Harald GOSSNER

Person

Riemerling, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Device for detecting water on a surface and a method for detecting...
- Patent number 11,680,895
- Issue date Jun 20, 2023
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Dietrich Dumler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Group III-nitride Schottky diode
- Patent number 11,545,586
- Issue date Jan 3, 2023
- Intel Corporation
- Harald Gossner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Group III-nitride silicon controlled rectifier
- Patent number 11,424,354
- Issue date Aug 23, 2022
- Intel Corporation
- Harald Gossner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Variable capacitance device with multiple two-dimensional electron...
- Patent number 11,380,806
- Issue date Jul 5, 2022
- Intel Corporation
- Harald Gossner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Group III-nitride antenna diode
- Patent number 11,373,995
- Issue date Jun 28, 2022
- Intel Corporation
- Harald Gossner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit for electrostatic discharge protection for wide frequency r...
- Patent number 11,355,924
- Issue date Jun 7, 2022
- Intel Corporation
- Krzysztof Domanski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual fin silicon controlled rectifier (SCR) electrostatic discharge...
- Patent number 10,629,586
- Issue date Apr 21, 2020
- Indian Institute of Science
- Milova Paul
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET SCR with SCR implant under anode and cathode junctions
- Patent number 10,535,762
- Issue date Jan 14, 2020
- INDIAN INSTITUTE OF SCIENCE
- Mayank Shrivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices and methods to enhance electrostatic discharg...
- Patent number 10,483,258
- Issue date Nov 19, 2019
- INDIAN INSTITUTE OF SCIENCE
- Mayank Shrivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tunnel field effect transistors
- Patent number 10,374,068
- Issue date Aug 6, 2019
- Infineon Technologies AG
- Harald Gossner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-planar electrostatic discharge (ESD) protection devices with na...
- Patent number 10,319,662
- Issue date Jun 11, 2019
- Indian Institute of Science
- Mayank Shrivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low trigger and holding voltage silicon controlled rectifier (SCR)...
- Patent number 10,211,200
- Issue date Feb 19, 2019
- Indian Institute of Science
- Mayank Shrivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Directional pulse injection into a microelectronic system for elect...
- Patent number 10,082,534
- Issue date Sep 25, 2018
- Intel IP Corporation
- Harald Gossner
- G01 - MEASURING TESTING
Information Patent Grant
Diode-based ESD concept for DEMOS protection
- Patent number 10,068,893
- Issue date Sep 4, 2018
- Infineon Technologies AG
- Jens Schneider
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Board, integrated circuit testing arrangement, and method for opera...
- Patent number 10,006,942
- Issue date Jun 26, 2018
- Intel IP Corporation
- Benjamin Orr
- G01 - MEASURING TESTING
Information Patent Grant
Flow diversion devices
- Patent number 9,818,672
- Issue date Nov 14, 2017
- Intel IP Corporation
- Michael P. Skinner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drain extended field effect transistors and methods of formation th...
- Patent number 9,647,069
- Issue date May 9, 2017
- Infineon Technologies AG
- Mayank Shrivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tunable FIN-SCR for robust ESD protection
- Patent number 9,608,098
- Issue date Mar 28, 2017
- INTEL DEUTSCHLAND GMBH
- Mayank Shrivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tunnel field effect transistors
- Patent number 9,577,079
- Issue date Feb 21, 2017
- Infineon Technologies AG
- Harald Gossner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flexibly-wrapped integrated circuit die
- Patent number 9,515,049
- Issue date Dec 6, 2016
- Intel Corporation
- Sven Albers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High voltage semiconductor devices
- Patent number 9,455,275
- Issue date Sep 27, 2016
- Infineon Techologies AG
- Mayank Shrivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field-effect device and manufacturing method thereof
- Patent number 9,401,352
- Issue date Jul 26, 2016
- Infineon Technologies AG
- Mayank Shrivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for manufacturing a semiconductor device
- Patent number 9,368,573
- Issue date Jun 14, 2016
- Infineon Technologies AG
- Mayank Shrivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Die edge side connection
- Patent number 9,209,143
- Issue date Dec 8, 2015
- Intel IP Corporation
- Georg Seidemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drain extended field effect transistors and methods of formation th...
- Patent number 9,087,892
- Issue date Jul 21, 2015
- Infineon Technologies AG
- Mayank Shrivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diode-based ESD concept for DEMOS protection
- Patent number 9,048,096
- Issue date Jun 2, 2015
- Infineon Technologies AG
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field-effect device and manufacturing method thereof
- Patent number 9,035,375
- Issue date May 19, 2015
- Infineon Technologies AG
- Mayank Shrivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tunable fin-SCR for robust ESD protection
- Patent number 8,963,201
- Issue date Feb 24, 2015
- Intel Mobile Communications GmbH
- Mayank Shrivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices
- Patent number 8,878,234
- Issue date Nov 4, 2014
- Infineon Technologies AG
- Harald Gossner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon controlled rectifier (SCR) device for bulk FinFET technology
- Patent number 8,785,968
- Issue date Jul 22, 2014
- Intel Mobile Communications GmbH
- Mayank Shrivastava
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METAL-SEMICONDUCTOR JUNCTION FORMED BY BURIED POWER RAIL
- Publication number 20230207464
- Publication date Jun 29, 2023
- Intel Corporation
- Richard Geiger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BURIED POWER RAILS INTEGRATED WITH DECOUPLING CAPACITANCE
- Publication number 20230197599
- Publication date Jun 22, 2023
- Intel Corporation
- Bernd Waidhas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Structure and Method for Forming a Semiconductor Stru...
- Publication number 20230197537
- Publication date Jun 22, 2023
- Intel Corporation
- Richard GEIGER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Package, Semiconductor Die and Method for Forming a S...
- Publication number 20230197644
- Publication date Jun 22, 2023
- Intel Corporation
- Wolfgang MOLZER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INDUCTORS AND TRANSFORMERS FORMED BY BURIED POWER RAILS
- Publication number 20230197598
- Publication date Jun 22, 2023
- Intel Corporation
- Georgios Panagopoulos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BACKSIDE HEAT DISSIPATION USING BURIED HEAT RAILS
- Publication number 20230187300
- Publication date Jun 15, 2023
- Intel Corporation
- Richard Geiger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT STRUCTURES INCLUDING ELASTROSTATIC DISCHARGE BAL...
- Publication number 20230178542
- Publication date Jun 8, 2023
- Intel Corporation
- Harald Gossner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VERTICAL DIODES EXTENDING THROUGH SUPPORT STRUCTURES
- Publication number 20230163120
- Publication date May 25, 2023
- Intel Corporation
- Richard Geiger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR DETECTING A STATE OF A ROAD SURFACE
- Publication number 20230079037
- Publication date Mar 16, 2023
- FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG e.V.
- Dietrich DUMLER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
III-N DIODES WITH N-DOPED WELLS AND CAPPING LAYERS
- Publication number 20230068318
- Publication date Mar 2, 2023
- Intel Corporation
- Richard Geiger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VARIABLE CAPACITANCE DEVICE WITH MULTIPLE TWO-DIMENSIONAL ELECTRON...
- Publication number 20220320350
- Publication date Oct 6, 2022
- Intel Corporation
- Harald Gossner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR DETECTING WATER ON A SURFACE AND A METHOD FOR DETECTING...
- Publication number 20210285867
- Publication date Sep 16, 2021
- FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG e.V.
- Dietrich Dumler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Circuit for electrostatic discharge protection for wide frequency r...
- Publication number 20210044104
- Publication date Feb 11, 2021
- Intel IP Corporation
- Krzysztof DOMANSKI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
GROUP III-NITRIDE ANTENNA DIODE
- Publication number 20200411505
- Publication date Dec 31, 2020
- Intel Corporation
- Harald Gossner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GROUP III-NITRIDE SCHOTTKY DIODE
- Publication number 20200411699
- Publication date Dec 31, 2020
- Intel Corporation
- Harald Gossner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VARIABLE CAPACITANCE DEVICE WITH MULTIPLE TWO-DIMENSIONAL ELECTRON...
- Publication number 20200220030
- Publication date Jul 9, 2020
- Intel Corporation
- Harald Gossner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GROUP III-NITRIDE SILICON CONTROLLED RECTIFIER
- Publication number 20200203518
- Publication date Jun 25, 2020
- Santa Clara
- Harald Gossner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL FIN SILICON CONTROLLED RECTIFIER (SCR) ELECTROSTATIC DISCHARGE...
- Publication number 20190013310
- Publication date Jan 10, 2019
- Indian Institute of Science
- Milova PAUL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS TO ENHANCE ELECTROSTATIC DISCHARG...
- Publication number 20180247929
- Publication date Aug 30, 2018
- Indian Institute of Science
- Mayank Shrivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FINFET SCR WITH SCR IMPLANT UNDER ANODE AND CATHODE JUNCTIONS
- Publication number 20180248025
- Publication date Aug 30, 2018
- Indian Institute of Science
- Mayank Shrivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-PLANAR ELECTROSTATIC DISCHARGE (ESD) PROTECTION DEVICES WITH NA...
- Publication number 20180226317
- Publication date Aug 9, 2018
- Indian Institute of Science
- Mayank SHRIVASTAVA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOW TRIGGER AND HOLDING VOLTAGE SILICON CONTROLLED RECTIFIER (SCR)...
- Publication number 20180219007
- Publication date Aug 2, 2018
- Indian Institute of Science
- Mayank SHRIVASTAVA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIRECTIONAL PULSE INJECTION INTO A MICROELECTRONIC SYSTEM FOR ELECT...
- Publication number 20170168110
- Publication date Jun 15, 2017
- Intel Corporation
- Harald GOSSNER
- G01 - MEASURING TESTING
Information Patent Application
Tunnel Field Effect Transistors
- Publication number 20170125556
- Publication date May 4, 2017
- INFINEON TECHNOLOGIES AG
- Harald Gossner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH CONDUCTIVITY HIGH FREQUENCY VIA FOR ELECTRONIC SYSTEMS
- Publication number 20160225694
- Publication date Aug 4, 2016
- Hans-Joachim BARTH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Drain Extended Field Effect Transistors and Methods of Formation Th...
- Publication number 20150340442
- Publication date Nov 26, 2015
- INFINEON TECHNOLOGIES AG
- Mayank Shrivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Diode-Based ESD Concept for DEMOS Protection
- Publication number 20150262993
- Publication date Sep 17, 2015
- Infineon Technologies AG
- Jens Schneider
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Field-Effect Device and Manufacturing Method Thereof
- Publication number 20150255450
- Publication date Sep 10, 2015
- INFINEON TECHNOLOGIES AG
- Mayank Shrivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLOW DIVERSION DEVICES
- Publication number 20150235920
- Publication date Aug 20, 2015
- Michael P. Skinner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLEXIBLY-WRAPPED INTEGRATED CIRCUIT DIE
- Publication number 20150214188
- Publication date Jul 30, 2015
- Sven Albers
- H01 - BASIC ELECTRIC ELEMENTS

Harald GOSSNER

Person

Patents Grantslast 30 patents

Device for detecting water on a surface and a method for detecting...

Group III-nitride Schottky diode

Group III-nitride silicon controlled rectifier

Variable capacitance device with multiple two-dimensional electron...

Group III-nitride antenna diode

Circuit for electrostatic discharge protection for wide frequency r...

Dual fin silicon controlled rectifier (SCR) electrostatic discharge...

FinFET SCR with SCR implant under anode and cathode junctions

Semiconductor devices and methods to enhance electrostatic discharg...

Tunnel field effect transistors

Non-planar electrostatic discharge (ESD) protection devices with na...

Low trigger and holding voltage silicon controlled rectifier (SCR)...

Directional pulse injection into a microelectronic system for elect...

Diode-based ESD concept for DEMOS protection

Board, integrated circuit testing arrangement, and method for opera...

Flow diversion devices

Drain extended field effect transistors and methods of formation th...

Tunable FIN-SCR for robust ESD protection

Tunnel field effect transistors

Flexibly-wrapped integrated circuit die

High voltage semiconductor devices

Field-effect device and manufacturing method thereof

Methods for manufacturing a semiconductor device

Die edge side connection

Drain extended field effect transistors and methods of formation th...

Diode-based ESD concept for DEMOS protection

Field-effect device and manufacturing method thereof

Tunable fin-SCR for robust ESD protection

Semiconductor devices

Silicon controlled rectifier (SCR) device for bulk FinFET technology

Patents Applicationslast 30 patents

METAL-SEMICONDUCTOR JUNCTION FORMED BY BURIED POWER RAIL

BURIED POWER RAILS INTEGRATED WITH DECOUPLING CAPACITANCE

Semiconductor Structure and Method for Forming a Semiconductor Stru...

Semiconductor Package, Semiconductor Die and Method for Forming a S...

INDUCTORS AND TRANSFORMERS FORMED BY BURIED POWER RAILS

BACKSIDE HEAT DISSIPATION USING BURIED HEAT RAILS

INTEGRATED CIRCUIT STRUCTURES INCLUDING ELASTROSTATIC DISCHARGE BAL...

VERTICAL DIODES EXTENDING THROUGH SUPPORT STRUCTURES

APPARATUS AND METHOD FOR DETECTING A STATE OF A ROAD SURFACE

III-N DIODES WITH N-DOPED WELLS AND CAPPING LAYERS

VARIABLE CAPACITANCE DEVICE WITH MULTIPLE TWO-DIMENSIONAL ELECTRON...

DEVICE FOR DETECTING WATER ON A SURFACE AND A METHOD FOR DETECTING...

Circuit for electrostatic discharge protection for wide frequency r...

GROUP III-NITRIDE ANTENNA DIODE

GROUP III-NITRIDE SCHOTTKY DIODE

VARIABLE CAPACITANCE DEVICE WITH MULTIPLE TWO-DIMENSIONAL ELECTRON...

GROUP III-NITRIDE SILICON CONTROLLED RECTIFIER

DUAL FIN SILICON CONTROLLED RECTIFIER (SCR) ELECTROSTATIC DISCHARGE...

SEMICONDUCTOR DEVICES AND METHODS TO ENHANCE ELECTROSTATIC DISCHARG...

FINFET SCR WITH SCR IMPLANT UNDER ANODE AND CATHODE JUNCTIONS

NON-PLANAR ELECTROSTATIC DISCHARGE (ESD) PROTECTION DEVICES WITH NA...

LOW TRIGGER AND HOLDING VOLTAGE SILICON CONTROLLED RECTIFIER (SCR)...

DIRECTIONAL PULSE INJECTION INTO A MICROELECTRONIC SYSTEM FOR ELECT...

Tunnel Field Effect Transistors

HIGH CONDUCTIVITY HIGH FREQUENCY VIA FOR ELECTRONIC SYSTEMS

Drain Extended Field Effect Transistors and Methods of Formation Th...

Diode-Based ESD Concept for DEMOS Protection

Field-Effect Device and Manufacturing Method Thereof

FLOW DIVERSION DEVICES

FLEXIBLY-WRAPPED INTEGRATED CIRCUIT DIE