Membership
Tour
Register
Log in
Hiroo Tatsutani
Follow
Person
Kobe-shi, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Specimen analysis system and specimen analysis method
Patent number
11,714,043
Issue date
Aug 1, 2023
Sysmex Corporation
Tomohiro Tsuji
G01 - MEASURING TESTING
Information
Patent Grant
Measuring apparatus, measuring apparatus adjustment method and comp...
Patent number
11,598,724
Issue date
Mar 7, 2023
Sysmex Corporation
Yasuaki Tsuruoka
G01 - MEASURING TESTING
Information
Patent Grant
Test system
Patent number
11,397,190
Issue date
Jul 26, 2022
Sysmex Corporation
Nobuyoshi Yamakawa
G01 - MEASURING TESTING
Information
Patent Grant
Specimen measurement system and specimen measurement method
Patent number
11,346,841
Issue date
May 31, 2022
Sysmex Corporation
Takaaki Nagai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Measurement system, rack export-import unit, and method of exportin...
Patent number
11,181,540
Issue date
Nov 23, 2021
Sysmex Corporation
Yuichiro Ohmae
G01 - MEASURING TESTING
Information
Patent Grant
Sample measurement system and method of transporting in and out rack
Patent number
10,723,552
Issue date
Jul 28, 2020
SYSMEX CORPORATION
Hiroo Tatsutani
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Sample measurement system and method of transporting in and out rack
Patent number
10,683,166
Issue date
Jun 16, 2020
SYSMEX CORPORATION
Hiroo Tatsutani
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Sample processing system
Patent number
10,197,550
Issue date
Feb 5, 2019
Sysmex Corporation
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer, transportation apparatus, and method
Patent number
10,101,346
Issue date
Oct 16, 2018
SYSMEX CORPORATION
Hiroki Koike
G01 - MEASURING TESTING
Information
Patent Grant
Transport apparatus and transport method
Patent number
10,099,866
Issue date
Oct 16, 2018
SYSMEX CORPORATION
Yuichiro Ohmae
G01 - MEASURING TESTING
Information
Patent Grant
Sample analysis system and sample analyzer
Patent number
9,829,497
Issue date
Nov 28, 2017
Sysmex Corporation
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Grant
Analyzing apparatus, analyzing method and a non-transitory storage...
Patent number
9,529,007
Issue date
Dec 27, 2016
Sysmex Corporation
Toru Mizumoto
G01 - MEASURING TESTING
Information
Patent Grant
Tube sorter and tube sorting system
Patent number
9,446,900
Issue date
Sep 20, 2016
SYSMEX CORPORATION
Kei Takai
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Sample processing apparatus that responds to trouble in a transport...
Patent number
9,316,658
Issue date
Apr 19, 2016
SYSMEX CORPORATION
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Grant
Sample processing system, transport control system and transport co...
Patent number
9,222,952
Issue date
Dec 29, 2015
Sysmex Corporation
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Grant
Rack transporting apparatus and sample processing apparatus
Patent number
9,213,041
Issue date
Dec 15, 2015
SYSMEX CORPORATION
Nobuhiro Kitagawa
G01 - MEASURING TESTING
Information
Patent Grant
Sample processing system
Patent number
8,942,852
Issue date
Jan 27, 2015
Sysmex Corporation
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Grant
Analyzing apparatus and analyzing method
Patent number
8,939,040
Issue date
Jan 27, 2015
Sysmex Corporation
Hiroyuki Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Sample rack transport system and sample rack transport method
Patent number
8,828,319
Issue date
Sep 9, 2014
Sysmex Corporation
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Grant
Sample processing apparatus and method for transporting rack
Patent number
8,752,440
Issue date
Jun 17, 2014
Sysmex Corporation
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Grant
Sample processing apparatus and sample rack transporting method
Patent number
8,731,709
Issue date
May 20, 2014
Sysmex Corporation
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Grant
Sample testing apparatus with controled sample transport mechanism...
Patent number
8,641,969
Issue date
Feb 4, 2014
Sysmex Corporation
Nobuhiro Kitagawa
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer, method for displaying analysis result information...
Patent number
8,504,301
Issue date
Aug 6, 2013
Sysmex Corporation
Shunsuke Ariyoshi
G01 - MEASURING TESTING
Information
Patent Grant
Sample processing apparatus and sample information display apparatus
Patent number
8,333,123
Issue date
Dec 18, 2012
Sysmex Corporation
Hiroo Tatsutani
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SPECIMEN MEASUREMENT SYSTEM AND SPECIMEN MEASUREMENT METHOD
Publication number
20240402179
Publication date
Dec 5, 2024
SYSMEX CORPORATION
Takaaki NAGAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SPECIMEN ANALYSIS SYSTEM AND SPECIMEN ANALYSIS METHOD
Publication number
20230332999
Publication date
Oct 19, 2023
SYSMEX CORPORATION
Tomohiro TSUJI
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN MEASUREMENT SYSTEM AND SPECIMEN MEASUREMENT METHOD
Publication number
20220221461
Publication date
Jul 14, 2022
SYSMEX CORPORATION
Takaaki NAGAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASURING APPARATUS, MEASURING APPARATUS ADJUSTMENT METHOD AND COMP...
Publication number
20210018438
Publication date
Jan 21, 2021
SYSMEX CORPORATION
Yasuaki TSURUOKA
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT APPARATUS AND QUALITY CONTROL METHOD
Publication number
20200103333
Publication date
Apr 2, 2020
SYSMEX CORPORATION
Hiroo TATSUTANI
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN ANALYSIS SYSTEM AND SPECIMEN ANALYSIS METHOD
Publication number
20200096432
Publication date
Mar 26, 2020
SYSMEX CORPORATION
Tomohiro TSUJI
G01 - MEASURING TESTING
Information
Patent Application
FLOW CYTOMETER, DATA TRANSMISSION METHOD, AND INFORMATION PROCESSIN...
Publication number
20200098452
Publication date
Mar 26, 2020
SYSMEX CORPORATION
Hiroo TATSUTANI
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN MEASUREMENT SYSTEM AND SPECIMEN MEASUREMENT METHOD
Publication number
20200096515
Publication date
Mar 26, 2020
SYSMEX CORPORATION
Takaaki NAGAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FLOW CYTOMETER AND PARTICLE DETECTION METHOD
Publication number
20180284008
Publication date
Oct 4, 2018
SYSMEX CORPORATION
Motoi KINISHI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE MEASUREMENT SYSTEM AND METHOD OF TRANSPORTING IN AND OUT RACK
Publication number
20180002108
Publication date
Jan 4, 2018
SYSMEX CORPORATION
Hiroo TATSUTANI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE MEASUREMENT SYSTEM AND METHOD OF RETRIEVING TRAY IDENTIFICAT...
Publication number
20180003729
Publication date
Jan 4, 2018
SYSMEX CORPORATION
Hiroo TATSUTANI
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM, RACK EXPORT-IMPORT UNIT, AND METHOD OF EXPORTIN...
Publication number
20170285053
Publication date
Oct 5, 2017
SYSMEX CORPORATION
Yuichiro OHMAE
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYSIS SYSTEM AND SAMPLE ANALYSIS METHOD
Publication number
20170285052
Publication date
Oct 5, 2017
SYSMEX CORPORATION
Hiroo TATSUTANI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER, TRANSPORTATION APPARATUS, AND METHOD
Publication number
20160349279
Publication date
Dec 1, 2016
SYSMEX CORPORATION
Hiroki KOIKE
G01 - MEASURING TESTING
Information
Patent Application
TEST SYSTEM
Publication number
20160061851
Publication date
Mar 3, 2016
SYSMEX CORPORATION
Nobuyoshi YAMAKAWA
G01 - MEASURING TESTING
Information
Patent Application
TRANSPORT APPARATUS AND TRANSPORT METHOD
Publication number
20160060046
Publication date
Mar 3, 2016
SYSMEX CORPORATION
Yuichiro OHMAE
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Application
SAMPLE SORTING APPARATUS AND SAMPLE PROCESSING SYSTEM
Publication number
20150093290
Publication date
Apr 2, 2015
SYSMEX CORPORATION
Kei TAKAI
G01 - MEASURING TESTING
Information
Patent Application
TUBE SORTER AND TUBE SORTING SYSTEM
Publication number
20140212248
Publication date
Jul 31, 2014
SYSMEX CORPORATION
Kei TAKAI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYSIS SYSTEM AND SAMPLE ANALYZER
Publication number
20140037502
Publication date
Feb 6, 2014
SYSMEX CORPORATION
Hiroo TATSUTANI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING APPARATUS, SAMPLE ANALYZER, SAMPLE ANALYZING SYST...
Publication number
20130260412
Publication date
Oct 3, 2013
SYSMEX CORPORATION
Hiroo TATSUTANI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING SYSTEM
Publication number
20120269681
Publication date
Oct 25, 2012
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING SYSTEM
Publication number
20120160039
Publication date
Jun 28, 2012
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING SYSTEM AND METHOD OF PROCESSING SAMPLE
Publication number
20120107793
Publication date
May 3, 2012
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING APPARATUS AND METHOD FOR TRANSPORTING RACK
Publication number
20110290040
Publication date
Dec 1, 2011
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE RACK TRANSPORT SYSTEM AND SAMPLE RACK TRANSPORT METHOD
Publication number
20110244583
Publication date
Oct 6, 2011
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING SYSTEM, TRANSPORT CONTROL SYSTEM AND TRANSPORT CO...
Publication number
20110243792
Publication date
Oct 6, 2011
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING APPARATUS, SAMPLE TRANSPORTING METHOD AND NON-TRA...
Publication number
20110244582
Publication date
Oct 6, 2011
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING SYSTEM
Publication number
20110189053
Publication date
Aug 4, 2011
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING APPARATUS AND SAMPLE RACK TRANSPORTING METHOD
Publication number
20110160899
Publication date
Jun 30, 2011
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Application
RACK TRANSPORTING APPARATUS AND SAMPLE PROCESSING APPARATUS
Publication number
20110076193
Publication date
Mar 31, 2011
Nobuhiro Kitagawa
G01 - MEASURING TESTING