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Heng-Sheng Hsiao
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Taipei City, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Position sensing mechanism
Patent number
11,543,267
Issue date
Jan 3, 2023
Hiwin Mikrosystem Corp.
Chih-Huang Lai
G01 - MEASURING TESTING
Information
Patent Grant
Optical encoder with incremental and absolute code sensors and defi...
Patent number
10,921,163
Issue date
Feb 16, 2021
Hiwin Mikrosystem Corp.
Heng-Sheng Hsiao
G01 - MEASURING TESTING
Information
Patent Grant
Linear position detecting device
Patent number
10,816,362
Issue date
Oct 27, 2020
Hiwin Mikrosystem Corp.
Heng-Sheng Hsiao
G01 - MEASURING TESTING
Information
Patent Grant
Texture inducing structure for alloy films and texture inducing met...
Patent number
10,580,558
Issue date
Mar 3, 2020
National Tsing Hua University
Chi-Ju Hsiao
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Absolute position readout apparatus
Patent number
10,480,963
Issue date
Nov 19, 2019
Hiwin Mikrosystem Corp.
Heng-Sheng Hsiao
G01 - MEASURING TESTING
Information
Patent Grant
Absolute position detecting device and method
Patent number
10,145,709
Issue date
Dec 4, 2018
National Tsing Hua University
Cheng-Yi Lin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
POSITION SENSING MECHANISM
Publication number
20220214192
Publication date
Jul 7, 2022
HIWIN MIKROSYSTEM CORP.
Chih-Huang LAI
G01 - MEASURING TESTING
Information
Patent Application
POSITION DETECTING DEVICE FOR ROTARY SHAFT
Publication number
20200158541
Publication date
May 21, 2020
HIWIN MIKROSYSTEM CORP.
Heng-Sheng HSIAO
G01 - MEASURING TESTING
Information
Patent Application
LINEAR POSITION DETECTING DEVICE
Publication number
20200158537
Publication date
May 21, 2020
HIWIN MIKROSYSTEM CORP.
Heng-Sheng HSIAO
G01 - MEASURING TESTING
Information
Patent Application
TORSION DETECTING DEVICE FOR ROTARY SHIFT
Publication number
20200158488
Publication date
May 21, 2020
HIWIN MIKROSYSTEM CORP.
Heng-Sheng HSIAO
G01 - MEASURING TESTING
Information
Patent Application
Encoder With Toothed Structure and Apparatus Having the Same
Publication number
20200149926
Publication date
May 14, 2020
Hiwin Mikrosystem Corp.
Heng-Sheng Hsiao
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Encoder and Apparatus Having the Same
Publication number
20200141761
Publication date
May 7, 2020
Hiwin Mikrosystem Corp.
Heng-Sheng Hsiao
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Encoder and Apparatus Having the Same
Publication number
20200141765
Publication date
May 7, 2020
Hiwin Mikrosystem Corp.
Shuo-Wu Shih
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL POSITIONING MEASUREMENT DEVICE
Publication number
20200041312
Publication date
Feb 6, 2020
Hiwin Mikrosystem Corp.
Heng-Sheng HSIAO
G01 - MEASURING TESTING
Information
Patent Application
ABSOLUTE POSITION READOUT APPARATUS
Publication number
20180364068
Publication date
Dec 20, 2018
Hiwin Mikrosystem Corp.
HENG-SHENG HSIAO
G01 - MEASURING TESTING
Information
Patent Application
TEXTURE INDUCING STRUCTURE FOR ALLOY FILMS AND TEXTURE INDUCING MET...
Publication number
20180358159
Publication date
Dec 13, 2018
National Tsing Hua University
Chi-Ju HSIAO
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ABSOLUTE POSITION DETECTING DEVICE AND METHOD
Publication number
20170254670
Publication date
Sep 7, 2017
National Tsing Hua University
Cheng-Yi Lin
G01 - MEASURING TESTING