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Guido Spinola Durante
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Gavirate, IT
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Patents Grants
last 30 patents
Information
Patent Grant
Microelectromechanical integrated sensor structure with rotary driv...
Patent number
7,694,563
Issue date
Apr 13, 2010
STMicroelectronics S.r.l.
Guido Spinola Durante
G01 - MEASURING TESTING
Information
Patent Grant
Micro-electro-mechanical structure having electrically insulated re...
Patent number
7,437,933
Issue date
Oct 21, 2008
STMicroelectronics S.r.l.
Guido Spinola Durante
G01 - MEASURING TESTING
Information
Patent Grant
Micro-electro-mechanical gyroscope having electrically insulated re...
Patent number
7,258,008
Issue date
Aug 21, 2007
STMicroelectronics S.r.l.
Guido Spinola Durante
G01 - MEASURING TESTING
Information
Patent Grant
Integrated gyroscope of semiconductor material with at least one se...
Patent number
6,928,872
Issue date
Aug 16, 2005
STMicroelectronics S.r.l.
Guido Spinola Durante
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MICROELECTROMECHANICAL INTEGRATED SENSOR STRUCTURE WITH ROTARY DRIV...
Publication number
20070214883
Publication date
Sep 20, 2007
STMicroelectronics S.r.l.
Guido Spinola Durante
G01 - MEASURING TESTING
Information
Patent Application
Micro-electro-mechanical gyroscope having electrically insulated re...
Publication number
20060162448
Publication date
Jul 27, 2006
STMicroelectronics S.r.l.
Guido Spinola Durante
G01 - MEASURING TESTING
Information
Patent Application
Micro-electro-mechanical structure having electrically insulated re...
Publication number
20060070441
Publication date
Apr 6, 2006
STMicroelectronics S.r. I.
Guido Spinola Durante
G01 - MEASURING TESTING
Information
Patent Application
Integrated gyroscope of semiconductor material with at least one se...
Publication number
20040035204
Publication date
Feb 26, 2004
STMicroelectronics S.r.l.
Guido Spinola Durante
G01 - MEASURING TESTING
Information
Patent Application
Integrated gyroscope of semiconductor material
Publication number
20020189354
Publication date
Dec 19, 2002
STMicroelectronics S.r. I.
Guido Spinola Durante
G01 - MEASURING TESTING