Hidefumi TAKAMINE

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Adhesion/peeling method, and adhesion/peeling device
- Patent number 12,116,513
- Issue date Oct 15, 2024
- Kabushiki Kaisha Toshiba
- Takashi Usui
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Structure evaluation system, structure evaluation apparatus, and st...
- Patent number 12,104,986
- Issue date Oct 1, 2024
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system and structure evaluation method
- Patent number 12,098,976
- Issue date Sep 24, 2024
- Kabushiki Kaisha Toshiba
- Yousuke Hisakuni
- G01 - MEASURING TESTING
Information Patent Grant
State evaluation system, state evaluation apparatus, and state eval...
- Patent number 12,001,195
- Issue date Jun 4, 2024
- Kabushiki Kaisha Toshiba
- Yoshinori Mori
- G05 - CONTROLLING REGULATING
Information Patent Grant
Structure evaluation method and structure evaluation system
- Patent number 11,754,530
- Issue date Sep 12, 2023
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- G01 - MEASURING TESTING
Information Patent Grant
Detection device, detection system, and detection method
- Patent number 11,668,681
- Issue date Jun 6, 2023
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system and structure evaluation method
- Patent number 11,639,880
- Issue date May 2, 2023
- Kabushiki Kaisha Toshiba
- Tomoki Shiotani
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system and structure evaluation method
- Patent number 11,181,439
- Issue date Nov 23, 2021
- Kabushiki Kaisha Toshiba
- Tomoki Shiotani
- G01 - MEASURING TESTING
Information Patent Grant
Detection device, detection system, and detection method
- Patent number 10,955,383
- Issue date Mar 23, 2021
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system and structure evaluation method
- Patent number 10,883,919
- Issue date Jan 5, 2021
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation apparatus, structure evaluation system, and st...
- Patent number 10,794,990
- Issue date Oct 6, 2020
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- G01 - MEASURING TESTING
Information Patent Grant
Sensor adhesion state determination system, sensor adhesion state d...
- Patent number 10,712,318
- Issue date Jul 14, 2020
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Structure evaluation system, structure evaluation apparatus, and st...
- Patent number 10,648,949
- Issue date May 12, 2020
- Kabushiki Kaisha Toshiba
- Kazuo Watabe
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system, structure evaluation apparatus, and st...
- Patent number 10,613,060
- Issue date Apr 7, 2020
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system, structure evaluation apparatus, and st...
- Patent number 10,371,666
- Issue date Aug 6, 2019
- Kabushiki Kaisha Toshiba
- Kazuo Watabe
- G01 - MEASURING TESTING
Information Patent Grant
Detection device, detection system, and detection method
- Patent number 10,365,250
- Issue date Jul 30, 2019
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system, structure evaluation apparatus, and st...
- Patent number 10,345,275
- Issue date Jul 9, 2019
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system, structure evaluation apparatus, and st...
- Patent number 10,330,646
- Issue date Jun 25, 2019
- Kabushiki Kaisha Toshiba
- Kazuo Watabe
- G01 - MEASURING TESTING
Information Patent Grant
Detection system, signal processing device, detection method, and c...
- Patent number 10,234,430
- Issue date Mar 19, 2019
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- G01 - MEASURING TESTING
Information Patent Grant
Detection system and detection method
- Patent number 9,921,188
- Issue date Mar 20, 2018
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- E04 - BUILDING
Information Patent Grant
Image display apparatus
- Patent number 9,538,165
- Issue date Jan 3, 2017
- Kabushiki Kaisha Toshiba
- Shinichi Tatsuta
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical delay apparatus and optical coherence tomography apparatus
- Patent number 9,459,090
- Issue date Oct 4, 2016
- Kabushiki Kaisha Toshiba
- Hideaki Okano
- G01 - MEASURING TESTING
Information Patent Grant
Information recording medium, information reproducing apparatus, ma...
- Patent number 9,087,523
- Issue date Jul 21, 2015
- Kabushiki Kaisha Toshiba
- Akihito Ogawa
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD
- Publication number 20240319038
- Publication date Sep 26, 2024
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, STRUCT...
- Publication number 20240094166
- Publication date Mar 21, 2024
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
SENSOR MODULE, SENSOR MODULE INSTALLATION DEVICE, AND MOUNTING METH...
- Publication number 20230324345
- Publication date Oct 12, 2023
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
SENSOR ATTACHMENT/DETACHMENT DEVICE, SENSOR ATTACHMENT/DETACHMENT S...
- Publication number 20230302542
- Publication date Sep 28, 2023
- Kabushiki Kaisha Toshiba
- Kazuo WATABE
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ADHESION/PEELING METHOD, AND ADHESION/PEELING DEVICE
- Publication number 20230295474
- Publication date Sep 21, 2023
- Kabushiki Kaisha Toshiba
- Takashi USUI
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD
- Publication number 20230194382
- Publication date Jun 22, 2023
- Kabushiki Kaisha Toshiba
- Yousuke HISAKUNI
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20230083554
- Publication date Mar 16, 2023
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20220187253
- Publication date Jun 16, 2022
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
VEHICLE INFORMATION ESTIMATION SYSTEM, VEHICLE INFORMATION ESTIMATI...
- Publication number 20220130240
- Publication date Apr 28, 2022
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION METHOD AND STRUCTURE EVALUATION SYSTEM
- Publication number 20220082528
- Publication date Mar 17, 2022
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD
- Publication number 20220034749
- Publication date Feb 3, 2022
- Kabushiki Kaisha Toshiba
- Tomoki Shiotani
- G01 - MEASURING TESTING
Information Patent Application
STATE EVALUATION SYSTEM, STATE EVALUATION APPARATUS, AND STATE EVAL...
- Publication number 20210397161
- Publication date Dec 23, 2021
- Kabushiki Kaisha Toshiba
- Yoshinori MORI
- G05 - CONTROLLING REGULATING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20210396715
- Publication date Dec 23, 2021
- Kabushiki Kaisha Toshiba
- Yuki UEDA
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE, DETECTION SYSTEM, AND DETECTION METHOD
- Publication number 20210181156
- Publication date Jun 17, 2021
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20210181157
- Publication date Jun 17, 2021
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD
- Publication number 20190383696
- Publication date Dec 19, 2019
- KABUSHIKI KAISHA TOSHIBA
- Tomoki Shiotani
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20190317051
- Publication date Oct 17, 2019
- Kabushiki Kaisha Toshiba
- Kazuo WATABE
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD
- Publication number 20180372580
- Publication date Dec 27, 2018
- KABUSHIKI KAISHA TOSHIBA
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
SENSOR ADHESION STATE DETERMINATION SYSTEM, SENSOR ADHESION STATE D...
- Publication number 20180266998
- Publication date Sep 20, 2018
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
Structure Evaluation System, Structure Evaluation Apparatus, and St...
- Publication number 20170363586
- Publication date Dec 21, 2017
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20170363587
- Publication date Dec 21, 2017
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
Structure Evaluation System, Structure Evaluation Apparatus, and St...
- Publication number 20170336364
- Publication date Nov 23, 2017
- Kabushiki Kaisha Toshiba
- Kazuo WATABE
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20170336365
- Publication date Nov 23, 2017
- Kabushiki Kaisha Toshiba
- Kazuo WATABE
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION APPARATUS, STRUCTURE EVALUATION SYSTEM, AND ST...
- Publication number 20170269204
- Publication date Sep 21, 2017
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE, DETECTION SYSTEM, AND DETECTION METHOD
- Publication number 20170138910
- Publication date May 18, 2017
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM, SIGNAL PROCESSING DEVICE, DETECTION METHOD, AND C...
- Publication number 20170074833
- Publication date Mar 16, 2017
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
IMAGE DISPLAY DEVICE
- Publication number 20160223826
- Publication date Aug 4, 2016
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G02 - OPTICS
Information Patent Application
DETECTION SYSTEM AND DETECTION METHOD
- Publication number 20160084803
- Publication date Mar 24, 2016
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DELAY APPARATUS AND OPTICAL COHERENCE TOMOGRAPHY APPARATUS
- Publication number 20160003606
- Publication date Jan 7, 2016
- Kabushiki Kaisha Toshiba
- Hideaki OKANO
- G02 - OPTICS
Information Patent Application
IMAGE DISPLAY APPARATUS
- Publication number 20150092268
- Publication date Apr 2, 2015
- KABUSHIKI KAISHA TOSHIBA
- Hiroshi HASEGAWA
- G02 - OPTICS

Hidefumi TAKAMINE

Person

Patents Grantslast 30 patents

Adhesion/peeling method, and adhesion/peeling device

Structure evaluation system, structure evaluation apparatus, and st...

Structure evaluation system and structure evaluation method

State evaluation system, state evaluation apparatus, and state eval...

Structure evaluation method and structure evaluation system

Detection device, detection system, and detection method

Structure evaluation system and structure evaluation method

Structure evaluation system and structure evaluation method

Detection device, detection system, and detection method

Structure evaluation system and structure evaluation method

Structure evaluation apparatus, structure evaluation system, and st...

Sensor adhesion state determination system, sensor adhesion state d...

Structure evaluation system, structure evaluation apparatus, and st...

Structure evaluation system, structure evaluation apparatus, and st...

Structure evaluation system, structure evaluation apparatus, and st...

Detection device, detection system, and detection method

Structure evaluation system, structure evaluation apparatus, and st...

Structure evaluation system, structure evaluation apparatus, and st...

Detection system, signal processing device, detection method, and c...

Detection system and detection method

Image display apparatus

Optical delay apparatus and optical coherence tomography apparatus

Information recording medium, information reproducing apparatus, ma...

Patents Applicationslast 30 patents

STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, STRUCT...

SENSOR MODULE, SENSOR MODULE INSTALLATION DEVICE, AND MOUNTING METH...

SENSOR ATTACHMENT/DETACHMENT DEVICE, SENSOR ATTACHMENT/DETACHMENT S...

ADHESION/PEELING METHOD, AND ADHESION/PEELING DEVICE

STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

VEHICLE INFORMATION ESTIMATION SYSTEM, VEHICLE INFORMATION ESTIMATI...

STRUCTURE EVALUATION METHOD AND STRUCTURE EVALUATION SYSTEM

STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD

STATE EVALUATION SYSTEM, STATE EVALUATION APPARATUS, AND STATE EVAL...

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

DETECTION DEVICE, DETECTION SYSTEM, AND DETECTION METHOD

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD

SENSOR ADHESION STATE DETERMINATION SYSTEM, SENSOR ADHESION STATE D...

Structure Evaluation System, Structure Evaluation Apparatus, and St...

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

Structure Evaluation System, Structure Evaluation Apparatus, and St...

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

STRUCTURE EVALUATION APPARATUS, STRUCTURE EVALUATION SYSTEM, AND ST...

DETECTION DEVICE, DETECTION SYSTEM, AND DETECTION METHOD

DETECTION SYSTEM, SIGNAL PROCESSING DEVICE, DETECTION METHOD, AND C...

IMAGE DISPLAY DEVICE

DETECTION SYSTEM AND DETECTION METHOD

OPTICAL DELAY APPARATUS AND OPTICAL COHERENCE TOMOGRAPHY APPARATUS

IMAGE DISPLAY APPARATUS