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Hiroshi Goto
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Hitachi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Pattern inspection method and its apparatus
Patent number
8,090,187
Issue date
Jan 3, 2012
Hitachi, Ltd.
Kaoru Sakai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pattern inspection method and its apparatus
Patent number
7,711,178
Issue date
May 4, 2010
Hitachi, Ltd.
Kaoru Sakai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Lighting optical machine and defect inspection system
Patent number
7,417,720
Issue date
Aug 26, 2008
Hitachi High-Technologies Corporation
Masami Iizuka
G01 - MEASURING TESTING
Information
Patent Grant
Lighting optical machine and defect inspection system
Patent number
7,133,127
Issue date
Nov 7, 2006
Hitachi High-Technologies Corporation
Masami Iizuka
G01 - MEASURING TESTING
Information
Patent Grant
Image detection method and its apparatus and defect detection metho...
Patent number
7,127,098
Issue date
Oct 24, 2006
Hitachi, Ltd.
Atsushi Shimoda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Photoelectric transducer and manufacturing method of the same
Patent number
6,472,699
Issue date
Oct 29, 2002
Fujitsu Limited
Iwao Sugiyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Video telephone for the real-time exchange of image and other data...
Patent number
6,034,715
Issue date
Mar 7, 2000
Hitachi, Ltd.
Kiyoshi Ishida
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method for manufacturing a semiconductor device
Patent number
5,981,372
Issue date
Nov 9, 1999
Fujitsu Limited
Hiroshi Goto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method for manufacturing semiconductor device
Patent number
5,902,121
Issue date
May 11, 1999
Fujitsu Limited
Hiroshi Goto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Enhanced semiconductor integrated circuit device with a memory arra...
Patent number
5,850,096
Issue date
Dec 15, 1998
Fujitsu Limited
Tetsuo Izawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fabrication process of a semiconductor integrated circuit device ha...
Patent number
5,843,841
Issue date
Dec 1, 1998
Fujitsu Limited
Tetsuo Izawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process for manufacturing semiconductor devices separated by an air...
Patent number
5,705,425
Issue date
Jan 6, 1998
Fujitsu Limited
Takao Miura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method for manufacturing semiconductor device
Patent number
5,691,561
Issue date
Nov 25, 1997
Fujitsu Limited
Hiroshi Goto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Video telephone
Patent number
5,587,735
Issue date
Dec 24, 1996
Hitachi, Ltd.
Kiyoshi Ishida
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Video telephone
Patent number
5,400,068
Issue date
Mar 21, 1995
Hitachi, Ltd.
Kiyoshi Ishida
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method of constructing top slab of nuclear reactor container and nu...
Patent number
5,351,277
Issue date
Sep 27, 1994
Hitachi, Ltd.
Hiroshi Goto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method for fabricating isolation region in semiconductor devices
Patent number
RE34400
Issue date
Oct 5, 1993
Fujitsu Limited
Hiroshi Goto
437 -
Information
Patent Grant
Method of producing a semiconductor device with total dielectric is...
Patent number
5,036,021
Issue date
Jul 30, 1991
Fujitsu Limited
Hiroshi Goto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Protocol integrating videotex communication system
Patent number
4,970,716
Issue date
Nov 13, 1990
Hitachi, Ltd.
Hiroshi Goto
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Process for fabricating a semiconductor device with selective growt...
Patent number
4,952,521
Issue date
Aug 28, 1990
Fujitsu Limited
Hiroshi Goto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of producing a contact plug
Patent number
4,906,593
Issue date
Mar 6, 1990
Fujitsu Limited
Yoshimi Shioya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Temperature-compensated optical pick-up device
Patent number
4,815,059
Issue date
Mar 21, 1989
Ricoh Company, Ltd.
Masahiko Nakayama
G11 - INFORMATION STORAGE
Information
Patent Grant
Emergency core cooling apparatus
Patent number
4,808,369
Issue date
Feb 28, 1989
Hitachi, Ltd.
Shozo Yamanari
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Process for fabricating a self-aligned bipolar transistor
Patent number
4,698,127
Issue date
Oct 6, 1987
Fujitsu Limited
Osamu Hideshima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process for fabricating a semiconductor device
Patent number
4,654,113
Issue date
Mar 31, 1987
Fujitsu Limited
Takahiro Tuchiya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of producing a semiconductor device
Patent number
4,611,386
Issue date
Sep 16, 1986
Fujitsu Limited
Hiroshi Goto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for producing a bipolar transistor having a reduced base region
Patent number
4,590,666
Issue date
May 27, 1986
Fujitsu Limited
Hiroshi Goto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for fabricating isolation region in semiconductor devices
Patent number
4,509,249
Issue date
Apr 9, 1985
Fujitsu Ltd.
Hiroshi Goto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of producing a walled emitter semiconductor device
Patent number
4,465,528
Issue date
Aug 14, 1984
Fujitsu Limited
Hiroshi Goto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of making Schottky barrier diode by selective beam-crystalli...
Patent number
4,377,031
Issue date
Mar 22, 1983
Fujitsu Limited
Hiroshi Goto
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
PATTERN INSPECTION METHOD AND ITS APPARATUS
Publication number
20120076396
Publication date
Mar 29, 2012
Kaoru Sakai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PATTERN INSPECTION METHOD AND ITS APPARATUS
Publication number
20100172570
Publication date
Jul 8, 2010
Kaoru Sakai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PATTERN INSPECTION METHOD AND ITS APPARATUS
Publication number
20080031511
Publication date
Feb 7, 2008
Kaoru Sakai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Lighting optical machine and defect inspection system
Publication number
20070008521
Publication date
Jan 11, 2007
Masami Iizuka
G01 - MEASURING TESTING
Information
Patent Application
Lighting optical machine and defect inspection system
Publication number
20040008341
Publication date
Jan 15, 2004
Masami Iizuka
G01 - MEASURING TESTING
Information
Patent Application
Pattern inspection method and its apparatus
Publication number
20030179921
Publication date
Sep 25, 2003
Kaoru Sakai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Image detection method and its apparatus and defect detection metho...
Publication number
20030053676
Publication date
Mar 20, 2003
Atsushi Shimoda
G01 - MEASURING TESTING