Hideaki Ogawa

Person

  • Kyoto, JP

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    MPU PROTECTION DEVICE

    • Publication number 20180285601
    • Publication date Oct 4, 2018
    • DNP HYPERTECH CO., LTD.
    • Hideaki OGAWA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    ENCODING DEVICE

    • Publication number 20170352296
    • Publication date Dec 7, 2017
    • DNP HYPERTECH CO., LTD.
    • Hideaki OGAWA
    • G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
  • Information Patent Application

    MODULE ENCRYPTION/DECRYPTION PROGRAM

    • Publication number 20150006909
    • Publication date Jan 1, 2015
    • HYPERTECH CO., LTD. c/o ASTEM, Kyoto Research Park
    • Hideaki Ogawa
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Image recording apparatus

    • Publication number 20070229646
    • Publication date Oct 4, 2007
    • Dainippon Screen Mfg. Co., Ltd.
    • Hideaki Ogawa
    • B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
  • Information Patent Application

    Apparatus for and method of recording image

    • Publication number 20070224527
    • Publication date Sep 27, 2007
    • Dainippon Screen Mfg. Co., Ltd.
    • Hideaki Ogawa
    • B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
  • Information Patent Application

    Platemaking apparatus

    • Publication number 20060203861
    • Publication date Sep 14, 2006
    • Dainippon Screen Mfg. Co., Ltd.
    • Hideaki Ogawa
    • B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
  • Information Patent Application

    Platemaking method and platemaking apparatus

    • Publication number 20060065147
    • Publication date Mar 30, 2006
    • Dainippon Screen Mfg. Co., Ltd.
    • Hideaki Ogawa
    • B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
  • Information Patent Application

    DISPLAY CONTROL WITH MOVABLE OR UPDATABLE AUXILIARY INFORMATION

    • Publication number 20020180802
    • Publication date Dec 5, 2002
    • HIDEAKI OGAWA
    • G01 - MEASURING TESTING