Membership
Tour
Register
Log in
Hideya Esaki
Follow
Person
Toyonaka, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method of evaluating a semiconductor device and an apparatus for pe...
Patent number
5,006,717
Issue date
Apr 9, 1991
Matsushita Electric Industrial Co., Ltd.
Noriko Tsutsu
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor memory device having dummy cells of divided charge type
Patent number
4,700,329
Issue date
Oct 13, 1987
Matsushita Electric Industrial Co., Ltd.
Toshio Yamada
G11 - INFORMATION STORAGE