Hideki Kikuchi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron microscope
- Patent number 11,164,717
- Issue date Nov 2, 2021
- HITACHI HIGH-TECH CORPORATION
- Hideki Kikuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device for moving an aperture having pluralit...
- Patent number 10,636,621
- Issue date Apr 28, 2020
- Hitachi High-Technologies Corporation
- Akinari Hanawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,192,713
- Issue date Jan 29, 2019
- Hitachi High-Technologies Corporation
- Kiyoshi Yabata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric charged particle beam microscope and electric charged part...
- Patent number 8,993,961
- Issue date Mar 31, 2015
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam microscope, sample holder for charged particl...
- Patent number 8,963,102
- Issue date Feb 24, 2015
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged corpuscular ray apparatus
- Patent number 8,928,485
- Issue date Jan 6, 2015
- Hitachi High-Technologies Corporation
- Hideki Kikuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric charged particle beam microscope and microscopy
- Patent number 7,863,564
- Issue date Jan 4, 2011
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Printed-circuit board, coaxial cable, and electronic device
- Patent number 6,717,494
- Issue date Apr 6, 2004
- NEC Toppan Circuit Solutions, Inc.
- Hideo Kikuchi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
Electron Microscope
- Publication number 20210066024
- Publication date Mar 4, 2021
- Hitachi High-Tech Corporation
- Hideki KIKUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20200357601
- Publication date Nov 12, 2020
- Hirohisa ENOMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20180269027
- Publication date Sep 20, 2018
- Hitachi High-Technologies Corporation
- Kiyoshi YABATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Observation Method
- Publication number 20180076004
- Publication date Mar 15, 2018
- Hitachi High-Technologies Corporation
- Akinari HANAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Sample Movement Device
- Publication number 20150243472
- Publication date Aug 27, 2015
- Hitachi High-Technologies Corporation
- Hideki Kikuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOUNDPROOF COVER FOR CHARGED-PARTICLE BEAM DEVICE, AND CHARGED-PART...
- Publication number 20150041676
- Publication date Feb 12, 2015
- Hitachi High-Technologies Corporation
- Daisuke Muto
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Application
CHARGED PARTICLE BEAM MICROSCOPE, SAMPLE HOLDER FOR CHARGED PARTICL...
- Publication number 20140353500
- Publication date Dec 4, 2014
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM MICROSCOPE AND METHOD OF MEASUREMENT EMPLOYIN...
- Publication number 20120287258
- Publication date Nov 15, 2012
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM MICROSCOPE AND MEASURING METHOD USING SAME
- Publication number 20120104253
- Publication date May 3, 2012
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED CORPUSCULAR RAY APPARATUS
- Publication number 20110115637
- Publication date May 19, 2011
- Hideki Kikuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRIC CHARGED PARTICLE BEAM MICROSCOPE AND MICROSCOPY
- Publication number 20090127474
- Publication date May 21, 2009
- Ruriko TSUNETA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Printed-circuit board, coaxial cable, and electronic device
- Publication number 20030021097
- Publication date Jan 30, 2003
- Hideo Kikuchi
- H01 - BASIC ELECTRIC ELEMENTS

Hideki Kikuchi

Person

Patents Grantslast 30 patents

Electron microscope

Charged particle beam device for moving an aperture having pluralit...

Charged particle beam device

Electric charged particle beam microscope and electric charged part...

Charged particle beam microscope, sample holder for charged particl...

Charged corpuscular ray apparatus

Electric charged particle beam microscope and microscopy

Printed-circuit board, coaxial cable, and electronic device

Patents Applicationslast 30 patents

Electron Microscope

CHARGED PARTICLE BEAM DEVICE

Charged Particle Beam Device

Charged Particle Beam Device and Sample Observation Method

Electron Microscope and Sample Movement Device

SOUNDPROOF COVER FOR CHARGED-PARTICLE BEAM DEVICE, AND CHARGED-PART...

CHARGED PARTICLE BEAM MICROSCOPE, SAMPLE HOLDER FOR CHARGED PARTICL...

CHARGED PARTICLE BEAM MICROSCOPE AND METHOD OF MEASUREMENT EMPLOYIN...

CHARGED PARTICLE BEAM MICROSCOPE AND MEASURING METHOD USING SAME

CHARGED CORPUSCULAR RAY APPARATUS

ELECTRIC CHARGED PARTICLE BEAM MICROSCOPE AND MICROSCOPY

Printed-circuit board, coaxial cable, and electronic device