Hiroshi Horikawa

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Defect inspection apparatus
- Patent number 12,345,653
- Issue date Jul 1, 2025
- Shimadzu Corporation
- Hiroshi Horikawa
- G01 - MEASURING TESTING
Information Patent Grant
Aircraft inspection support device and aircraft inspection support...
- Patent number 12,030,670
- Issue date Jul 9, 2024
- Shimadzu Corporation
- Koji Morita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Aircraft inspection support device and aircraft inspection support...
- Patent number 11,336,866
- Issue date May 17, 2022
- Shimadzu Corporation
- Hiroshi Horikawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Rotary cathode X-ray tube equipment
- Patent number 5,631,944
- Issue date May 20, 1997
- Shimadzu Corporation
- Yutaro Kimura
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Rotary cathode x-ray tube equipment
- Patent number 5,548,629
- Issue date Aug 20, 1996
- Shimadzu Corporation
- Yutaro Kimura
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Rotary cathode x-ray tube equipment
- Patent number 5,481,585
- Issue date Jan 2, 1996
- Shimadzu Corporation
- Yutaro Kimura
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20240230601
- Publication date Jul 11, 2024
- Shimadzu Corporation
- Hiroshi HORIKAWA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS
- Publication number 20230401688
- Publication date Dec 14, 2023
- Shimadzu Corporation
- Naoto MISHINA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DETECTION DEVICE
- Publication number 20230306575
- Publication date Sep 28, 2023
- Shimadzu Corporation
- Naoto MISHINA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION APPARATUS
- Publication number 20230251204
- Publication date Aug 10, 2023
- Shimadzu Corporation
- Hiroshi HORIKAWA
- G01 - MEASURING TESTING
Information Patent Application
AIRCRAFT INSPECTION SUPPORT DEVICE AND AIRCRAFT INSPECTION SUPPORT...
- Publication number 20220281617
- Publication date Sep 8, 2022
- Shimadzu Corporation
- Koji MORITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AIRCRAFT INSPECTION SUPPORT DEVICE AND AIRCRAFT INSPECTION SUPPORT...
- Publication number 20210385416
- Publication date Dec 9, 2021
- Shimadzu Corporation
- Hiroshi HORIKAWA
- G01 - MEASURING TESTING