Harry Chuang

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wiring layout having differently shaped vias
- Patent number 8,981,562
- Issue date Mar 17, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry Chuang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for removing hard masks on gates in semiconductor manufactur...
- Patent number 8,796,084
- Issue date Aug 5, 2014
- Taiwan Semiconductor Manufacturing Company Ltd.
- Hung Chih Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SRAM devices utilizing strained-channel transistors and methods of...
- Patent number 8,624,295
- Issue date Jan 7, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Strained transistor with optimized drive current and method of forming
- Patent number 8,558,278
- Issue date Oct 15, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Implanted metal silicide for semiconductor device
- Patent number 8,349,732
- Issue date Jan 8, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrating the formation of I/O and core MOS devices with MOS capa...
- Patent number 8,294,216
- Issue date Oct 23, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3-dimensional device design layout
- Patent number 8,286,114
- Issue date Oct 9, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Layout methods of integrated circuits having unit MOS devices
- Patent number 8,237,201
- Issue date Aug 7, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fuse structure
- Patent number 8,174,091
- Issue date May 8, 2012
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kong-Beng Thei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with local interconnects
- Patent number 8,138,554
- Issue date Mar 20, 2012
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spacer shape engineering for void-free gap-filling process
- Patent number 8,048,752
- Issue date Nov 1, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Yuan Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reducing device performance drift caused by large spacings between...
- Patent number 7,977,202
- Issue date Jul 12, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dishing-free gap-filling with multiple CMPs
- Patent number 7,955,964
- Issue date Jun 7, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Yuan Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with high-K/dual metal gate
- Patent number 7,915,111
- Issue date Mar 29, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Chih Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact scheme for MOSFETs
- Patent number 7,898,037
- Issue date Mar 1, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for semiconductor device with improved source/...
- Patent number 7,868,386
- Issue date Jan 11, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kong-Beng Thei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with both I/O and core components and method o...
- Patent number 7,868,361
- Issue date Jan 11, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung Long Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for removing hard masks on gates in semiconductor manufactur...
- Patent number 7,833,848
- Issue date Nov 16, 2010
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hung Chih Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Forming silicides with reduced tailing on silicon germanium and sil...
- Patent number 7,816,686
- Issue date Oct 19, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kuo-Hua Pan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SOI devices
- Patent number 7,812,379
- Issue date Oct 12, 2010
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Long Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for fabricating SOI devices
- Patent number 7,803,674
- Issue date Sep 28, 2010
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Long Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modifying work function in PMOS devices by counter-doping
- Patent number 7,750,416
- Issue date Jul 6, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Yi Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Dummy patterns in integrated circuit fabrication
- Patent number 7,701,034
- Issue date Apr 20, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective formation of stress memorization layer
- Patent number 7,678,636
- Issue date Mar 16, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with discontinuous CESL structure
- Patent number 7,655,984
- Issue date Feb 2, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Liang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for semiconductor device performance enhancement
- Patent number 7,632,729
- Issue date Dec 15, 2009
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOS devices with source/drain regions having stressed regions and n...
- Patent number 7,612,364
- Issue date Nov 3, 2009
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SOI devices and methods for fabricating the same
- Patent number 7,550,795
- Issue date Jun 23, 2009
- Taiwan Semiconductor Manufacturing
- Chung-Long Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Localized slots for stress relieve in copper
- Patent number 7,407,835
- Issue date Aug 5, 2008
- Taiwan Semiconductor Manufacturing Company
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improving design window
- Patent number 7,404,167
- Issue date Jul 22, 2008
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR REMOVING HARD MASKS ON GATES IN SEMICONDUCTOR MANUFACTUR...
- Publication number 20100216287
- Publication date Aug 26, 2010
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hung Chih Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH LOCAL INTERCONNECTS
- Publication number 20100065921
- Publication date Mar 18, 2010
- Taiwan Semiconductor Manufacturing Co., LTD
- Harry CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrating the Formation of I/O and Core MOS Devices with MOS Capa...
- Publication number 20100038692
- Publication date Feb 18, 2010
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Spacer Shape Engineering for Void-Free Gap-Filling Process
- Publication number 20100022061
- Publication date Jan 28, 2010
- Ming-Yuan Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure and a Method of Manufacture for Low Resistance NiSix
- Publication number 20100013029
- Publication date Jan 21, 2010
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOI DEVICES AND METHODS FOR FABRICATING THE SAME
- Publication number 20090298243
- Publication date Dec 3, 2009
- Chung-Long Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dishing-free gap-filling with multiple CMPs
- Publication number 20090286384
- Publication date Nov 19, 2009
- Ming-Yuan Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reducing Device Performance Drift Caused by Large Spacings Between...
- Publication number 20090273052
- Publication date Nov 5, 2009
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fuse Structure
- Publication number 20090273055
- Publication date Nov 5, 2009
- Kong-Beng Thei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SRAM Devices Utilizing Strained-Channel Transistors and Methods of...
- Publication number 20090236633
- Publication date Sep 24, 2009
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOI DEVICES AND METHODS FOR FABRICATING THE SAME
- Publication number 20090218623
- Publication date Sep 3, 2009
- Chung-Long Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR REMOVING HARD MASKS ON GATES IN SEMICONDUCTOR MANUFACTUR...
- Publication number 20090087955
- Publication date Apr 2, 2009
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hung Chih Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH HIGH-K/DUAL METAL GATE
- Publication number 20090039433
- Publication date Feb 12, 2009
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Chih Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device with both I/O and Core Components and Method o...
- Publication number 20080315320
- Publication date Dec 25, 2008
- Chung Long Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device with discontinuous CESL structure
- Publication number 20080308873
- Publication date Dec 18, 2008
- Chien-Liang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Forming silicides with reduced tailing on silicon germanium and sil...
- Publication number 20080308842
- Publication date Dec 18, 2008
- Kuo-Hua Pan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Layout methods of integrated circuits having unit MOS devices
- Publication number 20080296691
- Publication date Dec 4, 2008
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3-Dimensional Device Design Layout
- Publication number 20080263492
- Publication date Oct 23, 2008
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Contact Scheme for MOSFETs
- Publication number 20080258228
- Publication date Oct 23, 2008
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FORMING TRANSISTORS WITH HIGH-K DIELECTRIC LAYERS AND T...
- Publication number 20080254588
- Publication date Oct 16, 2008
- Taiwan Semiconductor Manufacturing Co., LTD
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Improving Design Window
- Publication number 20080237885
- Publication date Oct 2, 2008
- Harry Chuang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and Apparatus for Semiconductor Device with Improved Source/...
- Publication number 20080179688
- Publication date Jul 31, 2008
- Kong Beng Thei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Strained Transistor with Optimized Drive Current and Method of Forming
- Publication number 20080169484
- Publication date Jul 17, 2008
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for semiconductor device performance enhancement
- Publication number 20080076215
- Publication date Mar 27, 2008
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure and methods for forming SiGe stressors
- Publication number 20080054250
- Publication date Mar 6, 2008
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for controlling thickness uniformity of SiGe regions
- Publication number 20080042123
- Publication date Feb 21, 2008
- Kong-Beng Thei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for semiconductor device with improved source/...
- Publication number 20080020533
- Publication date Jan 24, 2008
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kong-Beng Thei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Selective formation of stress memorization layer
- Publication number 20080003734
- Publication date Jan 3, 2008
- Harry Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOI devices and methods for fabricating the same
- Publication number 20080001188
- Publication date Jan 3, 2008
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Long Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Modifying work function in PMOS devices by counter-doping
- Publication number 20070257308
- Publication date Nov 8, 2007
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Yi Lee
- G11 - INFORMATION STORAGE

Harry Chuang

Person

Patents Grantslast 30 patents

Wiring layout having differently shaped vias

Method for removing hard masks on gates in semiconductor manufactur...

SRAM devices utilizing strained-channel transistors and methods of...

Strained transistor with optimized drive current and method of forming

Implanted metal silicide for semiconductor device

Integrating the formation of I/O and core MOS devices with MOS capa...

3-dimensional device design layout

Layout methods of integrated circuits having unit MOS devices

Fuse structure

Semiconductor device with local interconnects

Spacer shape engineering for void-free gap-filling process

Reducing device performance drift caused by large spacings between...

Dishing-free gap-filling with multiple CMPs

Semiconductor device with high-K/dual metal gate

Contact scheme for MOSFETs

Method and apparatus for semiconductor device with improved source/...

Semiconductor device with both I/O and core components and method o...

Method for removing hard masks on gates in semiconductor manufactur...

Forming silicides with reduced tailing on silicon germanium and sil...

SOI devices

Methods for fabricating SOI devices

Modifying work function in PMOS devices by counter-doping

Dummy patterns in integrated circuit fabrication

Selective formation of stress memorization layer

Semiconductor device with discontinuous CESL structure

Method for semiconductor device performance enhancement

MOS devices with source/drain regions having stressed regions and n...

SOI devices and methods for fabricating the same

Localized slots for stress relieve in copper

Method for improving design window

Patents Applicationslast 30 patents

METHOD FOR REMOVING HARD MASKS ON GATES IN SEMICONDUCTOR MANUFACTUR...

SEMICONDUCTOR DEVICE WITH LOCAL INTERCONNECTS

Integrating the Formation of I/O and Core MOS Devices with MOS Capa...

Spacer Shape Engineering for Void-Free Gap-Filling Process

Structure and a Method of Manufacture for Low Resistance NiSix

SOI DEVICES AND METHODS FOR FABRICATING THE SAME

Dishing-free gap-filling with multiple CMPs

Reducing Device Performance Drift Caused by Large Spacings Between...

Fuse Structure

SRAM Devices Utilizing Strained-Channel Transistors and Methods of...

SOI DEVICES AND METHODS FOR FABRICATING THE SAME

METHOD FOR REMOVING HARD MASKS ON GATES IN SEMICONDUCTOR MANUFACTUR...

SEMICONDUCTOR DEVICE WITH HIGH-K/DUAL METAL GATE

Semiconductor Device with both I/O and Core Components and Method o...

Semiconductor device with discontinuous CESL structure

Forming silicides with reduced tailing on silicon germanium and sil...

Layout methods of integrated circuits having unit MOS devices

3-Dimensional Device Design Layout

Contact Scheme for MOSFETs

METHODS FOR FORMING TRANSISTORS WITH HIGH-K DIELECTRIC LAYERS AND T...

Method for Improving Design Window

Method and Apparatus for Semiconductor Device with Improved Source/...

Strained Transistor with Optimized Drive Current and Method of Forming

Method for semiconductor device performance enhancement

Structure and methods for forming SiGe stressors

Methods for controlling thickness uniformity of SiGe regions

Method and apparatus for semiconductor device with improved source/...

Selective formation of stress memorization layer

SOI devices and methods for fabricating the same

Modifying work function in PMOS devices by counter-doping