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Harry Siebert
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Puchheim, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Device and method for electronic controlling
Patent number
8,964,779
Issue date
Feb 24, 2015
Infineon Technologies AG
Jens Barrenscheen
G05 - CONTROLLING REGULATING
Information
Patent Grant
Compact function trace based on execution length of leaf functions
Patent number
8,868,982
Issue date
Oct 21, 2014
Infineon Technologies AG
Albrecht Mayer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Arrangement for processing trace data information, integrated circu...
Patent number
8,825,922
Issue date
Sep 2, 2014
Infineon Technologies AG
Albrecht Mayer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Interface device and method
Patent number
8,555,122
Issue date
Oct 8, 2013
Infineon Technologies AG
Harry Siebert
G11 - INFORMATION STORAGE
Information
Patent Grant
System for testing connections between chips
Patent number
8,533,543
Issue date
Sep 10, 2013
Infineon Technologies AG
Jens Barrenscheen
G01 - MEASURING TESTING
Information
Patent Grant
Program code trace signature
Patent number
8,261,130
Issue date
Sep 4, 2012
Infineon Technologies AG
Albrecht Mayer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor device test system with test interface means
Patent number
8,185,788
Issue date
May 22, 2012
Infineon Technologies AG
Harry Siebert
G11 - INFORMATION STORAGE
Information
Patent Grant
System and method for integrated circuit emulation
Patent number
8,027,829
Issue date
Sep 27, 2011
Infineon Technologies AG
Albrecht Mayer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for signal transmission
Patent number
7,983,348
Issue date
Jul 19, 2011
Infineon Technologies AG
Harry Siebert
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Semiconductor device test system with test interface means
Patent number
7,895,486
Issue date
Feb 22, 2011
Infineon Technologies AG
Harry Siebert
G11 - INFORMATION STORAGE
Information
Patent Grant
Integrated circuit having a subordinate test interface
Patent number
7,810,004
Issue date
Oct 5, 2010
Infineon Technologies AG
Albrecht Mayer
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device system and method for modifying a semiconducto...
Patent number
7,786,476
Issue date
Aug 31, 2010
Infineon Technologies AG
Harry Siebert
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for testing an integrated circuit
Patent number
7,743,295
Issue date
Jun 22, 2010
Infineon Technologies AG
Albrecht Mayer
G11 - INFORMATION STORAGE
Information
Patent Grant
Circuit and method for comparing program counter values
Patent number
7,698,542
Issue date
Apr 13, 2010
Infineon Technologies AG
Martin Mohr
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Program-controlled unit
Patent number
7,418,631
Issue date
Aug 26, 2008
Infineon Technologies AG
Harry Siebert
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Programme-controlled unit with crossbar employing a diagnostic port
Patent number
7,305,512
Issue date
Dec 4, 2007
Infineon Technologies AG
Dietmar König
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Compact Function Trace
Publication number
20130185601
Publication date
Jul 18, 2013
INFINEON TECHNOLOGIES AG
Albrecht Mayer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ARRANGEMENT FOR PROCESSING TRACE DATA INFORMATION, INTEGRATED CIRCU...
Publication number
20120266029
Publication date
Oct 18, 2012
INFINEON TECHNOLOGIES AG
Albrecht Mayer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INTERFACE DEVICE AND METHOD
Publication number
20120210183
Publication date
Aug 16, 2012
INFINEON TECHNOLOGIES AG
HARRY SIEBERT
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Method for Formatting and Preselecting Trace Data
Publication number
20120089810
Publication date
Apr 12, 2012
INFINEON TECHNOLOGIES AG
Albrecht Mayer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR DEVICE TEST SYSTEM WITH TEST INTERFACE MEANS
Publication number
20110119542
Publication date
May 19, 2011
INFINEON TECHNOLOGIES AG
HARRY SIEBERT
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR TESTING CONNECTIONS BETWEEN CHIPS
Publication number
20100244848
Publication date
Sep 30, 2010
INFINEON TECHNOLOGIES AG
Jens Barrenscheen
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR PROVIDING A TRIGGER
Publication number
20090222797
Publication date
Sep 3, 2009
INFINEON TECHNOLOGIES AG
HARRY SIEBERT
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR INTEGRATED CIRCUIT EMULATION
Publication number
20090222254
Publication date
Sep 3, 2009
INFINEON TECHNOLOGIES AG
Albrecht Mayer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR TRACING INSTRUCTION POINTERS AND DATA ACCESS
Publication number
20090187747
Publication date
Jul 23, 2009
INFINEON TECHNOLOGIES AG
Albrecht Mayer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE AND METHOD FOR ELECTRONIC CONTROLLING
Publication number
20090144587
Publication date
Jun 4, 2009
INFINEON TECHNOLOGIES AG
Jens Barrenscheen
G05 - CONTROLLING REGULATING
Information
Patent Application
PROGRAM CODE TRACE SIGNATURE
Publication number
20080215920
Publication date
Sep 4, 2008
INFINEON TECHNOLOGIES
Albrecht Mayer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CIRCUIT AND METHOD FOR COMPARING VALUES
Publication number
20080052339
Publication date
Feb 28, 2008
Infineon Technologies AG
Martin Mohr
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INTEGRATED CIRCUIT HAVING A SUBORDINATE TEST INTERFACE
Publication number
20080040636
Publication date
Feb 14, 2008
INFINEON TECHNOLOGIES AG
Albrecht Mayer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR DEVICE SYSTEM AND METHOD FOR MODIFYING A SEMICONDUCTO...
Publication number
20070249068
Publication date
Oct 25, 2007
INFINEON TECHNOLOGIES AG
Harry Siebert
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR TESTING AN INTEGRATED CIRCUIT
Publication number
20070220336
Publication date
Sep 20, 2007
INFINEON TECHNOLOGIES AG
Albrecht Mayer
G11 - INFORMATION STORAGE
Information
Patent Application
SYSTEM AND METHOD FOR SIGNAL TRANSMISSION
Publication number
20070195895
Publication date
Aug 23, 2007
INFINEON TECHNOLOGIES AG
Harry Siebert
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Semiconductor device test system with test interface means
Publication number
20070061639
Publication date
Mar 15, 2007
Harry Siebert
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor chip
Publication number
20050289421
Publication date
Dec 29, 2005
Hermann Obermeir
G01 - MEASURING TESTING
Information
Patent Application
Programme-controlled unit
Publication number
20050163114
Publication date
Jul 28, 2005
Infineon Technologies AG
Dietmar Konig
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method of determining information about the processes which run in...
Publication number
20050120348
Publication date
Jun 2, 2005
Infineon Technologies AG
Albrecht Mayer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for operating a transmission system and transmission system...
Publication number
20050089029
Publication date
Apr 28, 2005
Heiko Ruhnke
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Control device
Publication number
20030233407
Publication date
Dec 18, 2003
Vladimir Khavrov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Program-controlled unit
Publication number
20030046666
Publication date
Mar 6, 2003
Harry Siebert
G06 - COMPUTING CALCULATING COUNTING