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Hirohisa Handa
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Ibaraki, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Interference objective lens and reference surface unit set
Patent number
10,042,151
Issue date
Aug 7, 2018
Mitutoyo Corporation
Hirohisa Handa
G02 - OPTICS
Information
Patent Grant
Method and apparatus for measuring opposite surfaces
Patent number
6,633,387
Issue date
Oct 14, 2003
Mitutoyo Corporation
Kiyokazu Okamoto
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring optical wavelength
Patent number
6,507,404
Issue date
Jan 14, 2003
Mitutoyo Corporation
Nobuhisa Nishioki
G01 - MEASURING TESTING
Information
Patent Grant
Shape measuring apparatus
Patent number
6,496,269
Issue date
Dec 17, 2002
Mitutoyo Corporation
Naoki Mitsutani
G01 - MEASURING TESTING
Information
Patent Grant
Optical interference profiler having shadow compensation
Patent number
6,147,764
Issue date
Nov 14, 2000
Mitutoyo Corporation of Kamiyokoba
Hirohisa Handa
B24 - GRINDING POLISHING
Information
Patent Grant
On-the-fly optical interference measurement device, machining devic...
Patent number
5,999,264
Issue date
Dec 7, 1999
Mitutoyo Corporation
Hirohisa Handa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INTERFERENCE OBJECTIVE LENS AND REFERENCE SURFACE UNIT SET
Publication number
20170139194
Publication date
May 18, 2017
Mitutoyo Corporation
Hirohisa Handa
G02 - OPTICS
Information
Patent Application
IMAGE MEASURING DEVICE AND IMAGE MEASURING METHOD
Publication number
20120056999
Publication date
Mar 8, 2012
Mitutoyo Corporation
Hirohisa Handa
G01 - MEASURING TESTING
Information
Patent Application
Shape measuring apparatus
Publication number
20010035961
Publication date
Nov 1, 2001
Mitutoyo Corporation
Naoki Mitsutani
G01 - MEASURING TESTING