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Hassan Javaheri
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Richmond Hill, CA
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Patents Grants
last 30 patents
Information
Patent Grant
RF ion guide
Patent number
10,475,633
Issue date
Nov 12, 2019
DH Technologies Development Pte. Ltd.
Pablo Dominguez
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Vacuum DMS with high efficiency ion guides
Patent number
9,921,183
Issue date
Mar 20, 2018
DH Technologies Development Pte. Ltd.
Bradley B. Schneider
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Laser desorption ion source with ion guide coupling for ion mass sp...
Patent number
7,405,397
Issue date
Jul 29, 2008
MDS Sciex Inc.
Thomas R. Covey
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for improved sensitivity in a mass spectrometer
Patent number
7,259,371
Issue date
Aug 21, 2007
Applera Corporation
Bruce A. Collings
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for improved sensitivity in a mass spectrometer
Patent number
7,256,395
Issue date
Aug 14, 2007
Applera Corporation
Bruce A. Collings
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of and apparatus for ionizing an analyte and ion source prob...
Patent number
6,759,650
Issue date
Jul 6, 2004
MDS Inc.
Thomas R. Covey
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Pressure Control in Vacuum Chamber of Mass Spectrometer
Publication number
20240087870
Publication date
Mar 14, 2024
DH Technologies Development Pte. Ltd.
Leigh BEDFORD
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
THREE STAGE ATMOSPHERE TO VACUUM MASS SPECTROMETER INLET WITH ADDIT...
Publication number
20230118135
Publication date
Apr 20, 2023
DH Technologies Development Pte. Ltd.
Thomas BIESENTHAL
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
RF Ion Guide
Publication number
20170263429
Publication date
Sep 14, 2017
DH Technologies Development Pte. Ltd.
Pablo Dominguez
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Vacuum DMS with High Efficiency Ion Guides
Publication number
20160320342
Publication date
Nov 3, 2016
DH Technologies Development Pte. Ltd.
Bradley B. Schneider
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR IMPROVED SENSITIVITY IN A MASS SPECTROMETER
Publication number
20140374589
Publication date
Dec 25, 2014
DH Technologies Development Pte. Ltd.
Hassan Javaheri
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for improved sensitivity in a mass spectrometer
Publication number
20060169891
Publication date
Aug 3, 2006
Applera Corporation
Bruce A. Collings
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for improved sensitivity in a mass spectrometer
Publication number
20060151692
Publication date
Jul 13, 2006
Applera Corporation
Bruce A. Collings
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Laser desorption ion source with ion guide coupling for ion mass sp...
Publication number
20060124846
Publication date
Jun 15, 2006
MDS Sciex Inc.
Thomas R. Covey
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of and apparatus for ionizing an analyte and ion source prob...
Publication number
20040094706
Publication date
May 20, 2004
Thomas Covey
G01 - MEASURING TESTING
Information
Patent Application
Method of and apparatus for ionizing an analyte and ion source prob...
Publication number
20030189170
Publication date
Oct 9, 2003
Thomas R. Covey
H01 - BASIC ELECTRIC ELEMENTS