Hirokatsu Niijima

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Test apparatus, test method and manufacturing method
- Patent number 8,014,969
- Issue date Sep 6, 2011
- Advantest Corporation
- Hirokatsu Niijima
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus and test method
- Patent number 7,447,955
- Issue date Nov 4, 2008
- Advantest Corporation
- Hirokatsu Niijima
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus and test method
- Patent number 7,409,615
- Issue date Aug 5, 2008
- Advantest Corporation
- Hiroaki Nishimine
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus, measuring method, and test apparatus
- Patent number 7,262,627
- Issue date Aug 28, 2007
- Advantest Corporation
- Tomoyuki Yamane
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test device and timing measurement method
- Patent number 7,197,682
- Issue date Mar 27, 2007
- Advantest Corporation
- Hirokatsu Niijima
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus
- Patent number 7,100,099
- Issue date Aug 29, 2006
- Advantest Corporation
- Hirokatsu Niijima
- G01 - MEASURING TESTING
Information Patent Grant
Jitter measuring apparatus and a testing apparatus
- Patent number 7,002,334
- Issue date Feb 21, 2006
- Advantest Corporation
- Kouichi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Jitter quantity calculator and tester
- Patent number 6,768,954
- Issue date Jul 27, 2004
- Advantest Corporation
- Hirokatsu Niijima
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Temperature compensation circuit and method for providing a constan...
- Patent number 5,955,907
- Issue date Sep 21, 1999
- Advantest Corp.
- Hirokatsu Niijima
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Timing comparator circuit for use in device testing apparatus
- Patent number 5,732,047
- Issue date Mar 24, 1998
- Advantest Corporation
- Hirokatsu Niijima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS, TEST METHOD AND MANUFACTURING METHOD
- Publication number 20090240365
- Publication date Sep 24, 2009
- Advantest Corporation
- HIROKATSU NIIJIMA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD AND MACHINE READABLE MEDIUM STORING A P...
- Publication number 20080229163
- Publication date Sep 18, 2008
- Advantest Corporation
- Hirokatsu Niijima
- G11 - INFORMATION STORAGE
Information Patent Application
CHANGING POINT DETECTING CIRCUIT, JITTER MEASURING APPARATUS AND TE...
- Publication number 20080228417
- Publication date Sep 18, 2008
- Advantest Corporation
- TADAHIKO BABA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Test apparatus and test method
- Publication number 20070136625
- Publication date Jun 14, 2007
- Advantest Corporation
- Hirokatsu Niijima
- G11 - INFORMATION STORAGE
Information Patent Application
Measuring apparatus, measuring method, and test apparatus
- Publication number 20070096762
- Publication date May 3, 2007
- Advantest Corporation
- Tomoyuki Yamane
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus and test method
- Publication number 20070022346
- Publication date Jan 25, 2007
- Advantest Corporation
- Hiroaki Nishimine
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus
- Publication number 20060129335
- Publication date Jun 15, 2006
- Advantest Coporation
- Hirokatsu Niijima
- G01 - MEASURING TESTING
Information Patent Application
Jitter measuring apparatus and a testing apparatus
- Publication number 20050218881
- Publication date Oct 6, 2005
- Advantest Corporation
- Kouichi Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test device and timing measurement method
- Publication number 20050034044
- Publication date Feb 10, 2005
- Advantest Corporation
- Hirokatsu Niijima
- G01 - MEASURING TESTING
Information Patent Application
Jitter quantity calculator and tester
- Publication number 20030210032
- Publication date Nov 13, 2003
- Hirokatsu Niijima
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Hirokatsu Niijima

Person

Patents Grantslast 30 patents

Test apparatus, test method and manufacturing method

Test apparatus and test method

Test apparatus and test method

Measuring apparatus, measuring method, and test apparatus

Semiconductor test device and timing measurement method

Test apparatus

Jitter measuring apparatus and a testing apparatus

Jitter quantity calculator and tester

Temperature compensation circuit and method for providing a constan...

Timing comparator circuit for use in device testing apparatus

Patents Applicationslast 30 patents

TEST APPARATUS, TEST METHOD AND MANUFACTURING METHOD

TEST APPARATUS, TEST METHOD AND MACHINE READABLE MEDIUM STORING A P...

CHANGING POINT DETECTING CIRCUIT, JITTER MEASURING APPARATUS AND TE...

Test apparatus and test method

Measuring apparatus, measuring method, and test apparatus

Test apparatus and test method

Test apparatus

Jitter measuring apparatus and a testing apparatus

Semiconductor test device and timing measurement method

Jitter quantity calculator and tester