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Sensor and electronic device
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Patent number 12,019,092
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Issue date Jun 25, 2024
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Kabushiki Kaisha Toshiba
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Kei Masunishi
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B81 - MICRO-STRUCTURAL TECHNOLOGY
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Sensor and electronic device
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Patent number 11,834,326
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Issue date Dec 5, 2023
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Kabushiki Kaisha Toshiba
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Kei Masunishi
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B81 - MICRO-STRUCTURAL TECHNOLOGY
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Sensor and electronic device
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Patent number 11,796,319
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Issue date Oct 24, 2023
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Kabushiki Kaisha Toshiba
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Fumito Miyazaki
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G01 - MEASURING TESTING
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Sensor and electronic device
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Patent number 11,680,800
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Issue date Jun 20, 2023
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Kabushiki Kaisha Toshiba
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Ryunosuke Gando
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G01 - MEASURING TESTING
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Sensor and electronic device
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Patent number 11,656,079
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Issue date May 23, 2023
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Kabushiki Kaisha Toshiba
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Hiroki Hiraga
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G01 - MEASURING TESTING
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Sensor and electronic device
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Patent number 11,630,121
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Issue date Apr 18, 2023
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Kabushiki Kaisha Toshiba
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Kei Masunishi
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G01 - MEASURING TESTING
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Sensor and electronic device
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Patent number 11,531,042
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Issue date Dec 20, 2022
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Kabushiki Kaisha Toshiba
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Kei Masunishi
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B81 - MICRO-STRUCTURAL TECHNOLOGY
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Multi-junction solar cell
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Patent number 11,398,577
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Issue date Jul 26, 2022
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Kabushiki Kaisha Toshiba
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Soichiro Shibasaki
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H01 - BASIC ELECTRIC ELEMENTS
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Multi-junction solar cell
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Patent number 10,573,771
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Issue date Feb 25, 2020
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Kabushiki Kaisha Toshiba
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Soichiro Shibasaki
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H01 - BASIC ELECTRIC ELEMENTS
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-
-
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Solar cell
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Patent number 9,722,123
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Issue date Aug 1, 2017
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Kabushiki Kaisha Toshiba
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Kazushige Yamamoto
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H01 - BASIC ELECTRIC ELEMENTS
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