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Gunnar Krause
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Munich, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Test circuit for testing a synchronous memory circuit
Patent number
7,117,404
Issue date
Oct 3, 2006
Infineon Technologies AG
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and device for generating digital signal patterns
Patent number
7,117,403
Issue date
Oct 3, 2006
Infineon Technologies AG
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Grant
System for testing fast synchronous digital circuits, particularly...
Patent number
7,062,690
Issue date
Jun 13, 2006
Infineon Technologies AG
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus for flexible deactivation of word lines of dynamic memory...
Patent number
6,973,008
Issue date
Dec 6, 2005
Infineon Technologies AG
Gunnar H. Krause
G11 - INFORMATION STORAGE
Information
Patent Grant
DDR to SDR conversion that decodes read and write accesses and forw...
Patent number
6,971,039
Issue date
Nov 29, 2005
Infineon Technologies AG
Gunnar Krause
G11 - INFORMATION STORAGE
Information
Patent Grant
Address generator for generating addresses for testing a circuit
Patent number
6,957,373
Issue date
Oct 18, 2005
Infineon Technologies AG
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and device for reading and for checking the time position of...
Patent number
6,871,306
Issue date
Mar 22, 2005
Infineon Technologies AG
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Grant
Test data generator
Patent number
6,865,707
Issue date
Mar 8, 2005
Infineon Technologies AG
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Grant
Address counter for addressing synchronous high-frequency digital c...
Patent number
6,862,702
Issue date
Mar 1, 2005
Infineon Technologies AG
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and probe card configuration for testing a plurality of inte...
Patent number
6,853,206
Issue date
Feb 8, 2005
Infineon Technologies AG
Michael Hübner
G11 - INFORMATION STORAGE
Information
Patent Grant
Circuit configuration for generating control signals for testing hi...
Patent number
6,839,397
Issue date
Jan 4, 2005
Infineon Technologies AG
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and device for offset-voltage free voltage measurement and a...
Patent number
6,812,689
Issue date
Nov 2, 2004
Infineon Technologies AG
Gunnar Krause
G01 - MEASURING TESTING
Information
Patent Grant
Selectively deactivating a first control loop in a dual control loo...
Patent number
6,779,124
Issue date
Aug 17, 2004
Siemens Aktiengesellschaft
Rainer Höhler
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Test configuration and test method for testing a plurality of integ...
Patent number
6,762,611
Issue date
Jul 13, 2004
Infineon Techologies AG
Michael Hübner
G11 - INFORMATION STORAGE
Information
Patent Grant
Test circuit
Patent number
6,744,272
Issue date
Jun 1, 2004
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for on-chip testing of memory cells of an integrated memory...
Patent number
6,728,147
Issue date
Apr 27, 2004
Infineon Technologies AG
Peter Beer
G11 - INFORMATION STORAGE
Information
Patent Grant
System for testing fast integrated digital circuits, in particular...
Patent number
6,721,904
Issue date
Apr 13, 2004
Infineon Technologies AG
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Grant
Test circuit for testing a circuit
Patent number
6,618,305
Issue date
Sep 9, 2003
Infineon Technologies AG
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for determining the temperature of a semiconductor chip and...
Patent number
6,612,738
Issue date
Sep 2, 2003
Infineon Technologies
Peter Beer
G01 - MEASURING TESTING
Information
Patent Grant
Circuit configuration for the burn-in test of a semiconductor module
Patent number
6,581,171
Issue date
Jun 17, 2003
Infineon Technologies AG
Gunnar Krause
G01 - MEASURING TESTING
Information
Patent Grant
System for testing fast synchronous semiconductor circuits
Patent number
6,556,492
Issue date
Apr 29, 2003
Infineon Technologies AG
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Grant
Address generator for generating addresses for an on-chip trim circuit
Patent number
6,459,649
Issue date
Oct 1, 2002
Infineon Technologies AG
Gunnar Krause
G11 - INFORMATION STORAGE
Information
Patent Grant
Circuit configuration having a variable number of data outputs and...
Patent number
6,400,630
Issue date
Jun 4, 2002
Infineon Technologies AG
Gunnar Krause
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor component and method for testing and operating a semi...
Patent number
6,313,655
Issue date
Nov 6, 2001
Infineon Technologies AG
Gunnar Krause
G11 - INFORMATION STORAGE
Information
Patent Grant
Method of programming a semiconductor memory
Patent number
6,274,410
Issue date
Aug 14, 2001
Infineon Technologies AG
Holger Göbel
G11 - INFORMATION STORAGE
Information
Patent Grant
Integrated circuit with two operating states
Patent number
6,229,343
Issue date
May 8, 2001
Siemens Aktiengesellschaft
Regine Bauer
G01 - MEASURING TESTING
Information
Patent Grant
Fuse configuration for a semiconductor storage device
Patent number
6,180,992
Issue date
Jan 30, 2001
Infineon Technologies AG
Holger Göbel
G11 - INFORMATION STORAGE
Information
Patent Grant
Dynamic semiconductor memory device and method for initializing a d...
Patent number
6,157,589
Issue date
Dec 5, 2000
Siemens Aktiengesellschaft
Gunnar Krause
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
Apparatus for flexible deactivation of word lines of dynamic memory...
Publication number
20050002220
Publication date
Jan 6, 2005
Gunnar H. Krause
G11 - INFORMATION STORAGE
Information
Patent Application
Method and probe card configuration for testing a plurality of inte...
Publication number
20040124863
Publication date
Jul 1, 2004
Infineon Technologies AG
Michael Hubner
G01 - MEASURING TESTING
Information
Patent Application
Method for on-chip testing of memory cells of an integrated memory...
Publication number
20030021169
Publication date
Jan 30, 2003
Peter Beer
G11 - INFORMATION STORAGE
Information
Patent Application
Test circuit for testing a synchronous memory circuit
Publication number
20030005361
Publication date
Jan 2, 2003
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Application
Test circuit for testing a synchronous circuit
Publication number
20030005389
Publication date
Jan 2, 2003
Wolfgang Ernst
G01 - MEASURING TESTING
Information
Patent Application
Test circuit for testing a circuit
Publication number
20020196688
Publication date
Dec 26, 2002
Infineon Technologies AG
Wolfgang Ernst
G01 - MEASURING TESTING
Information
Patent Application
Test circuit
Publication number
20020171447
Publication date
Nov 21, 2002
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Application
Address generator for generating addresses for testing a circuit
Publication number
20020170012
Publication date
Nov 14, 2002
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Application
Method and device for reading and for checking the time position of...
Publication number
20020160558
Publication date
Oct 31, 2002
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Application
Test data generator
Publication number
20020157052
Publication date
Oct 24, 2002
Infineon Technologies AG
Wolfgang Ernst
G01 - MEASURING TESTING
Information
Patent Application
Memory configuration
Publication number
20020134994
Publication date
Sep 26, 2002
Gunnar Krause
G11 - INFORMATION STORAGE
Information
Patent Application
Test configuration and test method for testing a plurality of integ...
Publication number
20020089341
Publication date
Jul 11, 2002
Michael Hubner
G01 - MEASURING TESTING
Information
Patent Application
System for testing fast synchronous digital circuits, particularly...
Publication number
20020070748
Publication date
Jun 13, 2002
Wolfgang Ernst
G01 - MEASURING TESTING
Information
Patent Application
Address counter for addressing synchronous high-frequency digital c...
Publication number
20020012286
Publication date
Jan 31, 2002
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Application
System for testing fast synchronous semiconductor circuits
Publication number
20020012283
Publication date
Jan 31, 2002
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Application
System for testing fast integrated digital circuits, in particular...
Publication number
20020010877
Publication date
Jan 24, 2002
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Application
Method and device for generating digital signal patterns
Publication number
20020009007
Publication date
Jan 24, 2002
Wolfgang Ernst
G01 - MEASURING TESTING
Information
Patent Application
Circuit configuration for generating control signals for testing hi...
Publication number
20020010878
Publication date
Jan 24, 2002
Wolfgang Ernst
G11 - INFORMATION STORAGE
Information
Patent Application
Method and device for offset-voltage free voltage measurement and a...
Publication number
20020000828
Publication date
Jan 3, 2002
Gunnar Krause
G01 - MEASURING TESTING
Information
Patent Application
Address generator for generating addresses for an on-chip trim circuit
Publication number
20010054127
Publication date
Dec 20, 2001
Gunnar Krause
G11 - INFORMATION STORAGE
Information
Patent Application
Digital memory circuit
Publication number
20010046166
Publication date
Nov 29, 2001
Helmut Fischer
G11 - INFORMATION STORAGE
Information
Patent Application
Method for determining the temperature of a semiconductor chip and...
Publication number
20010026576
Publication date
Oct 4, 2001
Peter Beer
G01 - MEASURING TESTING
Information
Patent Application
Synchronous circuit
Publication number
20010025350
Publication date
Sep 27, 2001
Rainer Hohler
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Circuit configuration having a variable number of data outputs and...
Publication number
20010017809
Publication date
Aug 30, 2001
Gunnar Krause
G11 - INFORMATION STORAGE
Information
Patent Application
Method of programming a semiconductor memory
Publication number
20010000758
Publication date
May 3, 2001
Infineon Technologies AG
Holger Gobel
G11 - INFORMATION STORAGE