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Charged particle source
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Patent number 4,924,101
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Issue date May 8, 1990
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Hitachi, Ltd.
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Noriyuki Sakudo
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H01 - BASIC ELECTRIC ELEMENTS
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Ion source
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Patent number 4,900,974
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Issue date Feb 13, 1990
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Hitachi, Ltd.
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Tohru Ishitani
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H01 - BASIC ELECTRIC ELEMENTS
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-
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Liquid metal ion source
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Patent number 4,774,414
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Issue date Sep 27, 1988
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Hitachi, Ltd.
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Kaoru Umemura
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H01 - BASIC ELECTRIC ELEMENTS
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Ion micro beam apparatus
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Patent number 4,755,685
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Issue date Jul 5, 1988
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Hitachi, Ltd.
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Yoshimi Kawanami
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H01 - BASIC ELECTRIC ELEMENTS
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-
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Ion microbeam apparatus
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Patent number 4,710,632
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Issue date Dec 1, 1987
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Hitachi, Ltd.
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Tohru Ishitani
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H01 - BASIC ELECTRIC ELEMENTS
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Ion source
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Patent number 4,687,938
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Issue date Aug 18, 1987
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Hitachi, Ltd.
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Hifumi Tamura
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H01 - BASIC ELECTRIC ELEMENTS
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Ion beam apparatus
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Patent number 4,687,930
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Issue date Aug 18, 1987
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Hitachi, Ltd.
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Hifumi Tamura
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H01 - BASIC ELECTRIC ELEMENTS
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Liquid metal ion source
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Patent number 4,680,507
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Issue date Jul 14, 1987
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Hitachi, Ltd.
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Kaoru Uemura
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H01 - BASIC ELECTRIC ELEMENTS
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Ion source
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Patent number 4,631,448
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Issue date Dec 23, 1986
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Hitachi, Ltd.
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Hifumi Tamura
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H01 - BASIC ELECTRIC ELEMENTS
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Liquid metal ion source
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Patent number 4,567,398
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Issue date Jan 28, 1986
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Hitachi, Ltd.
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Tohru Ishitani
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H01 - BASIC ELECTRIC ELEMENTS
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Ion source
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Patent number 4,560,907
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Issue date Dec 24, 1985
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Hitachi, Ltd.
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Hifumi Tamura
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H01 - BASIC ELECTRIC ELEMENTS
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Ion micro-analysis
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Patent number 4,510,387
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Issue date Apr 9, 1985
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Hitachi, Ltd.
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Eiichi Izumi
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H01 - BASIC ELECTRIC ELEMENTS
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-
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Ion-electron analyzer
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Patent number 4,233,509
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Issue date Nov 11, 1980
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Hitachi, Ltd.
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Hifumi Tamura
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H01 - BASIC ELECTRIC ELEMENTS
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Ion beam means
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Patent number 4,163,153
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Issue date Jul 31, 1979
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Hitachi, Ltd.
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Hifumi Tamura
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H01 - BASIC ELECTRIC ELEMENTS