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Helmut Strecker
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Hamburg, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Angle-dependent X-ray diffraction imaging system and method of oper...
Patent number
9,188,551
Issue date
Nov 17, 2015
MORPHO DETCTION, LLC
Geoffrey Harding
G01 - MEASURING TESTING
Information
Patent Grant
System and method to account for cross-talk among coherent scatter...
Patent number
7,856,083
Issue date
Dec 21, 2010
Morpho Detection, Inc.
Geoffrey Harding
G01 - MEASURING TESTING
Information
Patent Grant
X-ray diffraction device, object imaging system, and method for ope...
Patent number
7,813,477
Issue date
Oct 12, 2010
Morpho Detection, Inc.
Geoffrey Harding
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Methods of examining an item of luggage by means of an x-ray diffra...
Patent number
7,792,248
Issue date
Sep 7, 2010
Morpho Detection, Inc.
Helmut Strecker
G01 - MEASURING TESTING
Information
Patent Grant
Primary collimator and systems for x-ray diffraction imaging, and m...
Patent number
7,787,591
Issue date
Aug 31, 2010
Morpho Detection, Inc.
Geoffrey Harding
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray source and detector configuration for a non-translational x-r...
Patent number
7,742,563
Issue date
Jun 22, 2010
Morpho Detection, Inc.
Peter Michael Edic
G01 - MEASURING TESTING
Information
Patent Grant
Method for inspecting luggage
Patent number
7,660,457
Issue date
Feb 9, 2010
Morpho Detection, Inc.
Armin Uwe Schmiegel
G01 - MEASURING TESTING
Information
Patent Grant
Secondary collimator for an X-ray scattering device and X-ray scatt...
Patent number
7,463,721
Issue date
Dec 9, 2008
GE Homeland Protection Inc.
Geoffrey Harding
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method for determining the change in position of an item of luggage...
Patent number
7,406,192
Issue date
Jul 29, 2008
GE Homeland Protection, Inc.
Armin Schmiegel
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for examination by scattered radiation
Patent number
4,480,332
Issue date
Oct 30, 1984
U.S. Philips Corporation
Helmut Strecker
G01 - MEASURING TESTING
Information
Patent Grant
X-Ray examination device having a high local resolution
Patent number
4,466,113
Issue date
Aug 14, 1984
U.S. Philips Corporation
Helmut Strecker
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Patents Applications
last 30 patents
Information
Patent Application
ANGLE-DEPENDENT X-RAY DIFFRACTION IMAGING SYSTEM AND METHOD OF OPER...
Publication number
20150085983
Publication date
Mar 26, 2015
MORPHO DETECTION, INC.
Geoffrey Harding
G01 - MEASURING TESTING
Information
Patent Application
OBJECT IMAGING SYSTEM AND X-RAY DIFFRACTION IMAGING DEVICE FOR A SE...
Publication number
20120177182
Publication date
Jul 12, 2012
Stephan Olesinski
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLE PLANE MULTI-INVERSE FAN-BEAM DETECTION SYSTEMS AND METHOD...
Publication number
20110188632
Publication date
Aug 4, 2011
Geoffrey Harding
G01 - MEASURING TESTING
Information
Patent Application
IN-LINE HIGH-THROUGHPUT CONTRABAND DETECTION SYSTEM
Publication number
20100277312
Publication date
Nov 4, 2010
Peter Michael Edic
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DIFFRACTION DEVICE, OBJECT IMAGING SYSTEM, AND METHOD FOR OPE...
Publication number
20100226478
Publication date
Sep 9, 2010
Geoffrey Harding
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
PRIMARY COLLIMATOR AND SYSTEMS FOR X-RAY DIFFRACTION IMAGING, AND M...
Publication number
20100135462
Publication date
Jun 3, 2010
Geoffrey Harding
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD TO ACCOUNT FOR CROSS-TALK AMONG COHERENT SCATTER...
Publication number
20100111253
Publication date
May 6, 2010
Geoffrey Harding
G01 - MEASURING TESTING
Information
Patent Application
X-RAY SOURCE AND DETECTOR CONFIGURATION FOR A NON-TRANSLATIONAL X-R...
Publication number
20100061512
Publication date
Mar 11, 2010
Peter Michael Edic
G01 - MEASURING TESTING
Information
Patent Application
Methods of Examining an Item of Luggage by Means of an X-Ray Diffra...
Publication number
20090016487
Publication date
Jan 15, 2009
Helmut Strecker
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR INSPECTING LUGGAGE
Publication number
20080310589
Publication date
Dec 18, 2008
Armin Uwe SCHMIEGEL
G01 - MEASURING TESTING
Information
Patent Application
Secondary collimator for an X-ray scattering device and X-ray scatt...
Publication number
20050281383
Publication date
Dec 22, 2005
YXLON International Security Gmbh
Geoffrey Harding
G01 - MEASURING TESTING
Information
Patent Application
Method for determining the change in position of an item of luggage...
Publication number
20050123217
Publication date
Jun 9, 2005
YXLON International Security GmbH, Incorporation
Armin Schmiegel
G01 - MEASURING TESTING