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Hidekazu Okuhira
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Asaka, JP
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last 30 patents
Information
Patent Grant
Defect observing electron microscope
Patent number
5,744,800
Issue date
Apr 28, 1998
Hitachi, Ltd.
Hiroshi Kakibayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dry etching method
Patent number
5,401,357
Issue date
Mar 28, 1995
Hitachi, Ltd.
Hidekazu Okuhira
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method of producing the same
Patent number
5,373,191
Issue date
Dec 13, 1994
Hitachi Ltd.
Toshiyuki Usagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method of producing the same
Patent number
5,181,087
Issue date
Jan 19, 1993
Hitachi, Ltd.
Toshiyuki Usagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Equipment for manufacturing semiconductor devices
Patent number
4,936,252
Issue date
Jun 26, 1990
Hitachi, Ltd.
Yusuke Yajima
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method of forming twin doped regions of the same depth by high ener...
Patent number
4,729,964
Issue date
Mar 8, 1988
Hitachi, Ltd.
Nobuyoshi Natsuaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Manufacturing apparatus for semiconductor devices
Patent number
4,693,779
Issue date
Sep 15, 1987
Hitachi, Ltd.
Hidekazu Okuhira
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...