Guy REDLER

Person

Haifa, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Loopback testing of integrated circuits
- Patent number 12,123,908
- Issue date Oct 22, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit workload, temperature, and/or sub-threshold leak...
- Patent number 12,092,684
- Issue date Sep 17, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Die-to-die connectivity monitoring
- Patent number 12,072,376
- Issue date Aug 27, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Die-to-die and chip-to-chip connectivity monitoring
- Patent number 12,013,800
- Issue date Jun 18, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device degradation monitoring
- Patent number 11,929,131
- Issue date Mar 12, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- G11 - INFORMATION STORAGE
Information Patent Grant
Die-to-die connectivity monitoring using a clocked receiver
- Patent number 11,815,551
- Issue date Nov 14, 2023
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit I/O integrity and degradation monitoring
- Patent number 11,762,789
- Issue date Sep 19, 2023
- PROTEANTECS LTD.
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit degradation estimation and time-of-failure predi...
- Patent number 11,740,281
- Issue date Aug 29, 2023
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Thermal sensor for integrated circuit
- Patent number 11,619,551
- Issue date Apr 4, 2023
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit workload, temperature and/or subthreshold leakag...
- Patent number 11,408,932
- Issue date Aug 9, 2022
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Die-to-die connectivity monitoring
- Patent number 11,293,977
- Issue date Apr 5, 2022
- PROTEANTECS LTD.
- Eyal Fayneh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit I/O integrity and degradation monitoring
- Patent number 11,275,700
- Issue date Mar 15, 2022
- PROTEANTECS LTD.
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit I/O integrity and degradation monitoring
- Patent number 10,740,262
- Issue date Aug 11, 2020
- PROTEANTECS LTD.
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
THERMAL SENSOR FOR INTEGRATED CIRCUIT
- Publication number 20250130117
- Publication date Apr 24, 2025
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT GLITCH DETECTION
- Publication number 20250112626
- Publication date Apr 3, 2025
- PROTEANTECS LTD.
- Eyal FAYNEH
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTEGRATED CIRCUIT SIMULATOR FOR DEGRADATION ESTIMATION AND TIME-OF...
- Publication number 20250012852
- Publication date Jan 9, 2025
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...
- Publication number 20240418770
- Publication date Dec 19, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING
- Publication number 20240393390
- Publication date Nov 28, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADAPTIVE FREQUENCY SCALING BASED ON CLOCK CYCLE TIME MEASUREMENT
- Publication number 20240372554
- Publication date Nov 7, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...
- Publication number 20240353476
- Publication date Oct 24, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING WITH A CLOCKED RECEIVER
- Publication number 20240038602
- Publication date Feb 1, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT PAD FAILURE DETECTION
- Publication number 20240004812
- Publication date Jan 4, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING USING A CLOCKED RECEIVER
- Publication number 20230393196
- Publication date Dec 7, 2023
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...
- Publication number 20230341460
- Publication date Oct 26, 2023
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICE DEGRADATION MONITORING
- Publication number 20230009637
- Publication date Jan 12, 2023
- PROTEANTECS LTD.
- Eyal FAYNEH
- G11 - INFORMATION STORAGE
Information Patent Application
DETERMINATION OF UNKNOWN BIAS AND DEVICE PARAMETERS OF INTEGRATED C...
- Publication number 20220343048
- Publication date Oct 27, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON-DIE THERMAL SENSING NETWORK FOR INTEGRATED CIRCUITS
- Publication number 20220268644
- Publication date Aug 25, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...
- Publication number 20220260630
- Publication date Aug 18, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING
- Publication number 20220229107
- Publication date Jul 21, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING
- Publication number 20220156206
- Publication date May 19, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING
- Publication number 20210325455
- Publication date Oct 21, 2021
- PROTEANTECS LTD.
- Eyal FAYNEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING
- Publication number 20200371972
- Publication date Nov 26, 2020
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE AND/OR SUBTHRESHOLD LEAKAG...
- Publication number 20200333393
- Publication date Oct 22, 2020
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit I/O integrity and degradation monitoring
- Publication number 20200210354
- Publication date Jul 2, 2020
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Loopback testing of integrated circuits

Integrated circuit workload, temperature, and/or sub-threshold leak...

Die-to-die connectivity monitoring

Die-to-die and chip-to-chip connectivity monitoring

Memory device degradation monitoring

Die-to-die connectivity monitoring using a clocked receiver

Integrated circuit I/O integrity and degradation monitoring

Integrated circuit degradation estimation and time-of-failure predi...

Thermal sensor for integrated circuit

Integrated circuit workload, temperature and/or subthreshold leakag...

Die-to-die connectivity monitoring

Integrated circuit I/O integrity and degradation monitoring

Integrated circuit I/O integrity and degradation monitoring

Patents Applicationslast 30 patents

THERMAL SENSOR FOR INTEGRATED CIRCUIT

INTEGRATED CIRCUIT GLITCH DETECTION

INTEGRATED CIRCUIT SIMULATOR FOR DEGRADATION ESTIMATION AND TIME-OF...

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...

DIE-TO-DIE CONNECTIVITY MONITORING

ADAPTIVE FREQUENCY SCALING BASED ON CLOCK CYCLE TIME MEASUREMENT

INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...

DIE-TO-DIE CONNECTIVITY MONITORING WITH A CLOCKED RECEIVER

INTEGRATED CIRCUIT PAD FAILURE DETECTION

DIE-TO-DIE CONNECTIVITY MONITORING USING A CLOCKED RECEIVER

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...

MEMORY DEVICE DEGRADATION MONITORING

DETERMINATION OF UNKNOWN BIAS AND DEVICE PARAMETERS OF INTEGRATED C...

ON-DIE THERMAL SENSING NETWORK FOR INTEGRATED CIRCUITS

INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...

DIE-TO-DIE CONNECTIVITY MONITORING

INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING

DIE-TO-DIE CONNECTIVITY MONITORING

INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE AND/OR SUBTHRESHOLD LEAKAG...

Integrated circuit I/O integrity and degradation monitoring