Hao-Ying Cheng

Person

Hsinchu City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Cleaning method for photo masks and apparatus therefor
- Patent number 12,259,649
- Issue date Mar 25, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsin-Chang Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Vertical probe card device and fence-like probe thereof
- Patent number 12,203,961
- Issue date Jan 21, 2025
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card and probe module thereof
- Patent number 12,181,496
- Issue date Dec 31, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe card having different probes
- Patent number 12,146,897
- Issue date Nov 19, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Modular vertical probe card
- Patent number 12,111,336
- Issue date Oct 8, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card device and elastic probe thereof
- Patent number 12,092,661
- Issue date Sep 17, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
EUV photo masks and manufacturing method thereof
- Patent number 12,044,959
- Issue date Jul 23, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hung-Yi Tsai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Vertical probe card and fence-like probe thereof
- Patent number 11,988,686
- Issue date May 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card device and focusing probe thereof
- Patent number 11,913,973
- Issue date Feb 27, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card and carrier thereof
- Patent number 11,879,912
- Issue date Jan 23, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Cleaning method for photo masks and apparatus therefor
- Patent number 11,852,969
- Issue date Dec 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsin-Chang Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
EUV photo masks and manufacturing method thereof
- Patent number 11,592,737
- Issue date Feb 28, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hung-Yi Tsai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Cleaning method for photo masks and apparatus therefor
- Patent number 11,385,538
- Issue date Jul 12, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsin-Chang Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Grinding disk and method of manufacturing the same
- Patent number 10,654,150
- Issue date May 19, 2020
- Industrial Technology Research Institute
- Wei-Chien Tsai
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Electrochemical energy conversion device and method of electrochemi...
- Patent number 10,637,071
- Issue date Apr 28, 2020
- Industrial Technology Research Institute
- Chiu-Ping Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display panel and curved display
- Patent number 9,599,870
- Issue date Mar 21, 2017
- AU Optronics Corp.
- Gang-Yi Lin
- G02 - OPTICS
Information Patent Grant
Image depth generation device and method thereof
- Patent number 9,225,970
- Issue date Dec 29, 2015
- Realtek Semiconductor Corp.
- Chia-Wei Yu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Vertical light emitting diode (VLED) dice having confinement layers...
- Patent number 9,130,114
- Issue date Sep 8, 2015
- SemiLEDs Optoelectronics Co., Ltd.
- Chen-Fu Chu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating semiconductor dice by separating a substrate...
- Patent number 8,921,204
- Issue date Dec 30, 2014
- SemiLEDs Optoelectronics Co., Ltd.
- Chen-Fu Chu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating vertical light emitting diode (VLED) structu...
- Patent number 8,871,547
- Issue date Oct 28, 2014
- SemiLEDs Optoelectronics Co., Ltd.
- Chen-Fu Chu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flip chip
- Patent number D715234
- Issue date Oct 14, 2014
- Semileds Optoelectronics Co., Ltd.
- Hsun-Cheng Chan
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
2D to 3D image conversion apparatus and method thereof
- Patent number 8,842,905
- Issue date Sep 23, 2014
- Realtek Semiconductor Corp.
- Chun-Hsing Hsieh
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of fabricating semiconductor die using handling layer
- Patent number 8,802,469
- Issue date Aug 12, 2014
- SemiLEDs Optoelectronics Co., Ltd.
- Chen-Fu Chu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for defining semiconductor devices
- Patent number 8,778,780
- Issue date Jul 15, 2014
- SemiLEDs Optoelectronics Co., Ltd.
- Trung Tri Doan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light emitting diode (LED) die having peripheral electrode frame an...
- Patent number 8,723,160
- Issue date May 13, 2014
- SemiLEDs Optoelectronics Co., Ltd.
- Chen-Fu Chu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating side by side light emitting diode (LED) havi...
- Patent number 8,716,041
- Issue date May 6, 2014
- SemiLEDS Optoelectrics Co., Ltd.
- Trung Tri Doan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for guiding current in a light emitting diode (LED) device
- Patent number 8,703,515
- Issue date Apr 22, 2014
- SemiLEDs Optoelectronics Co., Ltd.
- Wen-Huang Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to make low resistance contact
- Patent number 8,685,764
- Issue date Apr 1, 2014
- Semileds Optoelectronics Co., Ltd.
- Chen-Fu Chu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Protection for the epitaxial structure of metal devices
- Patent number 8,614,449
- Issue date Dec 24, 2013
- Semileds Optoelectronics Co., Ltd.
- Feng-Hsu Fan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Side by side light emitting diode (LED) having separate electrical...
- Patent number 8,552,458
- Issue date Oct 8, 2013
- SemiLEDs Optoelectronics Co., Ltd.
- Trung Tri Doan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRICAL CONNECTION ASSEMBLY
- Publication number 20250023277
- Publication date Jan 16, 2025
- Delta Electronics, Inc.
- Chien-An Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR IMPROVING PLASMA IGNITION STABILITY
- Publication number 20240404834
- Publication date Dec 5, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ping-Hsun Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND SOLDER RECEIVING PROBE
- Publication number 20240385223
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND CLIMB-RESTRICTING PROBE
- Publication number 20240385217
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND MICRO ELECTRO MECHANICAL SYSTEM (M...
- Publication number 20240385218
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND LIGHT SCATTERING PROBE
- Publication number 20240385219
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND LIGHT ABSORPTION PROBE
- Publication number 20240385221
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND CANTILEVER PROBE MODULE
- Publication number 20240385222
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
EUV PHOTO MASKS AND MANUFACTURING METHOD THEREOF
- Publication number 20240337918
- Publication date Oct 10, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hung-Yi TSAI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PLANAR TRANSFORMER
- Publication number 20240242878
- Publication date Jul 18, 2024
- Delta Electronics, Inc.
- Po-Yi KUO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PERFORMING SELECTIVE ETCH ON ARRAY SUBSTRATE
- Publication number 20240217868
- Publication date Jul 4, 2024
- Industrial Technology Research Institute
- Hao-Wen Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLEANING METHOD FOR PHOTO MASKS AND APPARATUS THEREFOR
- Publication number 20240085781
- Publication date Mar 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsin-Chang LEE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR FABRICATING MASK
- Publication number 20230402283
- Publication date Dec 14, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ping-Hsun LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CANTILEVER PROBE CARD AND CARRIER THEREOF
- Publication number 20230349948
- Publication date Nov 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND ELASTIC PROBE THEREOF
- Publication number 20230349952
- Publication date Nov 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR IMPROVING PLASMA IGNITION STABILITY
- Publication number 20230352309
- Publication date Nov 2, 2023
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Ping-Hsun Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND FOCUSING PROBE THEREOF
- Publication number 20230349951
- Publication date Nov 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD AND PROBE MODULE THEREOF
- Publication number 20230349953
- Publication date Nov 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD DEVICE AND FENCE-LIKE PROBE THEREOF
- Publication number 20230314480
- Publication date Oct 5, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD HAVING DIFFERENT PROBES
- Publication number 20230314477
- Publication date Oct 5, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
MODULAR VERTICAL PROBE CARD
- Publication number 20230314481
- Publication date Oct 5, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD AND FENCE-LIKE PROBE THEREOF
- Publication number 20230314478
- Publication date Oct 5, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
EUV PHOTO MASKS AND MANUFACTURING METHOD THEREOF
- Publication number 20230205072
- Publication date Jun 29, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hung-Yi TSAI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CLEANING METHOD FOR PHOTO MASKS AND APPARATUS THEREFOR
- Publication number 20220334468
- Publication date Oct 20, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsin-Chang LEE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CLEANING METHOD FOR PHOTO MASKS AND APPARATUS THEREFOR
- Publication number 20210373436
- Publication date Dec 2, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsin-Chang LEE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
EUV PHOTO MASKS AND MANUFACTURING METHOD THEREOF
- Publication number 20210373430
- Publication date Dec 2, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hung-Yi TSAI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
GRINDING DISK AND METHOD OF MANUFACTURING THE SAME
- Publication number 20190193247
- Publication date Jun 27, 2019
- Industrial Technology Research Institute
- Wei-Chien Tsai
- B24 - GRINDING POLISHING
Information Patent Application
CATALYST COMPOSITION FOR ALKALINE ELECTROCHEMICAL ENERGY CONVERSION...
- Publication number 20170187046
- Publication date Jun 29, 2017
- Industrial Technology Research Institute
- Chiu-Ping Huang
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
HEAT DISSIPATION MODULE
- Publication number 20170176117
- Publication date Jun 22, 2017
- Industrial Technology Research Institute
- Jin-Bao Wu
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
DISPLAY PANEL AND CURVED DISPLAY
- Publication number 20160026050
- Publication date Jan 28, 2016
- AU OPTRONICS CORP.
- Gang-Yi Lin
- G02 - OPTICS

Hao-Ying Cheng

Person

Patents Grantslast 30 patents

Cleaning method for photo masks and apparatus therefor

Vertical probe card device and fence-like probe thereof

Cantilever probe card and probe module thereof

Vertical probe card having different probes

Modular vertical probe card

Cantilever probe card device and elastic probe thereof

EUV photo masks and manufacturing method thereof

Vertical probe card and fence-like probe thereof

Cantilever probe card device and focusing probe thereof

Cantilever probe card and carrier thereof

Cleaning method for photo masks and apparatus therefor

EUV photo masks and manufacturing method thereof

Cleaning method for photo masks and apparatus therefor

Grinding disk and method of manufacturing the same

Electrochemical energy conversion device and method of electrochemi...

Display panel and curved display

Image depth generation device and method thereof

Vertical light emitting diode (VLED) dice having confinement layers...

Method for fabricating semiconductor dice by separating a substrate...

Method for fabricating vertical light emitting diode (VLED) structu...

Flip chip

2D to 3D image conversion apparatus and method thereof

Method of fabricating semiconductor die using handling layer

Method for defining semiconductor devices

Light emitting diode (LED) die having peripheral electrode frame an...

Method for fabricating side by side light emitting diode (LED) havi...

Method for guiding current in a light emitting diode (LED) device

Method to make low resistance contact

Protection for the epitaxial structure of metal devices

Side by side light emitting diode (LED) having separate electrical...

Patents Applicationslast 30 patents

ELECTRICAL CONNECTION ASSEMBLY

METHODS AND SYSTEMS FOR IMPROVING PLASMA IGNITION STABILITY

CANTILEVER PROBE CARD DEVICE AND SOLDER RECEIVING PROBE

CANTILEVER PROBE CARD DEVICE AND CLIMB-RESTRICTING PROBE

CANTILEVER PROBE CARD DEVICE AND MICRO ELECTRO MECHANICAL SYSTEM (M...

CANTILEVER PROBE CARD DEVICE AND LIGHT SCATTERING PROBE

CANTILEVER PROBE CARD DEVICE AND LIGHT ABSORPTION PROBE

CANTILEVER PROBE CARD DEVICE AND CANTILEVER PROBE MODULE

EUV PHOTO MASKS AND MANUFACTURING METHOD THEREOF

PLANAR TRANSFORMER

METHOD OF PERFORMING SELECTIVE ETCH ON ARRAY SUBSTRATE

CLEANING METHOD FOR PHOTO MASKS AND APPARATUS THEREFOR

METHOD FOR FABRICATING MASK

CANTILEVER PROBE CARD AND CARRIER THEREOF

CANTILEVER PROBE CARD DEVICE AND ELASTIC PROBE THEREOF

METHODS AND SYSTEMS FOR IMPROVING PLASMA IGNITION STABILITY

CANTILEVER PROBE CARD DEVICE AND FOCUSING PROBE THEREOF

CANTILEVER PROBE CARD AND PROBE MODULE THEREOF

VERTICAL PROBE CARD DEVICE AND FENCE-LIKE PROBE THEREOF

VERTICAL PROBE CARD HAVING DIFFERENT PROBES

MODULAR VERTICAL PROBE CARD

VERTICAL PROBE CARD AND FENCE-LIKE PROBE THEREOF

EUV PHOTO MASKS AND MANUFACTURING METHOD THEREOF

CLEANING METHOD FOR PHOTO MASKS AND APPARATUS THEREFOR

CLEANING METHOD FOR PHOTO MASKS AND APPARATUS THEREFOR

EUV PHOTO MASKS AND MANUFACTURING METHOD THEREOF

GRINDING DISK AND METHOD OF MANUFACTURING THE SAME

CATALYST COMPOSITION FOR ALKALINE ELECTROCHEMICAL ENERGY CONVERSION...

HEAT DISSIPATION MODULE

DISPLAY PANEL AND CURVED DISPLAY