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Harold D. Edmonds
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Hopewell Junction, NY, US
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last 30 patents
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Patent Grant
Method for determining oxygen and carbon in silicon semiconductor w...
Patent number
4,590,574
Issue date
May 20, 1986
International Business Machines Corp.
Harold D. Edmonds
G01 - MEASURING TESTING
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Patent Grant
Dual mode spectrometer test station
Patent number
4,506,158
Issue date
Mar 19, 1985
International Business Machines Corporation
Robert H. Cadwallader
G01 - MEASURING TESTING