Haruka Shikano

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Nagoya-shi, Aichi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Photocathode kit, electron gun, and electron beam applicator
- Patent number 12,033,827
- Issue date Jul 9, 2024
- Photo electron Soul Inc.
- Haruka Shikano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Incident axis alignment method for electron gun equipped with photo...
- Patent number 11,417,494
- Issue date Aug 16, 2022
- Photo electron Soul Inc.
- Reiki Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam generator and electron beam applicator
- Patent number 11,302,507
- Issue date Apr 12, 2022
- Photo electron Soul Inc.
- Tomohiro Nishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample inspection device and sample inspection method
- Patent number 11,150,204
- Issue date Oct 19, 2021
- Photo electron Soul Inc.
- Tomohiro Nishitani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PHOTOCATHODE KIT, ELECTRON GUN, AND ELECTRON BEAM APPLICATION DEVICE
- Publication number 20220181111
- Publication date Jun 9, 2022
- PHOTO ELECTRON SOUL INC.
- Haruka SHIKANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INCIDENT AXIS ALIGNMENT METHOD FOR ELECTRON GUN EQUIPPED WITH PHOTO...
- Publication number 20210375578
- Publication date Dec 2, 2021
- PHOTO ELECTRON SOUL INC.
- Reiki Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM GENERATOR AND ELECTRON BEAM APPLICATION DEVICE
- Publication number 20210035766
- Publication date Feb 4, 2021
- PHOTO ELECTRON SOUL INC.
- Tomohiro Nishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE INSPECTION DEVICE AND SAMPLE INSPECTION METHOD
- Publication number 20200080949
- Publication date Mar 12, 2020
- PHOTO ELECTRON SOUL INC.
- Tomohiro Nishitani
- H01 - BASIC ELECTRIC ELEMENTS