Hiromitsu Takasu

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Connector and semiconductor testing device including the connector
- Patent number 8,905,788
- Issue date Dec 9, 2014
- Molex Japan Co. Ltd.
- Kyoko Oniyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Connector and semiconductor testing device including the connector
- Patent number 8,860,454
- Issue date Oct 14, 2014
- Advantest Corporation
- Kyoko Oniyama
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test apparatus and interface plate
- Patent number 7,339,385
- Issue date Mar 4, 2008
- Advantest Corporation
- Hiromitsu Takasu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONNECTOR AND SEMICONDUCTOR TESTING DEVICE INCLUDING THE CONNECTOR
- Publication number 20120126845
- Publication date May 24, 2012
- Molex japan co., ltd.
- Kyoko Oniyama
- G01 - MEASURING TESTING
Information Patent Application
CONNECTOR AND SEMICONDUCTOR TESTING DEVICE INCLUDING THE CONNECTOR
- Publication number 20120088410
- Publication date Apr 12, 2012
- Advantest Corporation
- Kyoko Oniyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor test apparatus and interface plate
- Publication number 20070001702
- Publication date Jan 4, 2007
- Advantest Corporation
- Hiromitsu Takasu
- G01 - MEASURING TESTING