Hirofumi Funahashi

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Nagoya-city, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for manufacturing magnetic sensor apparatus
- Patent number 7,582,489
- Issue date Sep 1, 2009
- Denso Corporation
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic impedance device, sensor apparatus using the same and meth...
- Patent number 7,417,269
- Issue date Aug 26, 2008
- Denso Corporation
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Grant
METHOD OF MEASURING A CHARACTERISTIC OF A CAPACITIVE TYPE OF SENSOR...
- Patent number 6,809,527
- Issue date Oct 26, 2004
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Diaphragm-type semiconductor device and method for manufacturing di...
- Patent number 6,802,222
- Issue date Oct 12, 2004
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Electrical capacitance pressure sensor having electrode with fixed...
- Patent number 6,584,852
- Issue date Jul 1, 2003
- Denso Corportation
- Yasutoshi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 6,268,298
- Issue date Jul 31, 2001
- Denso Corporation
- Atsushi Komura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method for manufacturing magnetic sensor apparatus
- Publication number 20080145956
- Publication date Jun 19, 2008
- DENSO CORPORATION
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Application
Magnetic impedance device, sensor apparatus using the same and meth...
- Publication number 20070108970
- Publication date May 17, 2007
- DENSO CORPORATION
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Application
Magnetic impedance device, sensor apparatus using the same and meth...
- Publication number 20040131887
- Publication date Jul 8, 2004
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Application
Capacitive sensor apparatus
- Publication number 20030011378
- Publication date Jan 16, 2003
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring a characteristic of a capacitive type of sensor...
- Publication number 20030011384
- Publication date Jan 16, 2003
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Application
Electrical capacitance presssure sensor having electrode with fixed...
- Publication number 20030005774
- Publication date Jan 9, 2003
- Yasutoshi Suzuki
- G01 - MEASURING TESTING
Information Patent Application
Diaphragm-type semiconductor device and method for manufacturing di...
- Publication number 20020171114
- Publication date Nov 21, 2002
- Seiichiro Ishio
- G01 - MEASURING TESTING