Hans-Jurgen Fleischer

Person

Priestewitz, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for verifying a test substrate in a prober under defined the...
- Patent number 9,632,108
- Issue date Apr 25, 2017
- HSBC Bank USA, National Association
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Grant
Method for verifying a test substrate in a prober under defined the...
- Patent number 8,692,567
- Issue date Apr 8, 2014
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Grant
Probe station for testing semiconductor substrates and comprising E...
- Patent number 8,278,951
- Issue date Oct 2, 2012
- Cascade Microtech, Inc.
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Method and arrangement for positioning a probe card
- Patent number 7,733,108
- Issue date Jun 8, 2010
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Probe support with shield for the examination of test substrates un...
- Patent number 7,652,491
- Issue date Jan 26, 2010
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Probe receptacle for mounting a probe for testing semiconductor com...
- Patent number 7,560,942
- Issue date Jul 14, 2009
- SUSS MicroTec Test Systems GmbH
- Hans-Jurgen Fleischer
- G01 - MEASURING TESTING
Information Patent Grant
Procedure for reproduction of a calibration position of an aligned...
- Patent number 7,265,536
- Issue date Sep 4, 2007
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Method and prober for contacting a contact area with a contact tip
- Patent number 7,057,408
- Issue date Jun 6, 2006
- SUSS MicroTec Test Systems (GmbH)
- Stefan Schneidewind
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THE...
- Publication number 20140239991
- Publication date Aug 28, 2014
- Cascade Microtech, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THE...
- Publication number 20110241711
- Publication date Oct 6, 2011
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD
- Publication number 20090085595
- Publication date Apr 2, 2009
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD
- Publication number 20090021275
- Publication date Jan 22, 2009
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
PROBE SUPPORT AND PROCESS FOR THE EXAMINATION OF TEST SUBSTRATES UN...
- Publication number 20080116917
- Publication date May 22, 2008
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION TO TESTING SEMICONDUCTOR SUBSTRATES AND COMPRISING EM...
- Publication number 20080116918
- Publication date May 22, 2008
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
PROBE RECEPTACLE FOR MOUNTING A PROBE FOR TESTING SEMICONDUCTOR COM...
- Publication number 20080116911
- Publication date May 22, 2008
- SUSS MicroTec Test Systems GmbH
- Hans-Jurgen FLEISCHER
- G01 - MEASURING TESTING
Information Patent Application
Procedure for reproduction of a calibration position of an aligned...
- Publication number 20060212248
- Publication date Sep 21, 2006
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
Method and prober for contacting a contact area with a contact tip
- Publication number 20050007135
- Publication date Jan 13, 2005
- Stefan Schneidewind
- G01 - MEASURING TESTING

Hans-Jurgen Fleischer

Person

Patents Grantslast 30 patents

Method for verifying a test substrate in a prober under defined the...

Method for verifying a test substrate in a prober under defined the...

Probe station for testing semiconductor substrates and comprising E...

Method and arrangement for positioning a probe card

Probe support with shield for the examination of test substrates un...

Probe receptacle for mounting a probe for testing semiconductor com...

Procedure for reproduction of a calibration position of an aligned...

Method and prober for contacting a contact area with a contact tip

Patents Applicationslast 30 patents

METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THE...

METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THE...

METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD

METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD

PROBE SUPPORT AND PROCESS FOR THE EXAMINATION OF TEST SUBSTRATES UN...

PROBE STATION TO TESTING SEMICONDUCTOR SUBSTRATES AND COMPRISING EM...

PROBE RECEPTACLE FOR MOUNTING A PROBE FOR TESTING SEMICONDUCTOR COM...

Procedure for reproduction of a calibration position of an aligned...

Method and prober for contacting a contact area with a contact tip