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Gurshaman Baweja
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Allen, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method for collecting data from semiconductor equipment
Patent number
8,112,400
Issue date
Feb 7, 2012
Texas Instruments Incorporated
Bing Ouyang
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for bottleneck feed factor based scheduling
Patent number
6,868,298
Issue date
Mar 15, 2005
Texas Instruments Incorporated
Gurshaman Baweja
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Method for collecting data from semiconductor equipment
Publication number
20050138075
Publication date
Jun 23, 2005
TEXAS INSTRUMENTS INCORPORATED
Bing Ouyang
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for bottleneck feed factor based scheduling
Publication number
20030130756
Publication date
Jul 10, 2003
Gurshaman Baweja
G06 - COMPUTING CALCULATING COUNTING