Hidenari Takaoka

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Kobe, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample analyzer and its components
- Patent number 7,988,914
- Issue date Aug 2, 2011
- SYSMEX CORPORATION
- Toshikatsu Fukuju
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and its components
- Patent number 7,919,044
- Issue date Apr 5, 2011
- Sysmex Corporation
- Toshikatsu Fukuju
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and its components
- Patent number 7,427,376
- Issue date Sep 23, 2008
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Specimen-container transfer apparatus
- Patent number 6,255,614
- Issue date Jul 3, 2001
- Sysmex Corporation
- Nobuyoshi Yamakawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALYZER
- Publication number 20100248346
- Publication date Sep 30, 2010
- SYSMEX CORPORATION
- Shuhei KANEKO
- G01 - MEASURING TESTING
Information Patent Application
Sample Analyzer and Its Components
- Publication number 20080219886
- Publication date Sep 11, 2008
- Toshikatsu Fukuju
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SAMPLE ANALYZER AND ITS COMPONENTS
- Publication number 20080063568
- Publication date Mar 13, 2008
- Toshikatsu Fukuju
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Sample analyzer and its components
- Publication number 20040105784
- Publication date Jun 3, 2004
- Toshikatsu Fukuju
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL