Hideki Tojima

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Nagoya-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electric current measurement method
- Patent number 9,110,119
- Issue date Aug 18, 2015
- Toyota Jidosha Kabushiki Kaisha
- Satoru Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor module
- Patent number 8,604,608
- Issue date Dec 10, 2013
- Toyota Jidosha Kabushiki Kaisha
- Jiro Tsuchiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stencil masks, method of manufacturing stencil masks, and method of...
- Patent number 7,824,825
- Issue date Nov 2, 2010
- Toyota Jidosha Kabushiki Kaisha
- Tsuyoshi Nishiwaki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor apparatus
- Patent number 7,538,407
- Issue date May 26, 2009
- Toyota Jidosha Kabushiki Kaisha
- Masato Taki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRIC CURRENT MEASUREMENT METHOD
- Publication number 20130278252
- Publication date Oct 24, 2013
- Swiss Federal Institute of Technology Zurich
- Satoru SASAKI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MODULE
- Publication number 20130009168
- Publication date Jan 10, 2013
- Toyota Jidosha Kabushiki Kaisha
- Jiro TSUCHIYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor substrate, production method thereof and semiconducto...
- Publication number 20070202661
- Publication date Aug 30, 2007
- Toyota Jidosha Kabushiki Kaisha
- Hiromichi Kinpara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor apparatus
- Publication number 20070085595
- Publication date Apr 19, 2007
- Masato Taki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Stencil masks, method of manufacturing stencil masks, and method of...
- Publication number 20070077501
- Publication date Apr 5, 2007
- Toyota Jidosha Kabushiki Kaisha
- Tsuyoshi Nishiwaki
- B82 - NANO-TECHNOLOGY