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Hirobumi Inoue
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device and method for manufacturing the same, circuit...
Patent number
7,594,644
Issue date
Sep 29, 2009
NEC Corporation
Takao Yamazaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Analysis method and analysis apparatus of designing transmission li...
Patent number
7,434,190
Issue date
Oct 7, 2008
NEC Corporation
Hirobumi Inoue
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wiring board having connecting wiring between electrode plane and c...
Patent number
7,321,166
Issue date
Jan 22, 2008
NEC Corporation
Jun Sakai
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Semiconductor device and method for manufacturing the same, circuit...
Patent number
6,998,704
Issue date
Feb 14, 2006
NEC Corporation
Takao Yamazaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device testing apparatus having a contact sheet and p...
Patent number
6,486,688
Issue date
Nov 26, 2002
NEC Corporation
Toru Taura
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device tester and method of testing semiconductor device
Patent number
6,433,410
Issue date
Aug 13, 2002
NEC Corporation
Michinobu Tanioka
G01 - MEASURING TESTING
Information
Patent Grant
Method for fabricating probe tip portion composed by coaxial cable
Patent number
6,400,168
Issue date
Jun 4, 2002
NEC Corporation
Kouji Matsunaga
G01 - MEASURING TESTING
Information
Patent Grant
Longitudinal type high frequency probe for narrow pitched electrodes
Patent number
6,310,483
Issue date
Oct 30, 2001
NEC Corporation
Toru Taura
G01 - MEASURING TESTING
Information
Patent Grant
Tip portion structure of high-frequency probe and method for fabric...
Patent number
6,281,691
Issue date
Aug 28, 2001
NEC Corporation
Kouji Matsunaga
G01 - MEASURING TESTING
Information
Patent Grant
High-frequency probe capable of adjusting characteristic impedance...
Patent number
6,242,930
Issue date
Jun 5, 2001
NEC Corporation
Kouji Matsunaga
G01 - MEASURING TESTING
Information
Patent Grant
Process for manufacturing high frequency multichip module enabling...
Patent number
6,229,321
Issue date
May 8, 2001
NEC Corporation
Kouji Matsunaga
G01 - MEASURING TESTING
Information
Patent Grant
Test method and apparatus of sequentially executing synchronous sig...
Patent number
5,614,944
Issue date
Mar 25, 1997
NEC Corporation
Toru Taura
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
CIRCUIT MODULE
Publication number
20100032198
Publication date
Feb 11, 2010
Hirobumi Inoue
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Analysis method and analysis apparatus
Publication number
20070033564
Publication date
Feb 8, 2007
NEC Corporation
Hirobumi Inoue
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Wiring board for semiconductor integrated circuit package and semic...
Publication number
20060103004
Publication date
May 18, 2006
NEC CORPORATION and
Jun Sakai
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Semiconductor device and method for manufacturing the same, circuit...
Publication number
20060055053
Publication date
Mar 16, 2006
NEC Corporation
Takao Yamazaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device and method for manufacturing the same, circuit...
Publication number
20040115920
Publication date
Jun 17, 2004
NEC Corporation
Takao Yamazaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device testing apparatus
Publication number
20020036514
Publication date
Mar 28, 2002
NEC Corporation
Toru Taura
G01 - MEASURING TESTING
Information
Patent Application
Method for fabricating probe tip portion composed by coaxial cable
Publication number
20010038294
Publication date
Nov 8, 2001
Kouji Matsunaga
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device tester and method of testing semiconductor device
Publication number
20010033010
Publication date
Oct 25, 2001
Michinobu Tanioka
G01 - MEASURING TESTING