gregory S. Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Hybrid multimode network analyzer
- Patent number 9,735,900
- Issue date Aug 15, 2017
- Keysight Technologies, Inc.
- Gregory D. VanWiggeren
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Phase-continuous tunable laser
- Patent number 9,362,711
- Issue date Jun 7, 2016
- Keysight Technologies, Inc.
- Christopher L. Coleman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for performing remote frequency response measurem...
- Patent number 8,841,923
- Issue date Sep 23, 2014
- Agilent Technologies, Inc.
- Gregory Douglas Vanwiggeren
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder for surface plasmon resonance measuring instruments
- Patent number 7,846,396
- Issue date Dec 7, 2010
- Sierra Sensors GmbH
- Daniel B. Roitman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Surface plasmon resonance sensor apparatus having multiple dielectr...
- Patent number 7,817,278
- Issue date Oct 19, 2010
- Agilent Technologies, Inc.
- Gregory D. VanWiggeren
- G01 - MEASURING TESTING
Information Patent Grant
Multipulse/multitone mixing receiver
- Patent number 7,801,505
- Issue date Sep 21, 2010
- Agilent Technologies, Inc.
- Gregory Douglas VanWiggeren
- G01 - MEASURING TESTING
Information Patent Grant
Tracking motion using an interference pattern
- Patent number 7,737,947
- Issue date Jun 15, 2010
- Avago Technologies ECBU IP (Singapore) Pte Ltd
- Dale W. Schroeder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for estimating surface plasmon resonance shift
- Patent number 7,738,106
- Issue date Jun 15, 2010
- Agilent Technologies, Inc.
- Stanley Ted Jefferson
- G01 - MEASURING TESTING
Information Patent Grant
Optical sources for SPR applications
- Patent number 7,705,990
- Issue date Apr 27, 2010
- Agilent Technologies, Inc.
- Evan P. Thrush
- G01 - MEASURING TESTING
Information Patent Grant
Swept-angle SPR measurement system
- Patent number 7,684,024
- Issue date Mar 23, 2010
- Agilent Technologies, Inc.
- Gregory D. VanWiggeren
- G01 - MEASURING TESTING
Information Patent Grant
System and method for self-referenced SPR measurements
- Patent number 7,586,614
- Issue date Sep 8, 2009
- Agilent Technologies, Inc.
- Gregory D. VanWiggeren
- G01 - MEASURING TESTING
Information Patent Grant
Optical navigation based on laser feedback or laser interferometry
- Patent number 7,492,351
- Issue date Feb 17, 2009
- Avago Technologies ECBU IP (Singapore) Pte Ltd
- Gregory D. VanWiggeren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage sensor capable of contactless voltage measurement
- Patent number 7,474,404
- Issue date Jan 6, 2009
- Agilent Technologies, Inc.
- Gregory D. VanWiggeren
- G01 - MEASURING TESTING
Information Patent Grant
Swept-angle SPR measurement system
- Patent number 7,317,519
- Issue date Jan 8, 2008
- Agilent Technologies, Inc.
- Gregory D. VanWiggeren
- G01 - MEASURING TESTING
Information Patent Grant
Nonlinear filtering for events in SPR sensing
- Patent number 7,230,714
- Issue date Jun 12, 2007
- Agilent Technologies, Inc.
- Lee A. Barford
- G01 - MEASURING TESTING
Information Patent Grant
Optical fiber gratings with azimuthal refractive index perturbation
- Patent number 7,085,451
- Issue date Aug 1, 2006
- Georgia Tech Research Corporation
- Thomas K. Gaylord
- G02 - OPTICS
Information Patent Grant
Optical phase measurement of target
- Patent number 7,027,676
- Issue date Apr 11, 2006
- Agilent Technologies, Inc.
- Gregory D. VanWiggeren
- G01 - MEASURING TESTING
Information Patent Grant
Parallel interferometric measurements using an expanded local oscil...
- Patent number 7,023,557
- Issue date Apr 4, 2006
- Agilent Technologies, Inc.
- Gregory D. VanWiggeren
- G01 - MEASURING TESTING
Information Patent Grant
System and method for removing the relative phase uncertainty in de...
- Patent number 7,009,691
- Issue date Mar 7, 2006
- Agilent Technologies, Inc.
- Gregory D. VanWiggeren
- G01 - MEASURING TESTING
Information Patent Grant
Characterization of active and passive optical properties of an opt...
- Patent number 6,977,720
- Issue date Dec 20, 2005
- Agilent Technologies, Inc.
- Douglas M. Baney
- G01 - MEASURING TESTING
Information Patent Grant
Determining optical characteristics of optical devices under test
- Patent number 6,943,891
- Issue date Sep 13, 2005
- Agilent Technologies, Inc.
- Gregory D. VanWiggeren
- G01 - MEASURING TESTING
Information Patent Grant
Optical fiber gratings with azimuthal refractive index perturbation...
- Patent number 6,941,039
- Issue date Sep 6, 2005
- Georgia Tech Research Corporation
- Thomas K Gaylord
- G02 - OPTICS
Information Patent Grant
Interferometric optical component analyzer based on orthogonal filters
- Patent number 6,914,681
- Issue date Jul 5, 2005
- Agilent Technologies, Inc.
- Bogdan Szafraniec
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring optical characteristics of a sub-co...
- Patent number 6,900,896
- Issue date May 31, 2005
- Agilent Technologies, Inc.
- Ali Motamedi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR POSITIONING ANTENNA ELEMENTS OF A DUT WITHIN A QUIET ZON...
- Publication number 20240069082
- Publication date Feb 29, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Minu Jacob
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SEPARATING RECEIVE AND TRANSMIT ANTENNAS OF A RADAR TEST SYSTEM
- Publication number 20220260674
- Publication date Aug 18, 2022
- KEYSIGHT TECHNOLOGIES, INC.
- Gregory Douglas Vanwiggeren
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF EMULATING ECHO SIGNALS FROM EMULATED TARGETS W...
- Publication number 20220171022
- Publication date Jun 2, 2022
- KEYSIGHT TECHNOLOGIES, INC.
- Christian Bourde
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
COORDINATED MINI-RADAR TARGET SIMULATORS FOR IMPROVED ACCURACY AND...
- Publication number 20220018934
- Publication date Jan 20, 2022
- KEYSIGHT TECHNOLOGIES, INC.
- Gregory S. Lee
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR THERMAL IMAGING OF RF SIGNALS
- Publication number 20190242755
- Publication date Aug 8, 2019
- Keysight Technologies, Inc.
- Gregory Steven Lee
- G01 - MEASURING TESTING
Information Patent Application
COMPACT SYSTEM FOR CHARACTERIZING A DEVICE UNDER TEST (DUT) HAVING...
- Publication number 20190036621
- Publication date Jan 31, 2019
- KEYSIGHT TECHNOLOGIES, INC.
- Gregory Douglas Vanwiggeren
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING DEFECTS IN AN ANTENNA ARRAY AND/O...
- Publication number 20180080967
- Publication date Mar 22, 2018
- Keysight Technologies, Inc.
- Gregory Steven Lee
- G01 - MEASURING TESTING
Information Patent Application
COMPACT SYSTEM FOR CHARACTERIZING A DEVICE UNDER TEST (DUT) HAVING...
- Publication number 20180006745
- Publication date Jan 4, 2018
- Keysight Technologies, Inc.
- Gregory Douglas Vanwiggeren
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
HYBRID MULTIMODE NETWORK ANALYZER
- Publication number 20170111127
- Publication date Apr 20, 2017
- Keysight Technologies, Inc.
- Gregory D. VanWiggeren
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PHASE-CONTINUOUS TUNABLE LASER
- Publication number 20130195129
- Publication date Aug 1, 2013
- AGILENT TECHNOLOGIES, INC.
- Christopher L. COLEMAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Swept-Angle SPR Measurement System
- Publication number 20090180105
- Publication date Jul 16, 2009
- Gregory D. VanWiggeren
- G01 - MEASURING TESTING
Information Patent Application
Multipulse/Multitone Mixing Receiver
- Publication number 20090061812
- Publication date Mar 5, 2009
- Gregory Douglas VanWiggeren
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND SYSTEM FOR ESTIMATING SURFACE PLASMON RESONANCE SHIFT
- Publication number 20090046275
- Publication date Feb 19, 2009
- AGILENT TECHNOLOGIES, INC.
- Stanley Ted JEFFERSON
- G01 - MEASURING TESTING
Information Patent Application
Surface Plasmon Resonance Sensor Apparatus Having Multiple Dielectr...
- Publication number 20090040507
- Publication date Feb 12, 2009
- Gregory D VanWiggeren
- G01 - MEASURING TESTING
Information Patent Application
Voltage Sensor Capable of Contactless Voltage Measurement
- Publication number 20080266568
- Publication date Oct 30, 2008
- Gregory D VanWiggeren
- G01 - MEASURING TESTING
Information Patent Application
Optical Sources for SPR Applications
- Publication number 20080030736
- Publication date Feb 7, 2008
- Evan P. Thrush
- G01 - MEASURING TESTING
Information Patent Application
Stimulation-response measurement system and method using a chaotic...
- Publication number 20070139054
- Publication date Jun 21, 2007
- Nicholas B. Tufillaro
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
System and method for self-referenced SPR measurements
- Publication number 20070046943
- Publication date Mar 1, 2007
- Gregory D. VanWiggeren
- G01 - MEASURING TESTING
Information Patent Application
Measurement system having modulated laser source
- Publication number 20070031154
- Publication date Feb 8, 2007
- Gregory D. VanWiggeren
- G01 - MEASURING TESTING
Information Patent Application
Sample holder for surface plasmon resonance measuring instruments
- Publication number 20060269453
- Publication date Nov 30, 2006
- Daniel B. Roitman
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Light-sensing system that uses light guides
- Publication number 20060227328
- Publication date Oct 12, 2006
- Gregory D. Vanwiggeren
- G01 - MEASURING TESTING
Information Patent Application
Swept-angle SPR measurement system
- Publication number 20060092424
- Publication date May 4, 2006
- Gregory D. VanWiggeren
- G01 - MEASURING TESTING
Information Patent Application
Nonlinear filtering for events in SPR sensing
- Publication number 20060087656
- Publication date Apr 27, 2006
- Lee A. Barford
- G01 - MEASURING TESTING
Information Patent Application
Multiplexed optical detection system
- Publication number 20060023220
- Publication date Feb 2, 2006
- Gregory D. VanWiggeren
- G02 - OPTICS
Information Patent Application
Optical fiber gratings with azimuthal refractive index perturbation
- Publication number 20060008208
- Publication date Jan 12, 2006
- Thomas K. Gaylord
- G02 - OPTICS
Information Patent Application
Wavelength-tuned intensity measurement of surface plasmon resonance...
- Publication number 20050244093
- Publication date Nov 3, 2005
- Gregory D. VanWiggeren
- G01 - MEASURING TESTING
Information Patent Application
Optical phase measurement of target
- Publication number 20050194523
- Publication date Sep 8, 2005
- Gregory D. VanWiggeren
- G01 - MEASURING TESTING
Information Patent Application
Optical navigation based on laser feedback or laser interferometry
- Publication number 20050134556
- Publication date Jun 23, 2005
- Gregory D. VanWiggeren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Tracking motion using an interference pattern
- Publication number 20050083303
- Publication date Apr 21, 2005
- Dale W. Schroeder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Characterization of active and passive optical properties of an opt...
- Publication number 20050030522
- Publication date Feb 10, 2005
- Douglas M. Baney
- G01 - MEASURING TESTING

Greg Douglas Van Wiggeren

Person

Patents Grantslast 30 patents

Separating receive and transmit antennas of a radar test system

Compact system for characterizing a device under test (DUT) having...

System and method of emulating echo signals from emulated targets w...

Systems and methods for thermal imaging of RF signals

Systems and methods for detecting defects in an antenna array and/o...

Determining far field error vector magnitude (EVM) of a device unde...

Hybrid multimode network analyzer

Phase-continuous tunable laser

Device and method for performing remote frequency response measurem...

Sample holder for surface plasmon resonance measuring instruments

Surface plasmon resonance sensor apparatus having multiple dielectr...

Multipulse/multitone mixing receiver

Tracking motion using an interference pattern

Method and system for estimating surface plasmon resonance shift

Optical sources for SPR applications

Swept-angle SPR measurement system

System and method for self-referenced SPR measurements

Optical navigation based on laser feedback or laser interferometry

Voltage sensor capable of contactless voltage measurement

Swept-angle SPR measurement system

Nonlinear filtering for events in SPR sensing

Optical fiber gratings with azimuthal refractive index perturbation

Optical phase measurement of target

Parallel interferometric measurements using an expanded local oscil...

System and method for removing the relative phase uncertainty in de...

Characterization of active and passive optical properties of an opt...

Determining optical characteristics of optical devices under test

Optical fiber gratings with azimuthal refractive index perturbation...

Interferometric optical component analyzer based on orthogonal filters

Method and system for measuring optical characteristics of a sub-co...

Patents Applicationslast 30 patents

SYSTEM FOR POSITIONING ANTENNA ELEMENTS OF A DUT WITHIN A QUIET ZON...

SEPARATING RECEIVE AND TRANSMIT ANTENNAS OF A RADAR TEST SYSTEM

SYSTEM AND METHOD OF EMULATING ECHO SIGNALS FROM EMULATED TARGETS W...

COORDINATED MINI-RADAR TARGET SIMULATORS FOR IMPROVED ACCURACY AND...

SYSTEMS AND METHODS FOR THERMAL IMAGING OF RF SIGNALS

COMPACT SYSTEM FOR CHARACTERIZING A DEVICE UNDER TEST (DUT) HAVING...

SYSTEMS AND METHODS FOR DETECTING DEFECTS IN AN ANTENNA ARRAY AND/O...

COMPACT SYSTEM FOR CHARACTERIZING A DEVICE UNDER TEST (DUT) HAVING...

HYBRID MULTIMODE NETWORK ANALYZER

PHASE-CONTINUOUS TUNABLE LASER

Swept-Angle SPR Measurement System

Multipulse/Multitone Mixing Receiver

METHOD AND SYSTEM FOR ESTIMATING SURFACE PLASMON RESONANCE SHIFT

Surface Plasmon Resonance Sensor Apparatus Having Multiple Dielectr...

Voltage Sensor Capable of Contactless Voltage Measurement

Optical Sources for SPR Applications

Stimulation-response measurement system and method using a chaotic...

System and method for self-referenced SPR measurements

Measurement system having modulated laser source

Sample holder for surface plasmon resonance measuring instruments

Light-sensing system that uses light guides

Swept-angle SPR measurement system

Nonlinear filtering for events in SPR sensing

Multiplexed optical detection system

Optical fiber gratings with azimuthal refractive index perturbation

Wavelength-tuned intensity measurement of surface plasmon resonance...

Optical phase measurement of target

Optical navigation based on laser feedback or laser interferometry

Tracking motion using an interference pattern

Characterization of active and passive optical properties of an opt...