Hideaki Doi

Person

Oota-ku, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern inspecting method and apparatus thereof, and pattern inspec...
- Patent number 7,263,216
- Issue date Aug 28, 2007
- Hitachi, Ltd.
- Chie Shishido
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system for circuit patterns and a method thereof
- Patent number 6,831,998
- Issue date Dec 14, 2004
- Hitachi, Ltd.
- Hiroya Koshishiba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device producing method, system for carrying out the...
- Patent number 6,650,409
- Issue date Nov 18, 2003
- Hitachi, Ltd.
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method monitoring a quality of electronic circuits and its manufact...
- Patent number 6,622,054
- Issue date Sep 16, 2003
- Hitachi, Ltd.
- Hirohito Okuda
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Pattern inspecting method and apparatus thereof, and pattern inspec...
- Patent number 6,614,923
- Issue date Sep 2, 2003
- Hitachi, Ltd.
- Chie Shishido
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for manufacturing semiconductor devices, and meth...
- Patent number 6,546,308
- Issue date Apr 8, 2003
- Hitachi, Ltd,
- Yuji Takagi
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for manufacturing semiconductor devices, and meth...
- Patent number 6,438,438
- Issue date Aug 20, 2002
- Hitachi, Ltd.
- Yuji Takagi
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a pattern on a substrate
- Patent number 6,376,854
- Issue date Apr 23, 2002
- Hitachi, Ltd.
- Chie Shishido
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional imaging system, game device, method for same and...
- Patent number 6,278,418
- Issue date Aug 21, 2001
- Kabushiki Kaisha Sega Enterprises
- Hideaki Doi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method of inspecting pattern and apparatus thereof with a different...
- Patent number 6,236,057
- Issue date May 22, 2001
- Hitachi, Ltd.
- Chie Shishido
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting pattern and apparatus thereof
- Patent number 6,087,673
- Issue date Jul 11, 2000
- Hitachi, Ltd.
- Chie Shishido
- G01 - MEASURING TESTING
Information Patent Grant
Method and device of inspecting three-dimensional shape defect
- Patent number 6,072,899
- Issue date Jun 6, 2000
- Hitachi, Ltd.
- Yoko Irie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wiring pattern inspecting method and system for carrying out the same
- Patent number 5,930,382
- Issue date Jul 27, 1999
- Hitachi, Ltd.
- Yoko Irie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for manufacturing semiconductor devices, and meth...
- Patent number 5,801,965
- Issue date Sep 1, 1998
- Hitachi, Ltd.
- Yuji Takagi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection method and apparatus, prepreg inspecting method, a...
- Patent number 5,754,621
- Issue date May 19, 1998
- Hitachi, Ltd.
- Yoko Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting a circuit pattern
- Patent number 5,331,407
- Issue date Jul 19, 1994
- Hitachi, Ltd.
- Hideaki Doi
- G01 - MEASURING TESTING
Information Patent Grant
Pattern test apparatus
- Patent number 4,962,541
- Issue date Oct 9, 1990
- Hitachi, Ltd.
- Hideaki Doi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection system
- Patent number 4,908,871
- Issue date Mar 13, 1990
- Hitachi, Ltd.
- Yasuhiko Hara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern checking apparatus
- Patent number 4,628,531
- Issue date Dec 9, 1986
- Hitachi, Ltd.
- Keiichi Okamoto
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method of inspecting pattern and apparatus thereof
- Publication number 20010030300
- Publication date Oct 18, 2001
- Chie Shishido
- G01 - MEASURING TESTING
Information Patent Application
Method and system for manufacturing semiconductor devices, and meth...
- Publication number 20010020194
- Publication date Sep 6, 2001
- Hitachi, Ltd.
- Yuji Takagi
- G01 - MEASURING TESTING

Hideaki Doi

Person

Patents Grantslast 30 patents

Pattern inspecting method and apparatus thereof, and pattern inspec...

Inspection system for circuit patterns and a method thereof

Semiconductor device producing method, system for carrying out the...

Method monitoring a quality of electronic circuits and its manufact...

Pattern inspecting method and apparatus thereof, and pattern inspec...

Method and system for manufacturing semiconductor devices, and meth...

Method and system for manufacturing semiconductor devices, and meth...

Method of inspecting a pattern on a substrate

Three-dimensional imaging system, game device, method for same and...

Method of inspecting pattern and apparatus thereof with a different...

Method of inspecting pattern and apparatus thereof

Method and device of inspecting three-dimensional shape defect

Wiring pattern inspecting method and system for carrying out the same

Method and system for manufacturing semiconductor devices, and meth...

X-ray inspection method and apparatus, prepreg inspecting method, a...

Method and apparatus for detecting a circuit pattern

Pattern test apparatus

Pattern inspection system

Pattern checking apparatus

Patents Applicationslast 30 patents

Method of inspecting pattern and apparatus thereof

Method and system for manufacturing semiconductor devices, and meth...