Hassan Ihs

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Sacramento, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
On-chip jitter testing
- Patent number 7,409,621
- Issue date Aug 5, 2008
- Intel Corporation
- Hassan Ihs
- G01 - MEASURING TESTING
Information Patent Grant
Analog filter with built-in self test
- Patent number 6,777,921
- Issue date Aug 17, 2004
- Intel Corporation
- Salem Abdennadher
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
BIST method for testing cut-off frequency of low-pass filters
- Patent number 6,448,754
- Issue date Sep 10, 2002
- Intel Corporation
- Hassan Ihs
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
On-chip jitter testing
- Publication number 20040128591
- Publication date Jul 1, 2004
- Hassan Ihs
- G01 - MEASURING TESTING
Information Patent Application
Analog filter with built-in self test
- Publication number 20030141859
- Publication date Jul 31, 2003
- Salem Abdennadher
- H03 - BASIC ELECTRONIC CIRCUITRY