Hidenori Kato

Person

Kobe, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Light deflector, distance measuring device, projection device, and...
- Patent number 12,135,416
- Issue date Nov 5, 2024
- Ricoh Company, Ltd.
- Tetsumaru Fujita
- G02 - OPTICS
Information Patent Grant
Movable diffraction element and spectroscope
- Patent number 11,187,890
- Issue date Nov 30, 2021
- Ricoh Company, Ltd.
- Masayuki Fujishima
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer, analysis equipment, and wavelength-variable light source
- Patent number 11,060,909
- Issue date Jul 13, 2021
- Ricoh Company, Ltd.
- Hidetaka Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
MEMS device
- Patent number 10,544,032
- Issue date Jan 28, 2020
- Ricoh Company, Ltd.
- Masayuki Fujishima
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Frame, spectroscope, spectrometry unit, and image forming apparatus
- Patent number 10,444,073
- Issue date Oct 15, 2019
- Ricoh Company, Ltd.
- Hidetaka Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum measuring device, spectroscopic device, and spectroscopic...
- Patent number 10,119,862
- Issue date Nov 6, 2018
- Ricoh Company, Ltd.
- Shuichi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Spectral measurement device and analysis apparatus
- Patent number 9,903,758
- Issue date Feb 27, 2018
- Ricoh Company, Ltd.
- Junichi Azumi
- G01 - MEASURING TESTING
Information Patent Grant
Sensor, method of manufacturing the sensor, and image forming appar...
- Patent number 9,638,585
- Issue date May 2, 2017
- Ricoh Company, Ltd.
- Hidenori Kato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LIGHT DEFLECTOR, DISTANCE MEASURING DEVICE, PROJECTION DEVICE, AND...
- Publication number 20210396994
- Publication date Dec 23, 2021
- RICOH COMPANY, LTD.
- Tetsumaru Fujita
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER, ANALYSIS EQUIPMENT, AND WAVELENGTH-VARIABLE LIGHT SOURCE
- Publication number 20200088572
- Publication date Mar 19, 2020
- Hidetaka Noguchi
- G01 - MEASURING TESTING
Information Patent Application
MOVABLE DIFFRACTION ELEMENT AND SPECTROSCOPE
- Publication number 20180267293
- Publication date Sep 20, 2018
- Masayuki Fujishima
- G02 - OPTICS
Information Patent Application
SPECTRUM MEASURING DEVICE, SPECTROSCOPIC DEVICE, AND SPECTROSCOPIC...
- Publication number 20180252578
- Publication date Sep 6, 2018
- Shuichi Suzuki
- G01 - MEASURING TESTING
Information Patent Application
MEMS DEVICE
- Publication number 20180215608
- Publication date Aug 2, 2018
- Masayuki FUJISHIMA
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SPECTRAL MEASUREMENT DEVICE AND ANALYSIS APPARATUS
- Publication number 20170350759
- Publication date Dec 7, 2017
- RICOH COMPANY, LTD.
- Junichi AZUMI
- G01 - MEASURING TESTING

Hidenori Kato

Person

Patents Grantslast 30 patents

Light deflector, distance measuring device, projection device, and...

Movable diffraction element and spectroscope

Spectrometer, analysis equipment, and wavelength-variable light source

MEMS device

Frame, spectroscope, spectrometry unit, and image forming apparatus

Spectrum measuring device, spectroscopic device, and spectroscopic...

Spectral measurement device and analysis apparatus

Sensor, method of manufacturing the sensor, and image forming appar...

Patents Applicationslast 30 patents

LIGHT DEFLECTOR, DISTANCE MEASURING DEVICE, PROJECTION DEVICE, AND...

SPECTROMETER, ANALYSIS EQUIPMENT, AND WAVELENGTH-VARIABLE LIGHT SOURCE

MOVABLE DIFFRACTION ELEMENT AND SPECTROSCOPE

SPECTRUM MEASURING DEVICE, SPECTROSCOPIC DEVICE, AND SPECTROSCOPIC...

MEMS DEVICE

SPECTRAL MEASUREMENT DEVICE AND ANALYSIS APPARATUS