TREA

Hiroaki Hayashi

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  • Sagamihara, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Testing system
    • Patent number 11,454,664
    • Issue date Sep 27, 2022
    • Tokyo Electron Limited
    • Kentaro Konishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Intermediate connection member and inspection apparatus
    • Patent number 11,035,883
    • Issue date Jun 15, 2021
    • Tokyo Electron Limited
    • Jun Mochizuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Logic simulator
    • Patent number 5,613,062
    • Issue date Mar 18, 1997
    • Tokyo Electron Limited
    • Tetsuya Hasebe
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Apparatus for performing logic simulation
    • Patent number 5,446,748
    • Issue date Aug 29, 1995
    • Tokyo Electron Limited
    • Tetsuya Hasebe
    • G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents