Gregory S. Horner

Person

Felton, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
High speed quantum efficiency measurement apparatus utilizing solid...
- Patent number 8,299,416
- Issue date Oct 30, 2012
- Tau Science Corporation
- Mark A. Arbore
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
High speed detection of shunt defects in photovoltaic and optoelect...
- Patent number 8,278,937
- Issue date Oct 2, 2012
- Tau Science Corporation
- Leonid A. Vasilyev
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Systems configured to perform a non-contact method for determining...
- Patent number 7,719,294
- Issue date May 18, 2010
- KLA-Tencor Technologies Corp.
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Contactless charge measurement of product wafers and control of cor...
- Patent number 7,538,333
- Issue date May 26, 2009
- KLA-Tencor Technologies Corporation
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Methods for imperfect insulating film electrical thickness/capacita...
- Patent number 7,397,254
- Issue date Jul 8, 2008
- KLA-Tencor Technologies Corp.
- Xiafang (Michelle) Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a property of an insulating film
- Patent number 7,358,748
- Issue date Apr 15, 2008
- KLA-Tencor Technologies Corp.
- Thomas G. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Contactless charge measurement of product wafers and control of cor...
- Patent number 7,248,062
- Issue date Jul 24, 2007
- KLA-Tencor Technologies Corp.
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact mobile charge measurement with leakage band-bending and...
- Patent number 7,230,443
- Issue date Jun 12, 2007
- KLA-Tencor Corporation
- Min-Su Fung
- G01 - MEASURING TESTING
Information Patent Grant
Methods for imperfect insulating film electrical thickness/capacita...
- Patent number 7,075,318
- Issue date Jul 11, 2006
- KLA-Tencor Technologies Corp.
- Xiafang (Michelle) Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining an electrical property of an in...
- Patent number 7,064,565
- Issue date Jun 20, 2006
- KLA-Tencor Technologies Corp.
- Zhiwei Xu
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a property of an insulating film
- Patent number 7,012,438
- Issue date Mar 14, 2006
- KLA-Tencor Technologies Corp.
- Thomas G. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact mobile charge measurement with leakage band-bending and...
- Patent number 6,937,050
- Issue date Aug 30, 2005
- Min-Su Fung
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact mobile charge measurement with leakage band-bending and...
- Patent number 6,771,092
- Issue date Aug 3, 2004
- Min-Su Fung
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for detecting metal contamination on a semiconduc...
- Patent number 6,759,255
- Issue date Jul 6, 2004
- KLA-Tencor Technologies Corp.
- Zhiwei Xu
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact hysteresis measurements of insulating films
- Patent number 6,734,696
- Issue date May 11, 2004
- KLA-Tencor Technologies Corp.
- Gregory S. Horner
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact mobile charge measurement with leakage band-bending and...
- Patent number 6,522,158
- Issue date Feb 18, 2003
- Keithley Instruments, Inc.
- Min-Su Fung
- G01 - MEASURING TESTING
Information Patent Grant
Contactless total charge measurement with corona
- Patent number 6,448,804
- Issue date Sep 10, 2002
- Tom G. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Contactless method for measuring total charge of an oxide layer on...
- Patent number 6,335,630
- Issue date Jan 1, 2002
- Tom G. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact electrical conduction measurement for insulating films
- Patent number 6,202,029
- Issue date Mar 13, 2001
- Roger L. Verkuil
- G01 - MEASURING TESTING
Information Patent Grant
Contactless method for measuring total charge of an insulating laye...
- Patent number 6,191,605
- Issue date Feb 20, 2001
- Tom G. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for establishing electrical contact between a...
- Patent number 6,121,783
- Issue date Sep 19, 2000
- Gregory S. Horner
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact tunnelling field measurement for a semiconductor oxide...
- Patent number 6,097,196
- Issue date Aug 1, 2000
- Roger L. Verkuil
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for depositing uniform charge on a thin oxide...
- Patent number 6,060,709
- Issue date May 9, 2000
- Roger L. Verkuil
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for depositing charge on a semiconductor wafer
- Patent number 5,594,247
- Issue date Jan 14, 1997
- Keithley Instruments, Inc.
- Roger L. Verkuil
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
High speed quantum efficiency measurement apparatus utilizing solid...
- Publication number 20100219327
- Publication date Sep 2, 2010
- Mark A. Arbore
- G01 - MEASURING TESTING
Information Patent Application
High speed detection of shunt defects in photovoltaic and optoelect...
- Publication number 20100201374
- Publication date Aug 12, 2010
- Leonid A. Vasilyev
- G01 - MEASURING TESTING
Information Patent Application
Non-contact hysteresis measurements of insulating films
- Publication number 20030117155
- Publication date Jun 26, 2003
- Gregory S. Horner
- G01 - MEASURING TESTING
Information Patent Application
Method and system for detecting metal contamination on a semiconduc...
- Publication number 20020090746
- Publication date Jul 11, 2002
- Zhiwei Xu
- G01 - MEASURING TESTING
Information Patent Application
Contactless total charge measurement with corona
- Publication number 20020008536
- Publication date Jan 24, 2002
- Tom G. Miller
- G01 - MEASURING TESTING
Information Patent Application
Contactless total charge measurement with corona
- Publication number 20010000651
- Publication date May 3, 2001
- Tom G. Miller
- G01 - MEASURING TESTING

Gregory S. Horner

Person

Patents Grantslast 30 patents

High speed quantum efficiency measurement apparatus utilizing solid...

High speed detection of shunt defects in photovoltaic and optoelect...

Systems configured to perform a non-contact method for determining...

Contactless charge measurement of product wafers and control of cor...

Methods for imperfect insulating film electrical thickness/capacita...

Methods and systems for determining a property of an insulating film

Contactless charge measurement of product wafers and control of cor...

Non-contact mobile charge measurement with leakage band-bending and...

Methods for imperfect insulating film electrical thickness/capacita...

Methods and systems for determining an electrical property of an in...

Methods and systems for determining a property of an insulating film

Non-contact mobile charge measurement with leakage band-bending and...

Non-contact mobile charge measurement with leakage band-bending and...

Method and system for detecting metal contamination on a semiconduc...

Non-contact hysteresis measurements of insulating films

Non-contact mobile charge measurement with leakage band-bending and...

Contactless total charge measurement with corona

Contactless method for measuring total charge of an oxide layer on...

Non-contact electrical conduction measurement for insulating films

Contactless method for measuring total charge of an insulating laye...

Method and apparatus for establishing electrical contact between a...

Non-contact tunnelling field measurement for a semiconductor oxide...

Apparatus and method for depositing uniform charge on a thin oxide...

Apparatus and method for depositing charge on a semiconductor wafer

Patents Applicationslast 30 patents

High speed quantum efficiency measurement apparatus utilizing solid...

High speed detection of shunt defects in photovoltaic and optoelect...

Non-contact hysteresis measurements of insulating films

Method and system for detecting metal contamination on a semiconduc...

Contactless total charge measurement with corona

Contactless total charge measurement with corona