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Hideo Takeuchi
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Kazo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device
Patent number
7,700,972
Issue date
Apr 20, 2010
Mitsubishi Electric Corporation
Hideo Takeuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for evaluating semiconductor layers
Patent number
7,656,514
Issue date
Feb 2, 2010
Mitsubishi Electric Corporation
Hideo Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring surface carrier recombination ve...
Patent number
7,420,684
Issue date
Sep 2, 2008
Mitsubishi Denki Kabushiki Kaisha
Hideo Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
Optical measuring method for semiconductor multiple layer structure...
Patent number
7,038,768
Issue date
May 2, 2006
Mitsubishi Denki Kabushiki Kaisha
Hideo Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
Method for evaluating piezoelectric fields
Patent number
6,998,615
Issue date
Feb 14, 2006
Mitsubishi Denki Kabushiki Kaisha
Hideo Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
DC testing apparatus and semiconductor testing apparatus
Patent number
6,683,470
Issue date
Jan 27, 2004
Advantest Corp.
Hideo Takeuchi
G11 - INFORMATION STORAGE
Information
Patent Grant
Excess current detection and control circuit for power source in se...
Patent number
5,661,626
Issue date
Aug 26, 1997
Advantest Corporation
Hideo Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
Paramagnetic oxygen analyzer
Patent number
4,860,574
Issue date
Aug 29, 1989
Yokogawa Electric Corporation
Masato Maeda
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20090218578
Publication date
Sep 3, 2009
Mitsubishi Electric Corporation
Hideo Takeuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for evaluating semiconductor layers
Publication number
20070026594
Publication date
Feb 1, 2007
Mitsubishi Electric Corporation
Hideo Takeuchi
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for measuring surface carrier recombination ve...
Publication number
20060094133
Publication date
May 4, 2006
Mitsubishi Denki Kabushiki Kaisha
Hideo Takeuchi
G01 - MEASURING TESTING
Information
Patent Application
Optical measuring method for semiconductor multiple layer structure...
Publication number
20050099623
Publication date
May 12, 2005
Mitsubishi Denki Kabushiki Kaisha
Hideo Takeuchi
G01 - MEASURING TESTING
Information
Patent Application
Method for evaluating piezoelectric fields
Publication number
20040155194
Publication date
Aug 12, 2004
Mitsubishi Denki Kabushiki Kaisha
Hideo Takeuchi
G01 - MEASURING TESTING
Information
Patent Application
Dc testing apparatus and semiconductor testing apparatus
Publication number
20020171448
Publication date
Nov 21, 2002
Hideo Takeuchi
G11 - INFORMATION STORAGE