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Haruko AKUTSU

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  • Yokosuka Kanagawa, JP
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Patents Applicationslast 30 patents

  • Information Patent Application

    ELECTRON MICROSCOPE AND CRYSTAL EVALUATION METHOD
    • Publication number 20240319122
    • Publication date Sep 26, 2024
    • KIOXIA Corporation
    • Yuki OTSUKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20240321566
    • Publication date Sep 26, 2024
    • KIOXIA Corporation
    • Jun ASAKAWA
    • H01 - BASIC ELECTRIC ELEMENTS