Hideyuki Aoki

Person

Takasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for testing a memory device in quasi-operating...
- Patent number 7,356,742
- Issue date Apr 8, 2008
- Renesas Technology Corp.
- Hideyuki Aoki
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing board for semiconductor memory, method of testing semicondu...
- Patent number 7,225,372
- Issue date May 29, 2007
- Renesas Technology Corp & Hitachi ULSI Systems Co., Ltd.
- Iwao Suzuki
- G11 - INFORMATION STORAGE
Information Patent Grant
Process for manufacturing semiconductor device
- Patent number 7,024,604
- Issue date Apr 4, 2006
- Renesas Technology Corporation
- Hideyuki Aoki
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of manufacturing a semiconductor device including defect ins...
- Patent number 7,018,857
- Issue date Mar 28, 2006
- Renesas Technology Corp.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a semiconductor device
- Patent number 6,955,870
- Issue date Oct 18, 2005
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for carrying out inspection of a semiconductor de...
- Patent number 6,952,110
- Issue date Oct 4, 2005
- Renesas Technology Corporation
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and test device for same
- Patent number 6,885,208
- Issue date Apr 26, 2005
- Renesas Technology Corp.
- Toshio Miyatake
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device testing apparatus and method for manufacturing...
- Patent number 6,828,810
- Issue date Dec 7, 2004
- Renesas Technology Corp.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Testing board for semiconductor memory, method of testing semicondu...
- Patent number 6,826,720
- Issue date Nov 30, 2004
- Renesas Technology, Corp.
- Iwao Suzuki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor-device inspecting apparatus and a method for manufact...
- Patent number 6,774,654
- Issue date Aug 10, 2004
- Renesas Technology Corp.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection apparatus
- Patent number 6,714,030
- Issue date Mar 30, 2004
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and a manufacturing method thereof
- Patent number 6,660,541
- Issue date Dec 9, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device manufacturing method
- Patent number 6,573,112
- Issue date Jun 3, 2003
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing substrate for inspecting semiconductor device
- Patent number 6,566,149
- Issue date May 20, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Manufacture method for semiconductor inspection apparatus
- Patent number 6,548,315
- Issue date Apr 15, 2003
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing semiconductor device utilizing semiconduct...
- Patent number 6,531,327
- Issue date Mar 11, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing equipment with probe formed on a cantilever o...
- Patent number 6,507,204
- Issue date Jan 14, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor-device inspecting apparatus and a method for manufact...
- Patent number 6,496,023
- Issue date Dec 17, 2002
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device manufacturing method
- Patent number 6,479,305
- Issue date Nov 12, 2002
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device, semiconductor memory syste...
- Patent number 6,414,530
- Issue date Jul 2, 2002
- Hitachi, Ltd.
- Hiromasa Noda
- G11 - INFORMATION STORAGE
Information Patent Grant
Manufacture method for semiconductor inspection apparatus
- Patent number 6,358,762
- Issue date Mar 19, 2002
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device, semiconductor memory syste...
- Patent number 6,222,406
- Issue date Apr 24, 2001
- Hitachi, Ltd.
- Hiromasa Noda
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for testing a memory device in quasi-operating...
- Publication number 20050193274
- Publication date Sep 1, 2005
- Hitachi, Ltd.
- Hideyuki Aoki
- G11 - INFORMATION STORAGE
Information Patent Application
Manufacturing method of semiconductor device
- Publication number 20050074910
- Publication date Apr 7, 2005
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
Testing board for semiconductor memory, method of testing semicondu...
- Publication number 20050044458
- Publication date Feb 24, 2005
- RENESAS TECHNOLOGY CORP.
- Iwao Suzuki
- G11 - INFORMATION STORAGE
Information Patent Application
Testing apparatus for carrying out inspection of a semiconductor de...
- Publication number 20050032252
- Publication date Feb 10, 2005
- Renesas Technology Corporation
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor inspection apparatus
- Publication number 20030189439
- Publication date Oct 9, 2003
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device testing apparatus and method for manufacturing...
- Publication number 20030122550
- Publication date Jul 3, 2003
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
Process for manufacturing semiconductor device
- Publication number 20030121584
- Publication date Jul 3, 2003
- Hitachi, Ltd.
- Hideyuki Aoki
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device and a manufacturing method thereof
- Publication number 20030113944
- Publication date Jun 19, 2003
- Hitachi, Ltd
- Masatoshi Kanamaru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing a semicondutor device
- Publication number 20030104641
- Publication date Jun 5, 2003
- Hitachi, Ltd
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR-DEVICE INSPECTING APPARATUS AND A METHOD FOR MANUFACT...
- Publication number 20030102880
- Publication date Jun 5, 2003
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and test device for same
- Publication number 20030047731
- Publication date Mar 13, 2003
- Toshio Miyatake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device manufacturing method
- Publication number 20030027365
- Publication date Feb 6, 2003
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Manufacture method for semiconductor inspection apparatus
- Publication number 20020086451
- Publication date Jul 4, 2002
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing semiconductor device utilizing semiconduct...
- Publication number 20020072136
- Publication date Jun 13, 2002
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURING METHOD
- Publication number 20020064893
- Publication date May 30, 2002
- RYUJI KONO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Testing board for semiconductor memory, method of testing semicondu...
- Publication number 20020066056
- Publication date May 30, 2002
- Iwao Suzuki
- G11 - INFORMATION STORAGE
Information Patent Application
Method of testing memory device, method of manufacturing memory dev...
- Publication number 20020046374
- Publication date Apr 18, 2002
- Hideyuki Aoki
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit device, semiconductor memory syste...
- Publication number 20010015666
- Publication date Aug 23, 2001
- Hiromasa Noda
- G11 - INFORMATION STORAGE

Hideyuki Aoki

Person

Patents Grantslast 30 patents

Method and apparatus for testing a memory device in quasi-operating...

Testing board for semiconductor memory, method of testing semicondu...

Process for manufacturing semiconductor device

Method of manufacturing a semiconductor device including defect ins...

Method of manufacturing a semiconductor device

Testing apparatus for carrying out inspection of a semiconductor de...

Semiconductor device and test device for same

Semiconductor device testing apparatus and method for manufacturing...

Testing board for semiconductor memory, method of testing semicondu...

Semiconductor-device inspecting apparatus and a method for manufact...

Semiconductor inspection apparatus

Semiconductor device and a manufacturing method thereof

Semiconductor device manufacturing method

Method for manufacturing substrate for inspecting semiconductor device

Manufacture method for semiconductor inspection apparatus

Method for manufacturing semiconductor device utilizing semiconduct...

Semiconductor testing equipment with probe formed on a cantilever o...

Semiconductor-device inspecting apparatus and a method for manufact...

Semiconductor device manufacturing method

Semiconductor integrated circuit device, semiconductor memory syste...

Manufacture method for semiconductor inspection apparatus

Semiconductor integrated circuit device, semiconductor memory syste...

Patents Applicationslast 30 patents

Method and apparatus for testing a memory device in quasi-operating...

Manufacturing method of semiconductor device

Testing board for semiconductor memory, method of testing semicondu...

Testing apparatus for carrying out inspection of a semiconductor de...

Semiconductor inspection apparatus

Semiconductor device testing apparatus and method for manufacturing...

Process for manufacturing semiconductor device

Semiconductor device and a manufacturing method thereof

Method of manufacturing a semicondutor device

SEMICONDUCTOR-DEVICE INSPECTING APPARATUS AND A METHOD FOR MANUFACT...

Semiconductor device and test device for same

Semiconductor device manufacturing method

Manufacture method for semiconductor inspection apparatus

Method for manufacturing semiconductor device utilizing semiconduct...

SEMICONDUCTOR DEVICE MANUFACTURING METHOD

Testing board for semiconductor memory, method of testing semicondu...

Method of testing memory device, method of manufacturing memory dev...

Semiconductor integrated circuit device, semiconductor memory syste...