Hajime FUJIMURA

Follow

Person

Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Total reflection x-ray fluorescence spectrometer
- Patent number 11,867,646
- Issue date Jan 9, 2024
- Rigaku Corporation
- Makoto Kambe
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength dispersive x-ray fluorescence spectrometer and x-ray flu...
- Patent number 10,768,125
- Issue date Sep 8, 2020
- Rigaku Corporation
- Shuichi Kato
- G01 - MEASURING TESTING
Information Patent Grant
On-line coating adhesion determination apparatus of galvannealed st...
- Patent number 9,927,378
- Issue date Mar 27, 2018
- Nippon Steel & Sumitomo Metal Corporation
- Makoto Nakazawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20230400423
- Publication date Dec 14, 2023
- Rigaku Corporation
- Makoto KAMBE
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER AND X-RAY FLU...
- Publication number 20190072504
- Publication date Mar 7, 2019
- Rigaku Corporation
- Shuichi KATO
- G01 - MEASURING TESTING
Information Patent Application
ON-LINE COATING ADHESION DETERMINATION APPARATUS OF GALVANNEALED ST...
- Publication number 20160252469
- Publication date Sep 1, 2016
- NIPPON STEEL & SUMITOMO METAL CORPORATION
- Makoto NAKAZAWA
- G01 - MEASURING TESTING