Gunther Nelle

Person

Bergen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and arrangement for reducing temperature-related dimensional...
- Patent number 6,446,350
- Issue date Sep 10, 2002
- Johannes Heidenhain GmbH
- Günther Nelle
- G05 - CONTROLLING REGULATING
Information Patent Grant
Device and method for attaching a scale
- Patent number 6,349,481
- Issue date Feb 26, 2002
- Dr. Johannes Heidenhain GmbH
- Günther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Linear encoder with a modular scale and a method of producing same
- Patent number 6,163,970
- Issue date Dec 26, 2000
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Scale and scanning unit of a length measuring instrument, and metho...
- Patent number 6,092,296
- Issue date Jul 25, 2000
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric position measuring encoder having scale formed of ele...
- Patent number 5,856,668
- Issue date Jan 5, 1999
- Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Position indicating encoder with magnetic end position determining...
- Patent number 5,793,201
- Issue date Aug 11, 1998
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Linear or angular encoder
- Patent number 5,630,283
- Issue date May 20, 1997
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Length measuring system
- Patent number 5,553,390
- Issue date Sep 10, 1996
- Dr. Johannes Heidenhain GmbH
- Alfons Ernst
- G01 - MEASURING TESTING
Information Patent Grant
Sealed encoder
- Patent number 5,526,706
- Issue date Jun 18, 1996
- Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Linear encoder
- Patent number 5,511,321
- Issue date Apr 30, 1996
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Encapsulated measuring apparatus
- Patent number 5,485,680
- Issue date Jan 23, 1996
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring linear and angular displacements
- Patent number 5,456,021
- Issue date Oct 10, 1995
- Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Length measurement device
- Patent number 5,375,338
- Issue date Dec 27, 1994
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring apparatus
- Patent number 5,182,867
- Issue date Feb 2, 1993
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring device
- Patent number 5,142,792
- Issue date Sep 1, 1992
- Dr. Johannes Heidenhaim GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring device
- Patent number 4,982,508
- Issue date Jan 8, 1991
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Length measuring apparatus with temperature compensation
- Patent number 4,776,098
- Issue date Oct 11, 1988
- Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Measuring instrument
- Patent number 4,573,000
- Issue date Feb 25, 1986
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Error correction system for position measuring device
- Patent number 4,527,056
- Issue date Jul 2, 1985
- Dr. Johannes Heidenhain GmbH
- Horst Burkhardt
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric incremental length or angle measuring device
- Patent number 4,519,709
- Issue date May 28, 1985
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Coupling arrangement for length measuring device
- Patent number 4,492,032
- Issue date Jan 8, 1985
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Incremental measuring instrument
- Patent number 4,479,716
- Issue date Oct 30, 1984
- Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Precision measuring apparatus
- Patent number 4,400,880
- Issue date Aug 30, 1983
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and circuit for operating an incandescent lamp
- Patent number 4,400,651
- Issue date Aug 23, 1983
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Lamp support apparatus
- Patent number 4,329,736
- Issue date May 11, 1982
- Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Incremental photoelectric measuring device
- Patent number 4,297,033
- Issue date Oct 27, 1981
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Longitudinal measuring device
- Patent number 4,295,742
- Issue date Oct 20, 1981
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Pivotable mount for scanning unit
- Patent number 4,273,447
- Issue date Jun 16, 1981
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Fastening apparatus for longitudinal measuring system
- Patent number 4,198,757
- Issue date Apr 22, 1980
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Correction apparatus for longitudinal or angular measuring system
- Patent number 4,170,829
- Issue date Oct 16, 1979
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING

Gunther Nelle

Person

Patents Grantslast 30 patents

Method and arrangement for reducing temperature-related dimensional...

Device and method for attaching a scale

Linear encoder with a modular scale and a method of producing same

Scale and scanning unit of a length measuring instrument, and metho...

Photoelectric position measuring encoder having scale formed of ele...

Position indicating encoder with magnetic end position determining...

Linear or angular encoder

Length measuring system

Sealed encoder

Linear encoder

Encapsulated measuring apparatus

Apparatus and method for measuring linear and angular displacements

Length measurement device

Position measuring apparatus

Position measuring device

Position measuring device

Length measuring apparatus with temperature compensation

Measuring instrument

Error correction system for position measuring device

Photoelectric incremental length or angle measuring device

Coupling arrangement for length measuring device

Incremental measuring instrument

Precision measuring apparatus

Method and circuit for operating an incandescent lamp

Lamp support apparatus

Incremental photoelectric measuring device

Longitudinal measuring device

Pivotable mount for scanning unit

Fastening apparatus for longitudinal measuring system

Correction apparatus for longitudinal or angular measuring system