Hirofumi Saito

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Differential amplifier circuit and semiconductor device
- Patent number 7,504,882
- Issue date Mar 17, 2009
- NEC Electronics Corporation
- Hirofumi Saito
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device featuring overlay-mark used in photolithograph...
- Patent number 7,402,914
- Issue date Jul 22, 2008
- NEC Electronics Corporation
- Hirofumi Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power-supply voltage detection circuit and integrated circuit device
- Patent number 7,102,395
- Issue date Sep 5, 2006
- NEC Electronics Corporation
- Hirofumi Saito
- G01 - MEASURING TESTING
Information Patent Grant
Optical fiber, optical fiber component and optical transmission method
- Patent number 6,804,441
- Issue date Oct 12, 2004
- The Furukawa Electric Co., Ltd.
- Shinichi Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multilayer semiconductor wiring structure with reduced alignment ma...
- Patent number 6,617,669
- Issue date Sep 9, 2003
- NEC Electronics Corporation
- Hirofumi Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making resist pattern
- Patent number 6,589,718
- Issue date Jul 8, 2003
- NEC Electronics Corporation
- Hirofumi Saito
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of fabrication of multilayer semiconductor wiring structure...
- Patent number 6,514,851
- Issue date Feb 4, 2003
- NEC Corporation
- Hirofumi Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring positional shift/distortion by a...
- Patent number 6,344,896
- Issue date Feb 5, 2002
- NEC Corporation
- Hirofumi Saito
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Coma aberration automatic measuring mark and measuring method
- Patent number 6,323,945
- Issue date Nov 27, 2001
- NEC Corporation
- Hirofumi Saito
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Frequency detection circuit
- Patent number 6,043,749
- Issue date Mar 28, 2000
- NEC Corporation
- Hirofumi Saito
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATION CIRCUIT
- Publication number 20110187436
- Publication date Aug 4, 2011
- Renesas Electronics Corporaiton
- Hirofumi SAITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20110156219
- Publication date Jun 30, 2011
- RENESAS ELECTRONICS CORPORATION
- Yoshitsugu KAWASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFORMATION PROVIDING APPARATUS, INFORMATION PROVIDING METHOD, AND...
- Publication number 20100262622
- Publication date Oct 14, 2010
- Pioneer Corporation
- HIROFUMI SAITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Differential amplifier circuit and semiconductor device
- Publication number 20070058438
- Publication date Mar 15, 2007
- NEC Electronics Corporation
- Hirofumi Saito
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor device featuring overlay-mark used in photolithograph...
- Publication number 20060202360
- Publication date Sep 14, 2006
- NEC Electronics Corporation
- Hirofumi Saito
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Power-supply voltage detection circuit and integrated circuit device
- Publication number 20050001658
- Publication date Jan 6, 2005
- NEC ELECTRONICS CORPORATION
- Hirofumi Saito
- G01 - MEASURING TESTING
Information Patent Application
Optical fiber, optical fiber component and optical transmission method
- Publication number 20030108318
- Publication date Jun 12, 2003
- Shinichi Arai
- G02 - OPTICS
Information Patent Application
Multilayer semiconductor wiring structure with reduced alignment ma...
- Publication number 20030057452
- Publication date Mar 27, 2003
- NEC Corporation
- Hirofumi Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Shot configuration measuring mark and transfer error detection meth...
- Publication number 20020127486
- Publication date Sep 12, 2002
- NEC Corporation
- Hirofumi Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Frequency determination circuit for a data processing unit
- Publication number 20020017926
- Publication date Feb 14, 2002
- NEC Corporation
- Hirofumi Saito
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20010050437
- Publication date Dec 13, 2001
- Hirofumi Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of making resist pattern
- Publication number 20010008809
- Publication date Jul 19, 2001
- Hirofumi Saito
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Hirofumi Saito

Person

Patents Grantslast 30 patents

Differential amplifier circuit and semiconductor device

Semiconductor device featuring overlay-mark used in photolithograph...

Power-supply voltage detection circuit and integrated circuit device

Optical fiber, optical fiber component and optical transmission method

Multilayer semiconductor wiring structure with reduced alignment ma...

Method of making resist pattern

Method of fabrication of multilayer semiconductor wiring structure...

Method and apparatus for measuring positional shift/distortion by a...

Coma aberration automatic measuring mark and measuring method

Frequency detection circuit

Patents Applicationslast 30 patents

INTEGRATION CIRCUIT

SEMICONDUCTOR DEVICE

INFORMATION PROVIDING APPARATUS, INFORMATION PROVIDING METHOD, AND...

Differential amplifier circuit and semiconductor device

Semiconductor device featuring overlay-mark used in photolithograph...

Power-supply voltage detection circuit and integrated circuit device

Optical fiber, optical fiber component and optical transmission method

Multilayer semiconductor wiring structure with reduced alignment ma...

Shot configuration measuring mark and transfer error detection meth...

Frequency determination circuit for a data processing unit

Semiconductor device and method of manufacturing the same

Method of making resist pattern