Gregory Toker

Person

Jerusalem, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Scatterometer-interferometer and method for detecting and distingui...
- Patent number 7,671,978
- Issue date Mar 2, 2010
- Xyratex Technology Limited
- Bryan Clark
- G01 - MEASURING TESTING
Information Patent Grant
Resonant ellipsometer and method for determining ellipsometric para...
- Patent number 7,330,277
- Issue date Feb 12, 2008
- Xyratex Technology Limited
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Grant
Fabry-perot resonator apparatus and method including an in-resonato...
- Patent number 7,294,825
- Issue date Nov 13, 2007
- Xyratex Technology Limited
- Gregory Toker
- G01 - MEASURING TESTING
Information Patent Grant
Fabry-Perot resonator apparatus and method for observing low reflec...
- Patent number 7,282,729
- Issue date Oct 16, 2007
- Xyratex Technology Limited
- Brunfeld Andrei
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for simultaneous 2-D and topographical inspection
- Patent number 7,253,891
- Issue date Aug 7, 2007
- Orbotech Ltd.
- Gregory Toker
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional imaging resonator and method therefor
- Patent number 7,220,955
- Issue date May 22, 2007
- Xyratex Technology Limited
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Grant
Resonator method and system for distinguishing characteristics of s...
- Patent number 7,214,932
- Issue date May 8, 2007
- Xyratex Technology Limited
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Grant
High speed optical inspection apparatus for a transparent disk usin...
- Patent number 6,294,793
- Issue date Sep 25, 2001
- Brown & Sharpe Surface Inspection Systems, Inc.
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Grant
High speed surface inspection optical apparatus for a reflective di...
- Patent number 6,262,432
- Issue date Jul 17, 2001
- Brown & Sharpe Surface Inspection Systems, Inc.
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Grant
High speed optical inspection apparatus for a large transparent fla...
- Patent number 6,255,666
- Issue date Jul 3, 2001
- Brown & Sharpe Surface Inspection Systems, Inc.
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Grant
High speed optical inspection apparatus using Gaussian distribution...
- Patent number 6,252,242
- Issue date Jun 26, 2001
- Brown & Sharpe Surface Inspection Systems, Inc.
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Grant
Differential phase contrast inspection system with multiple detectors
- Patent number 5,638,175
- Issue date Jun 10, 1997
- Display Inspection Systems, Inc.
- Andrei Brunfeld
- G02 - OPTICS
Information Patent Grant
Differential phase contrast inspection system
- Patent number 5,459,576
- Issue date Oct 17, 1995
- Display Inspection Systems, Inc.
- Andrei Brunfeld
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL INSPECTION SYSTEM WITH POLARIZATION ISOLATION OF DETECTION...
- Publication number 20120154806
- Publication date Jun 21, 2012
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING SYSTEM WITH MATCHED COLLECTION LENS AND DETECTOR...
- Publication number 20120057154
- Publication date Mar 8, 2012
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING SYSTEM WITH ILLUMINATION PROVIDED THROUGH A VOID...
- Publication number 20120057172
- Publication date Mar 8, 2012
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE-DETECTING DISK INSPECTION SYSTEM
- Publication number 20120008135
- Publication date Jan 12, 2012
- Gregory Toker
- G01 - MEASURING TESTING
Information Patent Application
SCATTEROMETER-INTERFEROMETER AND METHOD FOR DETECTING AND DISTINGUI...
- Publication number 20080266547
- Publication date Oct 30, 2008
- Bryan Clark
- G01 - MEASURING TESTING
Information Patent Application
Three-dimensional imaging resonator and method therefor
- Publication number 20050279954
- Publication date Dec 22, 2005
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
Resonator method and system for distinguishing characteristics of s...
- Publication number 20050236589
- Publication date Oct 27, 2005
- Xyratex Technology Limited
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
Fabry-perot resonator apparatus and method including an in-resonato...
- Publication number 20050232330
- Publication date Oct 20, 2005
- Xyratex Technology Limited
- Gregory Toker
- G01 - MEASURING TESTING
Information Patent Application
Resonant ellipsometer and method for determining ellipsometric para...
- Publication number 20050225775
- Publication date Oct 13, 2005
- Xyratex Technology Limited
- Andrei Brunfeld
- G01 - MEASURING TESTING
Information Patent Application
Fabry-perot resonator apparatus and method for observing low reflec...
- Publication number 20050218350
- Publication date Oct 6, 2005
- Xyratex Technology Limited
- Andrei Brunfeld
- G02 - OPTICS
Information Patent Application
Method and apparatus for simultaneous 2-D and topographical inspection
- Publication number 20040156043
- Publication date Aug 12, 2004
- ORBOTECH LTD.
- Gregory Toker
- G01 - MEASURING TESTING

Gregory Toker

Person

Patents Grantslast 30 patents

Scatterometer-interferometer and method for detecting and distingui...

Resonant ellipsometer and method for determining ellipsometric para...

Fabry-perot resonator apparatus and method including an in-resonato...

Fabry-Perot resonator apparatus and method for observing low reflec...

Method and apparatus for simultaneous 2-D and topographical inspection

Three-dimensional imaging resonator and method therefor

Resonator method and system for distinguishing characteristics of s...

High speed optical inspection apparatus for a transparent disk usin...

High speed surface inspection optical apparatus for a reflective di...

High speed optical inspection apparatus for a large transparent fla...

High speed optical inspection apparatus using Gaussian distribution...

Differential phase contrast inspection system with multiple detectors

Differential phase contrast inspection system

Patents Applicationslast 30 patents

OPTICAL INSPECTION SYSTEM WITH POLARIZATION ISOLATION OF DETECTION...

OPTICAL MEASURING SYSTEM WITH MATCHED COLLECTION LENS AND DETECTOR...

OPTICAL MEASURING SYSTEM WITH ILLUMINATION PROVIDED THROUGH A VOID...

FLUORESCENCE-DETECTING DISK INSPECTION SYSTEM

SCATTEROMETER-INTERFEROMETER AND METHOD FOR DETECTING AND DISTINGUI...

Three-dimensional imaging resonator and method therefor

Resonator method and system for distinguishing characteristics of s...

Fabry-perot resonator apparatus and method including an in-resonato...

Resonant ellipsometer and method for determining ellipsometric para...

Fabry-perot resonator apparatus and method for observing low reflec...

Method and apparatus for simultaneous 2-D and topographical inspection