Hironobu Niijima

Person

Tatebayashi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scan test apparatus
- Patent number 5,892,779
- Issue date Apr 6, 1999
- Advantest Corporation
- Yasuji Ohyama
- G01 - MEASURING TESTING
Information Patent Grant
IC fault location tracing apparatus and method
- Patent number 5,825,191
- Issue date Oct 20, 1998
- Advantest Corp.
- Hironobu Niijima
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus detecting an IC defect by comparing electron emissions fr...
- Patent number 5,821,761
- Issue date Oct 13, 1998
- Advantest Corporation
- Soichi Shida
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting an IC defect using charged parti...
- Patent number 5,757,198
- Issue date May 26, 1998
- Advantest Corporation
- Soichi Shida
- G01 - MEASURING TESTING
Information Patent Grant
IC fault analysis system having charged particle beam tester
- Patent number 5,640,098
- Issue date Jun 17, 1997
- Advantest Corporation
- Hironobu Niijima
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting an IC defect using charged particle beam
- Patent number 5,592,100
- Issue date Jan 7, 1997
- Advantest Corporation
- Soichi Shida
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting an IC defect using a charged par...
- Patent number 5,521,517
- Issue date May 28, 1996
- Advantest Corporation
- Soichi Shida
- G01 - MEASURING TESTING
Information Patent Grant
Digital-to-analog converting apparatus equipped with calibrating fu...
- Patent number 4,835,535
- Issue date May 30, 1989
- Nippon Telegraph & Telephone Public Corporation
- Akinori Shibayama
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for charged particle beam exposure
- Patent number 4,789,945
- Issue date Dec 6, 1988
- Advantest Corporation
- Hironobu Niijima
- H01 - BASIC ELECTRIC ELEMENTS

Hironobu Niijima

Person

Patents Grantslast 30 patents

Scan test apparatus

IC fault location tracing apparatus and method

Apparatus detecting an IC defect by comparing electron emissions fr...

Method and apparatus for detecting an IC defect using charged parti...

IC fault analysis system having charged particle beam tester

Method for detecting an IC defect using charged particle beam

Method and apparatus for detecting an IC defect using a charged par...

Digital-to-analog converting apparatus equipped with calibrating fu...

Method and apparatus for charged particle beam exposure